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Beamline List of Publications (Users and Staff members)

    1998 1999 2000
2001 2002 2003 2004 2005
2006 2007 2008 2009 2010
2011 2012 2013 2014 2015

Regular papers and book chapters

(#) number of citations (included self-citations):

  • in june 2005 for papers  up to 2005
  • in march 2010 for papers 2006-2010
  • in november 2013 for papers 2011-2013

1998

  1. (5) C. Fradin, D. Luzet, A. Braslau, M. Alba, F. Muller, J. Daillant, J.M. Petit and F. Rieutord
    X-ray study of the fluctuations and of the interfacial structure of a phospholipid monolayer at an alkane-waterinterface
    Langmuir 14(26) (1998) 7327
  2. (14) M.C. Saint-Lager, R. Baudoing-Savois, M. De Santis, P. Dolle and Y. Gauthier
    Thickness effect on alloying of ultrathin Co films on Pt(111): a real time and in situ UHV study with synchrotron x-ray diffraction
    . Surface Science 418 (1998) 485
  3. (104) [Review] G. Renaud
    Oxide surfaces and metal/oxide interfaces studied by grazing incidence X-ray scattering
    Surface Science Reports 32(1-2) (1998) 1-90
  4. (29) A. Bourret, A. Barski, J.L. Rouvière, G. Renaud and A. Barbier
    Growth of aluminum nitride on (111) silicon: microstructure and interface structure J. Appl. Phys. 83 (1998) 2003
  5. (0) O. Robach, G. Renaud and A. Barbier
    Very-high-quality MgO(001) surfaces : roughness, rumpling and relaxation
    Surf. Sci. 401 (1998) 227
  6. (13) G. Renaud, P. Gu\'{e}nard and A. Barbier
    Misfit dislocation network at the Ag/MgO(001) interface{\nobreakspace
    : A grazing-incidence x-ray scattering study} Phys. Rev. B. 58 (1998) 7310
  7. (10) A. Barbier, G. Renaud and O. Robach
    Growth, annealing and oxidation of the Ni/MgO(001) interface studied by grazing incidence X-ray scattering
    J. Appl. Phys. 84 (1998) 4259
  8. (8) C. Mocuta, A. Barbier, G. Renaud and B. Dieny
    Growth and Magnetism of Co/NiO(111) thin films
    Thin Solid films 336 (1998) 160
  9. (3) N. Pelekanos, N. Boudet, J. Eymery and H. Mariette
    Interface roughness correlation in CdTe / CdZnTe strained quantum wells
    J. Cryst. Growth184 (1998) 886
  10. (2) E. Lacaze, M. Alba, J. Barre, A. Braslau, M. Goldmann and J. Serreau
    Organic monolayers: Interface between 8CB liquid crystals and MoS2 monocrystal
    , Physica B 248 (1998) 246
  11. (24) E.A.L. Mol, G.C.L. Wong, J.M. Petit, F. Rieutord, W.H. de Jeu
    Thinning transitions and fluctuations of freely suspended smectic-A films as studied by specular and diffuse X-ray scattering
    Physica B 248 (1998) 191

