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Regular papers

1998

1. (5) C. Fradin, D. Luzet, A. Braslau, M. Alba, F. Muller, J. Daillant, J.M. Petit and F. Rieutord
   X-ray study of the fluctuations and of the interfacial structure of a phospholipid monolayer at an alkane-waterinterface
   Langmuir 14(26) (1998) 7327
2. (14) M.C. Saint-Lager, R. Baudoing-Savois, M. De Santis, P. Dolle and Y. Gauthier
   Thickness effect on alloying of ultrathin Co films on Pt(111): a real time and in situ UHV study with synchrotron x-ray diffraction
   . Surface Science 418 (1998) 485
3. (104) [Review] G. Renaud
   Oxide surfaces and metal/oxide interfaces studied by grazing incidence X-ray scattering
   Surface Science Reports 32(1-2) (1998) 1-90
4. (29) A. Bourret, A. Barski, J.L. Rouvière, G. Renaud and A. Barbier
   Growth of aluminum nitride on (111) silicon{\nobreakspace
   : microstructure and interface structure} J. Appl. Phys. 83 (1998) 2003
5. (0) O. Robach, G. Renaud and A. Barbier
   Very-high-quality MgO(001) surfaces : roughness, rumpling and relaxation
   Surf. Sci. 401 (1998) 227
6. (13) G. Renaud, P. Gu\'{e}nard and A. Barbier
   Misfit dislocation network at the Ag/MgO(001) interface{\nobreakspace
   : A grazing-incidence x-ray scattering study} Phys. Rev. B. 58 (1998) 7310
7. (10) A. Barbier, G. Renaud and O. Robach
   Growth, annealing and oxidation of the Ni/MgO(001) interface studied by grazing incidence X-ray scattering
   J. Appl. Phys. 84 (1998) 4259
8. (8) C. Mocuta, A. Barbier, G. Renaud and B. Dieny
   Growth and Magnetism of Co/NiO(111) thin films
   Thin Solid films 336 (1998) 160
9. (3) N. Pelekanos, N. Boudet, J. Eymery and H. Mariette
   Interface roughness correlation in CdTe / CdZnTe strained quantum wells
   J. Cryst. Growth184 (1998) 886
10. (2) E. Lacaze, M. Alba, J. Barre, A. Braslau, M. Goldmann and J. Serreau
    Organic monolayers: Interface between 8CB liquid crystals and MoS2 monocrystal
    , Physica B 248 (1998) 246
11. (24) E.A.L. Mol, G.C.L. Wong, J.M. Petit, F. Rieutord, W.H. de Jeu
    Thinning transitions and fluctuations of freely suspended smectic-A films as studied by specular and diffuse X-ray scattering
    Physica B 248 (1998) 191

1999

12. (19) R. Baudoing-Savois, G. Renaud, M. De Santis, A. Barbier, O. Robach, P. Taunier, P. Jeantet, O. Ulrich, J.P. Roux, M.C. Saint-Lager, A. Barski, O. Geaymond, G. Berard, P. Dolle, M. Noblet and A. Mougin
    A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF
    Nucl. Instrum. Methods Phys. Res B 149 (1999) 213
13. (4) S. Boukari, E. Beaurepaire, H. Bulou, B. Carrière, J.P. Deville, F. Scheurer, R. Baudoing Savois and M. De Santis
    Strain induced epitaxial relationship of Cr on Co/Pd(111)
    Surface Science 430 (1999) 37
14. (2) M. De Santis, R. Baudoing-Savois, P. Dolle, M.C. Saint-Lager and Y. Gauthier
    Long range order in ultra-thin Pt-Co(111) alloys
    Surface Review Letters 6 (1999) 361
15. (2) R. Baudoing-Savois, Y. Gauthier, P. Dolle, M.C. Saint-Lager and M. De Santis
    Co ultra thin films on Pt(111) and Co-Pt alloying : A LEED, Auger and Synchrotron X-ray diffraction study
    Journal of Physic: Condensed Matter 11 (1999) 8355
16. (28) O. Robach, G. Renaud and A. Barbier
    Structure and morphology of the Ag/MgO(001) interface during in situ growth at room temperature
    Phys. Rev. B 60 (1999) 5858
17. (12) G. Renaud, A. Barbier and O. Robach
    Growth, structure and morphology of the Pd/MgO(001) interface: epitaxial site and interfacial distance
    Phys. Rev. B 60 (1999) 5872
18. (5) R. Langer, A. Barski, A. Barbier, G. Reanud, M. Leszczynski, I. Grzegory and S. Porowski
    Strain relaxation in AlN epitaxial layers grown on GaN single crystals
    J. Cryst. Growth 205 (1999) 31
19. (11) D. Buttard, G. Dolino, D. Bellet, T. Baumbach and F. Rieutord
    X-ray reflectivity investigation of thin p-type porous silicon layers
    Solid state commun. 109 (1999) 1
20. (10) J. Eymery, F. Fournel, F. Rieutord, D. Buttard, H. Moriceau and B. Aspar
    X-ray reflectivity of ultrathin twist-bonded silicon wafers
    Appl. phys. lett. 75 (1999) 3509

