Multitechnic Goniometer

This page is a quick overview of the multitechnic goniometer and its large possibilities.

This goniometer at BM32 is specially designed for:

surface X-ray scattering experiments

at energy up to 30keV

on solid or liquid samples

1- Multiple Uses

The goniometer has been designed to allow :

• grazing incidence diffraction
• reflectivity
• other surface diffraction techniques
• diffuse or non specular angle scattering at grazing incidence

2- Detection and sample environment

Beam collimation :

• A complete system of entrance slits (accuracy 1 µm) is available for beam conditioning and alignment.
• Sollers slits (1.4 mrad angular resolution).

Detection :

• 0D : a low background and fast NaI scintillation detector
• 1D : a linear gas detector (Position Sensitive Detector)
• 2D : a CCD array detector (princeton 1242*1152 pixels)

Photodiodes and X-ray camera for intensity normalisation and alignement

We are currently testing Maxipix pixel detector from ESRF

see the last movies:

Rocking scan on silicon-on-insulator (SOI) film obtained by integrating on the fly a region of interest on the MAXIPIX pixel detector. The two peaks correspond to the Bragg reflections of respectively the film and the substrate. Oscillations on the right side of the film peak arise from the scattering signal of the SOI film truncature rod intersected by the rotating Ewald sphere.

format AVI

format MOV

Standart sample environment and accessories :

• Liquid helium cryostat (from 1.5 to 300K)
• Furnace in vacuum chamber (from 25 to 900°C radiative mode; up to 1500°C electron bombardement mode)
• Circulating bath (from -10 to 70°C)
• Be hemispherical chamber (to be soon available)

3- Typical and recent experiments

Study of the buried SiO2 layer between two molecularly bounded Si wafers Reflected intensity allows to study the thickness and the roughness of the Si oxide layer as a function of preparation parameters.
	Study of multilayers of metallic nanoparticles embedded in oxide Grazing Incidence Small Angle Scattering (GISAXS) measurements were done using 2D CCD camera to determine the organization of Co particles in and out of the layers plane.
Study of the stress and the texture in submicronic in situ annealed Cu wires Theta-2Theta measurements with respect to tilted Miller planes on textured and crystallised Cu wire show the intensity of the stresses.
	Study of amphiphilic polymers at the oil-water interface Diffuse scattering by the interfacial layer allows the determination of the structure and fluctuations of the film.
Study of Langmuir films Scattered intensity out of the incident plane reveal the in-plane correlations and order of self-organized molecules.