1999

  1. (19) R. Baudoing-Savois, G. Renaud, M. De Santis, A. Barbier, O. Robach, P. Taunier, P. Jeantet, O. Ulrich, J.P. Roux, M.C. Saint-Lager, A. Barski, O. Geaymond, G. Berard, P. Dolle, M. Noblet and A. Mougin
    A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF
    Nucl. Instrum. Methods Phys. Res B 149 (1999) 213
  2. (4) S. Boukari, E. Beaurepaire, H. Bulou, B. Carrière, J.P. Deville, F. Scheurer, R. Baudoing Savois and M. De Santis
    Strain induced epitaxial relationship of Cr on Co/Pd(111)
    Surface Science 430 (1999) 37
  3. (2) M. De Santis, R. Baudoing-Savois, P. Dolle, M.C. Saint-Lager and Y. Gauthier
    Long range order in ultra-thin Pt-Co(111) alloys
    Surface Review Letters 6 (1999) 361
  4. (2) R. Baudoing-Savois, Y. Gauthier, P. Dolle, M.C. Saint-Lager and M. De Santis
    Co ultra thin films on Pt(111) and Co-Pt alloying : A LEED, Auger and Synchrotron X-ray diffraction study
    Journal of Physic: Condensed Matter 11 (1999) 8355
  5. (28) O. Robach, G. Renaud and A. Barbier
    Structure and morphology of the Ag/MgO(001) interface during in situ growth at room temperature
    Phys. Rev. B 60 (1999) 5858
  6. (12) G. Renaud, A. Barbier and O. Robach
    Growth, structure and morphology of the Pd/MgO(001) interface: epitaxial site and interfacial distance
    Phys. Rev. B 60 (1999) 5872
  7. (5) R. Langer, A. Barski, A. Barbier, G. Reanud, M. Leszczynski, I. Grzegory and S. Porowski
    Strain relaxation in AlN epitaxial layers grown on GaN single crystals
    J. Cryst. Growth 205 (1999) 31
  8. (11) D. Buttard, G. Dolino, D. Bellet, T. Baumbach and F. Rieutord
    X-ray reflectivity investigation of thin p-type porous silicon layers
    Solid state commun. 109 (1999) 1
  9. (10) J. Eymery, F. Fournel, F. Rieutord, D. Buttard, H. Moriceau and B. Aspar
    X-ray reflectivity of ultrathin twist-bonded silicon wafers
    Appl. phys. lett. 75 (1999) 3509

2000

  1. (1) P. Cluzeau, P. Gisse, V. Ravaine, A.-M. Levelut, P. Barois, C.C. Huang, F. Rieutord and H.T. NGuyen
    Resonant X-ray diffraction study of a new brominated chiral SmCA* liquid crystal
    Ferroelectrics 244 (2000) 301
  2. (4) G. Fragneto, E. Bellet-Amalric, T. Charitat, P. Dubos, F. Graner and L. Perino-Gallice
    Neutron and X-Ray Reflectivity Studies at Solid-Liquid Interfaces: the Interaction of a Peptide with Model Membranes
    Physica B 276-278 (2000) 501
  3. L. Perino-Gallice, E. Bellet-Amalric, A. Braslau, T. Charitat, J. Daillant, G. Fragneto and F. Graner
    Adsorbed and free lipid bilayers at the solid-water interface viewed by specular and off-specular reflectivity
    Prog. Colloid Polym Sci. 115 (2000) 171
  4. (6) C.Mocuta, A. Barbier and G. Renaud
    CoO(111) surface study by surface X-ray diffraction
    Appl. Surf. Sci. 162-163 (2000) 56
  5. (0) J.P. Deville, A.Barbier, C. Mocuta, G. Renaud, Y. Samson, H. Magna, P. Le Fevre, D. Chandesris, C. Panissod and C. Meny
    Magnetic ultrathin films and mulilayerse
    : growth and characterization} Analusis 28 (2000) 20
  6. (26) A.Barbier, C. Mocuta, H. Kuhlenbeck, K.F. Peters, B. Richter and G. Renaud
    Atomic structure of the polar NiO(111)-p(2x2) surface
    Phys. Rev. Lett. 84 (2000) 2897
  7. (7) A. Barbier, C. Mocuta and G. Renaud
    Structure, transformation and reduction of the polar NiO(111) surface
    Phys. Rev. B 62 (2000) 16056
  8. (0) C. Alonso, F. Artzner, J. Lajzerowicz, G. Grübel, N. Boudet, F. Rieutord, J.M. Petit, A. Renault
    Thermodynamics and X-ray studies of 2-alcohol monolayers: Two-dimensional phase diagrams
    European Physical Journal E 3 (2000) 63
  9. (1) P.F. Lenne, F. Bonosi, A. Renault, E. Bellet-Amalric, J.F. Legrand, J.M. Petit, F. Rieutord and F. Berge
    Growth of two-dimensional solids in alcohol monolayers in the presence of soluble amphiphilic molecules
    Langmuir 16 (2000) 2306
  10. (21) [Review] J. Daillant and M. Alba High-resolution x-ray scattering measurements: I. Surfaces Reports on progress in physics 53 (10) (2000) 1725