2000

21. (1) P. Cluzeau, P. Gisse, V. Ravaine, A.-M. Levelut, P. Barois, C.C. Huang, F. Rieutord and H.T. NGuyen
    Resonant X-ray diffraction study of a new brominated chiral SmCA* liquid crystal
    Ferroelectrics 244 (2000) 301
22. (4) G. Fragneto, E. Bellet-Amalric, T. Charitat, P. Dubos, F. Graner and L. Perino-Gallice
    Neutron and X-Ray Reflectivity Studies at Solid-Liquid Interfaces: the Interaction of a Peptide with Model Membranes
    Physica B 276-278 (2000) 501
23. L. Perino-Gallice, E. Bellet-Amalric, A. Braslau, T. Charitat, J. Daillant, G. Fragneto and F. Graner
    Adsorbed and free lipid bilayers at the solid-water interface viewed by specular and off-specular reflectivity
    Prog. Colloid Polym Sci. 115 (2000) 171
24. (6) C.Mocuta, A. Barbier and G. Renaud
    CoO(111) surface study by surface X-ray diffraction
    Appl. Surf. Sci. 162-163 (2000) 56
25. (0) J.P. Deville, A.Barbier, C. Mocuta, G. Renaud, Y. Samson, H. Magna, P. Le Fevre, D. Chandesris, C. Panissod and C. Meny
    Magnetic ultrathin films and mulilayerse
    : growth and characterization} Analusis 28 (2000) 20
26. (26) A.Barbier, C. Mocuta, H. Kuhlenbeck, K.F. Peters, B. Richter and G. Renaud
    Atomic structure of the polar NiO(111)-p(2x2) surface
    Phys. Rev. Lett. 84 (2000) 2897
27. (7) A. Barbier, C. Mocuta and G. Renaud
    Structure, transformation and reduction of the polar NiO(111) surface
    Phys. Rev. B 62 (2000) 16056
28. (0) C. Alonso, F. Artzner, J. Lajzerowicz, G. Grübel, N. Boudet, F. Rieutord, J.M. Petit, A. Renault
    Thermodynamics and X-ray studies of 2-alcohol monolayers: Two-dimensional phase diagrams
    European Physical Journal E 3 (2000) 63
29. (1) P.F. Lenne, F. Bonosi, A. Renault, E. Bellet-Amalric, J.F. Legrand, J.M. Petit, F. Rieutord and F. Berge
    Growth of two-dimensional solids in alcohol monolayers in the presence of soluble amphiphilic molecules
    Langmuir 16 (2000) 2306
30. (21) [Review] J. Daillant and M. Alba High-resolution x-ray scattering measurements: I. Surfaces Reports on progress in physics 53 (10) (2000) 1725

2001

31. (6) S. Marchesini, O. Ulrich, G. Faigel,M. Tegze, M. Belakhovsky, A. S. Simionovici
    Instrumental development of X-ray atomic holography at ESRF
    Nuclear Instruments & Methods in Physics Research A 457 (2001) 601
32. (3) E. Lacaze, M. Alba, M. Goldmann, J.P. Michel and F. Rieutord
    Adsorbed organic monolayers on crystalline substrate: the example of 8CB on MoS2{\textquotedbl
    } Appl Surf. Sci. 175-176 (2001) 337
33. (4) S. Boukari, E. Beaurepaire, H. Bulou, B. Carrière, J.P. Deville, F. Scheurer, M. De Santis, R. Baudoing-Savois
    Influence of strain on the magnetocrystalline anisotropy in epitaxial Cr/Co/Pd(111) films
    Physical Review B 64 (2001) 144431
34. G. Renaud and A. Barbier
    Atomic Structure of Oxide Surfaces by Surface X-ray Scattering
    Chapter 6 of "The Chemical Physics of Solid Surfaces", Volume 9: "Oxide Surfaces", ed. D.P. Woodruff, pp. 256-298 (2001)
35. P. Bayle-Guillemaud, A. Barbier and C. Mocuta
    Development of a quantitative energy filtering TEM method to study a reactive NiO/80Ni20Fe interface
    Ultramicroscopy 88 (2001) 99
36. (2) J. Eymery, F. Rieutord, F. Fournel, D. Buttard and H. Moriceau
    X-ray reflectivity of silicon on insulator wafers
    Materials Science in Semiconductor Processing 4 (2001) 31
37. (9) C. Gourier, M. Alba, A. Braslau, J. Daillant, M. Goldmann, C.M. Knobler, F. Rieutord and G. Zalczer
    Structure and elastic properties of 10-12 pentacosadiyonic acid langmuir films
    Langmuir 17 (2001) 6496
38. (6) F. Rieutord, J. Eymery, F. Fournel, D. Buttard, R. Oeser, O. Plantevin, H. Moriceau and B. Aspar High-energy X-ray reflectivity of buried interfaces created by wafer bonding Physical Review B 63 (2001) 125408
39. (3) V. Chamard, P. Bastie, D. Le Bolloch, G. Dolino, E. Elkaïm, C. Ferrero, J.-P. Lauriat, F. Rieutord and D. Thiaudière
    Evidence for self organization in porous silicon: an x-ray grazing incidence study
    Physical Review B 64 (2001) 245416

