dedicated to
The Centre National de la Recherche Scientifique (CNRS) and the Commissariat à l'Energie Atomique et aux énergies alternatives (CEA) have jointly constructed and now operate the CRG-IF beamline at ESRF in order to propose powerful X-ray beams to french surface researchers. One third of the beamtime is allocated in counterpart to the european scientific community. This beamline opened at the beginning of the ESRF, was the first CRG Beamline operational. BM32 is now composed of technical and scientific staff coming from CNRS (UMR SyMMES CNRS-CEA/IRIG and Institut Néel), and CEA (DRF/IRIG/MEM).
CRG-IF beamlime is member of the 5 french beamlines located at the ESRF forming the F-CRG facility.
Two instruments are available to offer a complementary characterization of surfaces and interfaces in soft and hard condensed matter:
A new instrument (since march 2006) designed for submicronic focussed white beam (Laue) diffraction:
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Beamtime can be allocated by submitting proposals to two scientific program committees:
When choosing the suited instrument for your experiments during the electronic submission procedure please:
Next proposal calls for the restart of the new upgraded ESRF Extremely-Brilliant-Source Programme
for the period from end of March 2021 to July 2021. Beamtime is reserved to french laboratories or academic groups
for the period from end of March 2021 to July 2021. Beamtime is reserved to laboratories or academic groups of european ESRF contributors countries (including France)
see more details in BM32 User guide
In case of troubleshoutings, issues with instruments & software, get prepared with your future experiments environment: BM32 WIKI
Beamline activites and capabilities are described in the pages of this website. Scientific production is listed in Beamline & Publications and with corresponding impact metrics:
The Google scholar profile contains all digital documents found in the web where 'BM32 beamline' appears explicitely in the core text.
Optics Hutch has been completely refurbished since January 2006. It has allowed to improve the X-ray Beam features coming in the two experimental hutches (flux, spot size on sample and energy resolution...) and namely to achieve a sub micrometric beamsize via a pinhole and two focussing mirrors.
By using large area and fast detector, Data Analysis has become one of the highest priorities of the beamline development in providing a full efficient measurements chain to users to investigate structural properties of materials. LaueTools software suite can be downloaded from gitlab.esrf.fr. It allows to handle, visualize, reduce and interpret data recorded by Laue Microdiffraction Probe.
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| Featured Experiments | Optics | |||
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| Practical User guide | Location | |||
Barbier C., Zhou T., Renaud G., Geaymond O., Le Fèvre P., Glas F., Madouri A., Cavanna A., Travers L., Morassi M., Gogneau N., Tchernycheva M., Harmand J.C., Largeau L.,
Crystal Growth & Design 20, 4013-4019 (2020)
Dai Z., Alyabyeva N., Borghetti P., Chenot S., David P., Koltsov A., Renaud G., Jupille J., Cabailh G., Lazzari R.,
Applied Surface Science 509, 145312-1-145312-7 (2020)
Dai Z.B., Alyabyeva N., Van den Bossche M., Borghetti P., Chenot S., David P., Koltsov A., Renaud G., Jupille J., Cabailh G., Noguera C., Goniakowski J., Lazzari R.,
Physical Review Materials 4, 074409-1-074409-11 (2020)
Michaud L.G., Castán C., Zussy M., Montméat P., Mareau V.H., Gonon L., Fournel F., Rieutord F., Tardif S.,
Nanotechnology 31, 145302-1-145302-7 (2020)
Ren Z., Cornelius T.W., Leclere C., Davydok A., Micha J.S., Robach O., Richter G., Thomas O.,
Applied Physics Letters 116, 243101-1-243101-6 (2020)
Sant R., Lisi S., Nguyen V.D., Mazaleyrat E., Herrero A.C.G., Geaymond O., Guisset V., David P., Marty A., Jamet M., Chapelier C., Magaud L., Dappe Y.J., Bianchi M., Hofmann P., Renaud G., Coraux J.,
Journal of Physical Chemistry C 124, 12397-12408 (2020)
Capiod P., Bardotti L., Tamion A., Boisron O., Albin C., Dupuis V., Renaud G., Ohresser P., Tournus F.,
Physical Review Letters 122, 106802-1-106802 -7 (2019)
De Santis M., Bailly A., Coates I., Grenier S., Heckmann O., Hricovini K., Joly Y., Langlais V., Ramos A.Y., Richter C., Torrelles X., Garaudée S., Geaymond O., Ulrich O.,
Acta Crystallographica B 75, 8-17 (2019)
Fragkos S., Sant R., Alvarez C., Bosak A., Tsipas P., Tsoutsou D., Okuno H., Renaud G., Dimoulas A.,
Advanced Materials Interfaces 6, 1801850-1-1801850-9 (2019)
Fragkos S., Sant R., Alvarez C., Golias E., Marquez-Velasco J., Tsipas P., Tsoutsou D., Aminalragia-Giamini S., Xenogiannopoulou E., Okuno H., Renaud G., Rader O., Dimoulas A.,
Physical Review Materials 3, 104201-1-104201-8 (2019)
Hektor J., Micha J.S., Hall S.A., Iyengar S., Ristinmaa M.,
Acta Materialia 168, 210-221 (2019)
Mukhina T., Hemmerle A., Rondelli V., Gerelli Y., Fragneto G., Daillant J., Charitat T.,
Journal of Physical Chemistry Letters 10, 7195-7199 (2019)
Niu G., Leake S.J., Skibitzki O., Niermann T., Carnis J., Kiessling F., Hatami F., Hussein E.H., Schubert M.A., Zaumseil P., Capellini G., Masselink W.T., Ren W., Ye Z.G., Lehmann M., Schülli T., Schroeder T., Richards M.I.,
Physical Review Applied 11, 064046-1-064046-9 (2019)
Plancher E., Tajdary P., Auger T., Castelnau O., Favier V., Loisnard D., Marijon J.B., Maurice C., Michel V., Robach O., Stodolna J.,
JOM 71, 3543-3551 (2019)
Rébiscoul D., Israel S.S., Tardif S., Larrey V., Ayral A., Rieutord F.,
Journal of Physical Chemistry C 123, 12305-12312 (2019)
Saint-Lager M.C., Languille M.A., Cadete Santos Aires F.J., Bailly A., Garaudée S., Ehret E., Robach O.,
ACS Catalysis 9, 4448-4461 (2019)
Sitja G., Bailly A., De Santis M., Heresanu V., Henry C.R.,
Journal of Physical Chemistry C 123, 24487-24494 (2019)
Wild B., Daval D., Micha J.S., Bourg I.C., White C.E., Fernández-Martínez A.,
Journal of Physical Chemistry C 123, 24520-24532 (2019)
Wilson A., Bailly A., Bernard R., Borensztein Y., Coati A., Croset B., Cruguel H., Naitabdi A., Silly M., Saint-Lager M.C., Vlad A., Witkowski N., Garreau Y., Prévot G.,
Nanoscale 11, 752-761 (2019)
Altinkurt G., Fèvre M., Geandier G., Dehmas M., Robach O., Micha J.S.,
Journal of Materials Science 53, 8567-8589 (2018)
partners
European Synchrotron Radiation Facility - 71, avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France.