2001

  1. (6) S. Marchesini, O. Ulrich, G. Faigel,M. Tegze, M. Belakhovsky, A. S. Simionovici
    Instrumental development of X-ray atomic holography at ESRF
    Nuclear Instruments & Methods in Physics Research A 457 (2001) 601
  2. (3) E. Lacaze, M. Alba, M. Goldmann, J.P. Michel and F. Rieutord
    Adsorbed organic monolayers on crystalline substrate: the example of 8CB on MoS2{\textquotedbl
    } Appl Surf. Sci. 175-176 (2001) 337
  3. (4) S. Boukari, E. Beaurepaire, H. Bulou, B. Carrière, J.P. Deville, F. Scheurer, M. De Santis, R. Baudoing-Savois
    Influence of strain on the magnetocrystalline anisotropy in epitaxial Cr/Co/Pd(111) films
    Physical Review B 64 (2001) 144431
  4. G. Renaud and A. Barbier
    Atomic Structure of Oxide Surfaces by Surface X-ray Scattering
    Chapter 6 of "The Chemical Physics of Solid Surfaces", Volume 9: "Oxide Surfaces", ed. D.P. Woodruff, pp. 256-298 (2001)
  5. P. Bayle-Guillemaud, A. Barbier and C. Mocuta
    Development of a quantitative energy filtering TEM method to study a reactive NiO/80Ni20Fe interface
    Ultramicroscopy 88 (2001) 99
  6. (2) J. Eymery, F. Rieutord, F. Fournel, D. Buttard and H. Moriceau
    X-ray reflectivity of silicon on insulator wafers
    Materials Science in Semiconductor Processing 4 (2001) 31
  7. (9) C. Gourier, M. Alba, A. Braslau, J. Daillant, M. Goldmann, C.M. Knobler, F. Rieutord and G. Zalczer
    Structure and elastic properties of 10-12 pentacosadiyonic acid langmuir films
    Langmuir 17 (2001) 6496
  8. (6) F. Rieutord, J. Eymery, F. Fournel, D. Buttard, R. Oeser, O. Plantevin, H. Moriceau and B. Aspar High-energy X-ray reflectivity of buried interfaces created by wafer bonding Physical Review B 63 (2001) 125408
  9. (3) V. Chamard, P. Bastie, D. Le Bolloch, G. Dolino, E. Elkaïm, C. Ferrero, J.-P. Lauriat, F. Rieutord and D. Thiaudière
    Evidence for self organization in porous silicon: an x-ray grazing incidence study
    Physical Review B 64 (2001) 245416