2002

40. (0) B. Struth, F. Rieutord, O. Konovalov, G. Brezesinski, G. Grübel and P. Terech Organization of two-dimensional phospholipid monolayers on a gel-forming substrate Phys. rev. lett. 88 (2002) 025502
41. [Book chapter] G. Fragneto, E. Bellet-Amalric and F. Graner
    Nanometer scale studies of lipid bilayers using neutrons and x-rays
    in "Membrane interacting peptides and proteins", ed. F. Heitz (Research Signpost, Trivandrum, India), pp. 43-66 (2002)
42. (4) J.S. Filhol, M.-C. Saint-Lager, M. De Santis, P. Dolle, D. Simon, R. Baudoing-Savois, J.C. Bertolini and P. Sautet
    Highly strained structure of a four-layer deposit of Pd on Ni(110): A couple theoretical and experimental study
    Phys. Rev. Lett. 89 (2002) 146106
43. (25) E. Lundgren, G. Kresse, C. Klein, M. Borg, J. N. Andersen, M. De Santis, Y. Gauthier, C. Konvicka, M. Schmid, P. Varga
    Two-Dimensional Oxide on Pd(111)
    Phys. Rev. Lett. 88 (2002) 246103
44. (0) M. De Santis, R. Baudoing-Savois, P. Dolle, M. C. Saint-Lager
    Chemical Ordering in the First Stages of Co-Pt film growth on Pt(111)
    Phys. Rev. B 66 (2002) 085412
45. (2) P. Dolle, R. Baudoing-Savois, M. De Santis, M. C. Saint-Lager, M. Abel, J. C. Bertolini, P. Delichere Strained Pd films, by epitaxial growth on Au(110), to control cathalitic proprerties Surface Science 518 (2002) 1
46. (3) O. Fruchart, G. Renaud, J.-P. Deville, A. Barbier, F. Scheurer, M. Klaua, J. Barthel, M. Noblet, O. Ulrich, J. Mane-Mane, J. Kirschner
    Self-organized growth of nanosized flat dots and vertical magnetic Co pillars on Au(111)
    Journal of Crystal Growth 237-239(3) (2002) 2035
47. (3) Vilfan I, Deutsch T, Lancon F, Renaud G, et al.,
    Structure determination of the (3 sqrt(3)X 3 sqrt(3)) reconstructed alpha-Al2O3(0001)
    Surf. Sci. 505, L215-221 (2002)
    (+ Erratum Surface Science 529 (2003) 281)
48. (3) D. Buttard, J. Eymery, F. Fournel, P. Gentille, F. Leroy, N. Magnea, H. Moriceau, G. Renaud, F. Rieutord, K. Rousseau and J.L. Rouviere
    Towards the two dimensional lateral long range order self-organization of nanostructures using patterned silicon surface
    IEEE J. Quant. Elec. 38 (2002) 995
49. A. Barbier, C. Mocuta and G. Renaud
    In situ synchrotron structural studies of the growth of oxides and metals
    Chapter 11 of ``HANDBOOK of THIN FILM MATERIALS'' Vol. 2: ``Characterization and Spectroscopy of thin films'', p 527-596; Ed. : Hari Singh Nalwa; Publisher : Academic Press, 2002.
50. (1) M. Derivaz, P. Noé, R. Dianoux, A. Barski, T. Schülli, T.H. Metzger
    Growth of highly strained germanium dots on Si(001) covered by a silicon nitride layer
    Appl. phys. lett. 81 (2002) 3843
51. (17) R. Lazzari
    IsGISAXS: A program for grazing-incidence small-angle X-ray scattering analysis of supported islands
    J. Appl. Crystallogr. 35 (2002) 406

2003

52. (1) H. Enriquez, M. D'angelo, V.Yu. Aristov, V. derycke, P. Soukassian, G. Renaud, A. Barbier, S. Chiang, F. Semond
    Silicon carbide surface structure investigated by synchrotron radiation-based x-ray diffraction
    Journal of Vacuum Science \& Technology B 21 (2003) 1881
53. (5) M. D'angelo, H. Enriquez, V.Yu. Aristov, P. Soukassian, G. Renaud, A. Barbier, M. Noblet, S. Chiang, F. Semond
    Atomic structure determination of the Si-rich beta -SiC(001) 3*2 surface by grazing-incidence x-ray diffraction: a stress-driven reconstruction
    Physical Review B 68 (2003) 165321
54. (0) M. D'angelo, H. Enriquez, V.Yu. Aristov, P. Soukassian, G. Renaud, A. Barbier, S. Chiang, F. Semond, L. Di Cioccio, T. Billion
    Cubic SiC surface structure studied by X-ray diffraction
    Silicon Carbide and Related Materials -2002- Materials Science Forum. 433-434 (2003) 571
55. (1) C. Ybert, L. Navailles, B. Pansu, F. Rieutord, H.T. Nguyen and P. Barois
    Structural study of the liquid crystal analog of the vortex liquid phase in type II superconductors
    Europhysics Letters 63 (2003) 840
56. (24) G. Renaud, R. Lazzari, C. Revenant, A. Barbier, M. Noblet, O. Ullrich, F. Leroy, Y. Borensztein, J. Jupille, C.R. Henry, J. P. Deville, F. Scheurer, J. Mane-Mane, O. Fruchart
    In situ GISAXS towards a real time modelling of growing nanoparticles
    Science 300 (2003) 1416
57. (1) F. Leroy, J. Eymery, D. Buttard, G. Renaud, R. Lazzari, F. Fournel
    Grazing incidence X-ray scattering investigations of silicon surface patterned with buried dislocation networks
    Appl. Phys. Lett. 82 (2003) 2598
58. G. Fragneto-Cusani
    On how reflectivity studies can help in understanding interactions at cell surfaces
    in "Self Assembly", Ed. B. H. Robinson, IOS Press, Amsterdam, Netherlands (2003) pp. 63-69
59. (1) R. Koller, Y. Gauthier, C. Klein, M. De Santis, M. Schmid, P. Varga
    Structure and composition of Pt50Rh50(110). RT analysis of the (1x3) missing row reconstruction by X-rays, STM, LEIS and LEED
    Surface Science 530 (2003) 121
60. (3) O. Fruchart, G. Renaud, A. Barbier, M. Noblet, O. Ulrich, J.-P. Deville, F. Scheurer, J. Mane-Mane, V. Repain, G. Baudot, S. Rousset
    X -ray super-cell crystallography of self-organized Co/Au(111) deposits
    Europhysics Letters 63 (2003) 275
61. (0) A. Barbier, S. Stanescu, C. Boeglin, J.P. Deville
    Local morphology and correlation lengths of reactive NiO/Cu(111) interfaces
    Phys. rev. B 68 (2003) 245418
62. (0) B. Bataillou, H. Moriceau, F. Rieutord
    Direct inversion of interfacial reflectivity data using the Patterson function
    J. Appl. Crystallogr. 36 (2003) 1352
63. (0) D. Buttard, F. Rieutord, J. Eymery, F. Fournel, B. Bataillou
    Buried hydrophobic silicon interfaces studied by high-energy x-ray reflectivity
    Journal of Physics D: Applied Physics 36(10A) (2003) A205-A208
64. (4) F. Leroy, J. Eymery, P. Gentile, F. Fournel
    Controlled surface nanopatterning with buried dislocation arrays
    Surface Science 545 (2003) 211
65. (2) S. Stanescu, C. Boeglin, A. Barbier, J.P. Deville
    Growth mode of NiO on Cu(111) studied using scanning tunneling microscopy and surface X-ray diffraction
    Phys. rev. B 67 (2003) 035419