2002

  1. (0) B. Struth, F. Rieutord, O. Konovalov, G. Brezesinski, G. Grübel and P. Terech
    Organization of two-dimensional phospholipid monolayers on a gel-forming substrate
    Phys. rev. lett. 88 (2002) 025502
  2. [Book chapter] G. Fragneto, E. Bellet-Amalric and F. Graner
    Nanometer scale studies of lipid bilayers using neutrons and x-rays
    in "Membrane interacting peptides and proteins", ed. F. Heitz (Research Signpost, Trivandrum, India), pp. 43-66 (2002)
  3. (4) J.S. Filhol, M.-C. Saint-Lager, M. De Santis, P. Dolle, D. Simon, R. Baudoing-Savois, J.C. Bertolini and P. Sautet
    Highly strained structure of a four-layer deposit of Pd on Ni(110): A couple theoretical and experimental study
    Phys. Rev. Lett. 89 (2002) 146106
  4. (25) E. Lundgren, G. Kresse, C. Klein, M. Borg, J. N. Andersen, M. De Santis, Y. Gauthier, C. Konvicka, M. Schmid, P. Varga
    Two-Dimensional Oxide on Pd(111)
    Phys. Rev. Lett. 88 (2002) 246103
  5. (0) M. De Santis, R. Baudoing-Savois, P. Dolle, M. C. Saint-Lager
    Chemical Ordering in the First Stages of Co-Pt film growth on Pt(111)
    Phys. Rev. B 66 (2002) 085412
  6. (2) P. Dolle, R. Baudoing-Savois, M. De Santis, M. C. Saint-Lager, M. Abel, J. C. Bertolini, P. Delichere Strained Pd films, by epitaxial growth on Au(110), to control cathalitic proprerties Surface Science 518 (2002) 1
  7. (3) O. Fruchart, G. Renaud, J.-P. Deville, A. Barbier, F. Scheurer, M. Klaua, J. Barthel, M. Noblet, O. Ulrich, J. Mane-Mane, J. Kirschner
    Self-organized growth of nanosized flat dots and vertical magnetic Co pillars on Au(111)
    Journal of Crystal Growth 237-239(3) (2002) 2035
  8. (3) Vilfan I, Deutsch T, Lancon F, Renaud G, et al.,
    Structure determination of the (3 sqrt(3)X 3 sqrt(3)) reconstructed alpha-Al2O3(0001)
    Surf. Sci. 505, L215-221 (2002)
    (+ Erratum Surface Science 529 (2003) 281)
  9. (3) D. Buttard, J. Eymery, F. Fournel, P. Gentille, F. Leroy, N. Magnea, H. Moriceau, G. Renaud, F. Rieutord, K. Rousseau and J.L. Rouviere
    Towards the two dimensional lateral long range order self-organization of nanostructures using patterned silicon surface
    IEEE J. Quant. Elec. 38 (2002) 995
  10. A. Barbier, C. Mocuta and G. Renaud
    In situ synchrotron structural studies of the growth of oxides and metals
    Chapter 11 of ``HANDBOOK of THIN FILM MATERIALS'' Vol. 2: ``Characterization and Spectroscopy of thin films'', p 527-596; Ed. : Hari Singh Nalwa; Publisher : Academic Press, 2002.
  11. (1) M. Derivaz, P. Noé, R. Dianoux, A. Barski, T. Schülli, T.H. Metzger
    Growth of highly strained germanium dots on Si(001) covered by a silicon nitride layer
    Appl. phys. lett. 81 (2002) 3843
  12. (17) R. Lazzari
    IsGISAXS: A program for grazing-incidence small-angle X-ray scattering analysis of supported islands
    J. Appl. Crystallogr. 35 (2002) 406