2004

66. (3) [Review] P. G. Soukiassian and H. B. Enriquez
    Atomic scale control and understanding of cubic silicon carbide surface reconstructions, nanostructures and nanochemistry
    Journal of Physics : Condensed Matter 16, Special Section on Silicon Carbide (2004) S 1611
67. (0) E. Lacaze, M. Alba, M. Goldmann, J.P. Michel and F. Rieutord
    Dimerization in the commensurate network of 4-n-octyl-4-cyanobiphenyl (8CB) molecules adsorbed on MoS2 single crystal
    Eur. Phys. J. B 39 (2004) 261.
68. (1) M. De Santis, V. Abad-Langlais, Y. Gauthier, P. Dolle
    Growth and structure of the Ni(110)-c(2x2)Mn surface alloy : an X-ray diffraction analysis
    Physical Review B 69 (2004) 115430
69. (5) C. Revenant, F. Leroy, R. Lazzari, G. Renaud and C.R.Henry
    Quantitative analysis of grazing incidence small-angle x-ray scattering: Pd/MgO(001) growth
    Physical Review B 69 (2004) 035411
70. R. Lazzari, G. Renaud and F. Leroy
    Regarder croître les nano-objets
    Bull. Soc. Franc. Phys. 142 (2004) 8
71. (2) C. Mocuta, A. Barbier, S. Lafaye, P. Bayle-Guillemaud, M. Panabière
    Single-crystalline model spin valves using single-crystalline NiO(111) substrates
    Phys. rev. B 68 (2004) 014416
72. (0) C. Mocuta, A. Barbier, G. renaud, M. Panabière, P. Bayle-Guillemaud
    Structure and growth of metal on NiO(111) single crystal interfaces
    Journal of Applied Physics 95 (2004) 2151
73. (0) G. Renaud, M. Ducruet, O. Ulrich, R. Lazzari
    Apparatus for real time in situ quantitative studies of growing nanoparticles by grazing incidence small angle X-ray scattering and surface differential reflectance spectroscopy
    Nucl. Inst. Meth. Phys. Res. B 222 (2004) 667
74. (0) F. Leroy, R. Lazzari and G. Renaud
    Effects of near-neighbor correlations on the diffuse scattering from a one-dimensional paracrystal
    Acta Crystallographica A60 (2004) 565
75. (0) D. Rebiscoul, A. Van der Lee, F. Rieutord, F. Né, O. Spalla, A. El-Mansouri, P. Frugier, A. Ayral, S. Gin
    Morphological evolution of alteration layers formed during nuclear glass alteration: new evidence of a gel as a diffusive barrier
    Journal of Nuclear Materials 326 (2004) 9
76. (1) A. Létoublon,V. Favre-Nicolin, H. Renevier, M.G. Proietti, C. Monat, M. Gendry, O. Marty, C. Priester
    Strain, Size, and Composition of InAs Quantum Sticks Embedded in InP Determined via Grazing Incidence X-Ray Anomalous Diffraction
    Physical Review Letters 92 (2004) 186101
77. D. Baigl, M. A. Guedeau-Boudeville, R. Ober, F. Rieutord, M. Sferrazza, O. Théodoly, T. Waigh, and C. E. Williams
    Adsorption of hydrophobic polyelectrolytes as studied by in situ high energy X-Ray reflectivity
    http://arxiv.org/abs/cond-mat/0403139

2005

78. J. Daillant, E. Bellet-Amalric, A. Braslau, T. Charitat, G. Fragneto, F. Graner, S. Mora, F. Rieutord, B. Stidder
    Structure and fluctuations of a single floating lipid bilayer
    Proc. Nat. Acad. Sci. USA, 102 (33) (2005) 11639
79. N. Jedrecy, G. Renaud, R. Lazzari, J. Jupille
    Flat-top silver nanocrystals on the two polar faces of ZnO: an all angle x-ray scattering investigation
    Phys. Rev. B 72 (2005) 045430
80. M.-C. Saint-Lager, Y. Jugnet, P. Dolle, L. Piccolo, R. Baudoing-Savois, J.C. Bertolini, A. Bailly, O. Robach, C. Walker, S. Ferrer
    Surface structure from surface X-ray diffraction. Surface evolution under hydrogen and butadiene reactants at elevated pressure Pd8Ni92(110)
    Surface Science 587 (2005) 229
81. (0) L. Giovanelli, M. De Santis, G. Panaccione, F. Sirotti, P. Torelli, I. Vobornik, R. Larciprete, S. Egger, M.C. Saint-Lager, P. Dolle and G. Rossi
    Magnetic and electronic properties of a Pt--Co bilayer on Pt(1 1 1)
    J. of Magnetism and Magnetic Materials 288 (2005) 236
82. (0) I. Robinson, M. C. Saint-Lager, P. Dolle, S. Boutet, M. De Santis, R. Baudoing-Savois
    Relaxations in the 1x5 reconstruction of Pt(110)
    Surface Science 575 (2005) 321
83. F. Leroy et al. ???? accepted in Phys. Rev. Lett.