2003

  1. (1) H. Enriquez, M. D'angelo, V.Yu. Aristov, V. derycke, P. Soukassian, G. Renaud, A. Barbier, S. Chiang, F. Semond
    Silicon carbide surface structure investigated by synchrotron radiation-based x-ray diffraction
    Journal of Vacuum Science \& Technology B 21 (2003) 1881
  2. (5) M. D'angelo, H. Enriquez, V.Yu. Aristov, P. Soukassian, G. Renaud, A. Barbier, M. Noblet, S. Chiang, F. Semond
    Atomic structure determination of the Si-rich beta -SiC(001) 3*2 surface by grazing-incidence x-ray diffraction: a stress-driven reconstruction
    Physical Review B 68 (2003) 165321
  3. (0) M. D'angelo, H. Enriquez, V.Yu. Aristov, P. Soukassian, G. Renaud, A. Barbier, S. Chiang, F. Semond, L. Di Cioccio, T. Billion
    Cubic SiC surface structure studied by X-ray diffraction
    Silicon Carbide and Related Materials -2002- Materials Science Forum. 433-434 (2003) 571
  4. (1) C. Ybert, L. Navailles, B. Pansu, F. Rieutord, H.T. Nguyen and P. Barois
    Structural study of the liquid crystal analog of the vortex liquid phase in type II superconductors
    Europhysics Letters 63 (2003) 840
  5. (24) G. Renaud, R. Lazzari, C. Revenant, A. Barbier, M. Noblet, O. Ullrich, F. Leroy, Y. Borensztein, J. Jupille, C.R. Henry, J. P. Deville, F. Scheurer, J. Mane-Mane, O. Fruchart
    In situ GISAXS towards a real time modelling of growing nanoparticles
    Science 300 (2003) 1416
  6. (1) F. Leroy, J. Eymery, D. Buttard, G. Renaud, R. Lazzari, F. Fournel
    Grazing incidence X-ray scattering investigations of silicon surface patterned with buried dislocation networks
    Appl. Phys. Lett. 82 (2003) 2598
  7. G. Fragneto-Cusani
    On how reflectivity studies can help in understanding interactions at cell surfaces
    in "Self Assembly", Ed. B. H. Robinson, IOS Press, Amsterdam, Netherlands (2003) pp. 63-69
  8. (1) R. Koller, Y. Gauthier, C. Klein, M. De Santis, M. Schmid, P. Varga
    Structure and composition of Pt50Rh50(110). RT analysis of the (1x3) missing row reconstruction by X-rays, STM, LEIS and LEED
    Surface Science 530 (2003) 121
  9. (3) O. Fruchart, G. Renaud, A. Barbier, M. Noblet, O. Ulrich, J.-P. Deville, F. Scheurer, J. Mane-Mane, V. Repain, G. Baudot, S. Rousset
    X -ray super-cell crystallography of self-organized Co/Au(111) deposits
    Europhysics Letters 63 (2003) 275
  10. (0) A. Barbier, S. Stanescu, C. Boeglin, J.P. Deville
    Local morphology and correlation lengths of reactive NiO/Cu(111) interfaces
    Phys. rev. B 68 (2003) 245418
  11. (0) B. Bataillou, H. Moriceau, F. Rieutord
    Direct inversion of interfacial reflectivity data using the Patterson function
    J. Appl. Crystallogr. 36 (2003) 1352
  12. (0) D. Buttard, F. Rieutord, J. Eymery, F. Fournel, B. Bataillou
    Buried hydrophobic silicon interfaces studied by high-energy x-ray reflectivity
    Journal of Physics D: Applied Physics 36(10A) (2003) A205-A208
  13. (4) F. Leroy, J. Eymery, P. Gentile, F. Fournel
    Controlled surface nanopatterning with buried dislocation arrays
    Surface Science 545 (2003) 211
  14. (2) S. Stanescu, C. Boeglin, A. Barbier, J.P. Deville
    Growth mode of NiO on Cu(111) studied using scanning tunneling microscopy and surface X-ray diffraction
    Phys. rev. B 67 (2003) 035419

2004

  1. (3) [Review] P. G. Soukiassian and H. B. Enriquez
    Atomic scale control and understanding of cubic silicon carbide surface reconstructions, nanostructures and nanochemistry
    Journal of Physics : Condensed Matter 16, Special Section on Silicon Carbide (2004) S 1611
  2. (0) E. Lacaze, M. Alba, M. Goldmann, J.P. Michel and F. Rieutord
    Dimerization in the commensurate network of 4-n-octyl-4-cyanobiphenyl (8CB) molecules adsorbed on MoS2 single crystal
    Eur. Phys. J. B 39 (2004) 261.
  3. (1) M. De Santis, V. Abad-Langlais, Y. Gauthier, P. Dolle
    Growth and structure of the Ni(110)-c(2x2)Mn surface alloy : an X-ray diffraction analysis
    Physical Review B 69 (2004) 115430
  4. (5) C. Revenant, F. Leroy, R. Lazzari, G. Renaud and C.R.Henry
    Quantitative analysis of grazing incidence small-angle x-ray scattering: Pd/MgO(001) growth
    Physical Review B 69 (2004) 035411
  5. R. Lazzari, G. Renaud and F. Leroy
    Regarder croître les nano-objets
    Bull. Soc. Franc. Phys. 142 (2004) 8
  6. (2) C. Mocuta, A. Barbier, S. Lafaye, P. Bayle-Guillemaud, M. Panabière
    Single-crystalline model spin valves using single-crystalline NiO(111) substrates
    Phys. rev. B 68 (2004) 014416
  7. (0) C. Mocuta, A. Barbier, G. renaud, M. Panabière, P. Bayle-Guillemaud
    Structure and growth of metal on NiO(111) single crystal interfaces
    Journal of Applied Physics 95 (2004) 2151
  8. (0) G. Renaud, M. Ducruet, O. Ulrich, R. Lazzari
    Apparatus for real time in situ quantitative studies of growing nanoparticles by grazing incidence small angle X-ray scattering and surface differential reflectance spectroscopy
    Nucl. Inst. Meth. Phys. Res. B 222 (2004) 667
  9. (0) F. Leroy, R. Lazzari and G. Renaud
    Effects of near-neighbor correlations on the diffuse scattering from a one-dimensional paracrystal
    Acta Crystallographica A60 (2004) 565
  10. (0) D. Rebiscoul, A. Van der Lee, F. Rieutord, F. Né, O. Spalla, A. El-Mansouri, P. Frugier, A. Ayral, S. Gin
    Morphological evolution of alteration layers formed during nuclear glass alteration: new evidence of a gel as a diffusive barrier
    Journal of Nuclear Materials 326 (2004) 9
  11. (1) A. Létoublon,V. Favre-Nicolin, H. Renevier, M.G. Proietti, C. Monat, M. Gendry, O. Marty, C. Priester
    Strain, Size, and Composition of InAs Quantum Sticks Embedded in InP Determined via Grazing Incidence X-Ray Anomalous Diffraction
    Physical Review Letters 92 (2004) 186101
  12. D. Baigl, M. A. Guedeau-Boudeville, R. Ober, F. Rieutord, M. Sferrazza, O. Théodoly, T. Waigh, and C. E. Williams
    Adsorption of hydrophobic polyelectrolytes as studied by in situ high energy X-Ray reflectivity
    http://arxiv.org/abs/cond-mat/0403139

2005

  1. J. Daillant, E. Bellet-Amalric, A. Braslau, T. Charitat, G. Fragneto, F. Graner, S. Mora, F. Rieutord, B. Stidder
    Structure and fluctuations of a single floating lipid bilayer
    Proc. Nat. Acad. Sci. USA, 102 (33) (2005) 11639
  2. N. Jedrecy, G. Renaud, R. Lazzari, J. Jupille
    Flat-top silver nanocrystals on the two polar faces of ZnO: an all angle x-ray scattering investigation
    Phys. Rev. B 72 (2005) 045430
  3. M.-C. Saint-Lager, Y. Jugnet, P. Dolle, L. Piccolo, R. Baudoing-Savois, J.C. Bertolini, A. Bailly, O. Robach, C. Walker, S. Ferrer
    Surface structure from surface X-ray diffraction. Surface evolution under hydrogen and butadiene reactants at elevated pressure Pd8Ni92(110)
    Surface Science 587 (2005) 229
  4. (0) L. Giovanelli, M. De Santis, G. Panaccione, F. Sirotti, P. Torelli, I. Vobornik, R. Larciprete, S. Egger, M.C. Saint-Lager, P. Dolle and G. Rossi
    Magnetic and electronic properties of a Pt--Co bilayer on Pt(1 1 1)
    J. of Magnetism and Magnetic Materials 288 (2005) 236
  5. (0) I. Robinson, M. C. Saint-Lager, P. Dolle, S. Boutet, M. De Santis, R. Baudoing-Savois
    Relaxations in the 1x5 reconstruction of Pt(110)
    Surface Science 575 (2005) 321

2006

  1. (30) [1.96] Effect of macromolecular parameters and processing conditions on supramolecular
    organisation, morphology and electrical transport properties in thin layers of regioregular poly(3hexylthiophene)

    VERILHAC JM, LEBLEVENNEC G, DJURADO D, F. RIEUTORD, M. CHOUIKI, J.-P. TRAVERS, A. PRON
    Synthetic Metals 156 (1113) 815-823 2006
  2. [7.18] Comment on "Destructive effect of disorder and bias voltage on interface resonance transmission in symmetric tunnel
    junctions
    "
    TUSCHE, C; MEYERHEIM, HL; JEDRECY, N; RENAUD, G; ERNST, A; HENK, J; BRUNO, P;
    KIRSCHNER, J
    Phys. Rev. Lett. 96 (2006) 119602
  3. (1) [1.73] The epitaxial sexiphenyl (001) monolayer on TiO2(110): A grazing incidence Xray
    diffraction study

    R. RESEL, M. OEHZELT, O. LENGYEL, T. HABER, T. SCHÜLLI ET AL.,
    Surf. Sci. 600 (2006) 4645
  4. (0) [2.20] Strain and composition of ultrasmall Ge quantum dots studied by xray scattering and in situ
    surface xray absorption spectroscopy

    DUJARDIN, R; POYDENOT, V; SCHULLI, TU; RENAUD, G; ULRICH, O; BARSKI, A; DERIVAZ, M;
    COLONNA, S; METZGER, T
    J. Appl. Phys. 99 (2006) 063510
  5. (2) [3.7398] In situ resonant xray study of vertical correlation and capping effects during GaN/AlN quantum dot growth
    CORAUX, J; RENEVIER, H; FAVRENICOLIN, V; RENAUD, G; DAUDIN, B
    Appl. Phys. Lett. 88 (2006) 153125
  6. (3) [1.00] Growth of Ag on MgO(001) studied in situ by grazing incidence small angle Xray scattering
    REVENANT, C; RENAUD, G; LAZZARI, R; JUPILLE, J
    Nucl. Inst. & Meth. Phys. Res. B, 246 (2006) 112
  7. (0) [0.97] In situ and ex situ grazing incidence diffraction anomalous fine structure study of GaN/AIN
    quantum dots

    CORAUX, J; RENEVIER, H; PROIETTI, MG; FAVRENICOLIN,
    V; DAUDIN, B; RENAUD, G
    Phys. Stat. Sol. B 243 (2006) 1519
  8. (1) [1.00] In situ investigation by GISAXS and GIXD of the growth mode, strain state and shape of Ge islands during their
    growth on Si(001)

    RICHARD, MI; SCHULLI, TU; WINTERSBERGER, E; RENAUD, G; BAUER, G
    Nucl. Inst. & Meth. Phys. Res. B 246 (2006) 35
  9. (2) [1.67] Growth mode, strain state and shape of Ge islands during their growth at different temperatures: a combined in
    situ GISAXS and GIXD study

    RICHARD, MI; SCHULLI, TU; WINTERSBERGER, E; RENAUD, G; BAUER, G
    Thin Solid Films 508 (2006) 213
  10. (6) [3.32] Growth sequence and interface formation in the Fe/MgO/Fe(001) tunnel junction analyzed by surface x-ray
    diffraction

    C. TUSCHE, H. L. MEYERHEIM, N. JEDRECY, G. RENAUD AND J. KIRSCHNER
    Phys. Rev. B 74 (2006) 195422
  11. (0) [2.20] Strain and composition of ultrasmall Ge quantum dots studied by x-ray Scattering and in situ surface xray
    absorption spectroscopy

    R. DUJARDIN, V. POYDENOT, T. U. SCHÜLLI, G. RENAUD, O. ULRICH, A. BARSKI, M. DERIVAZ,
    S. COLONNA AND T. METZGER
    J. Appl. Phys. 99 (2006) 063510
  12. (2) [3.98] In situ investigation of the island nucleation of Ge on Si(001) using xray scattering methods
    T. U. SCHÜLLI, M.I. RICHARD, G. RENAUD, AND V. FAVRENICOLIN, E. WINTERSBERGER AND
    G. BAUER
    Appl. Phys. Lett. 89 (2006) 143114
  13. (2) [1.73] Ge quantum dots growth on nanopatterned Si(001) surface: Morphology and stress relaxation study
    PASCALE A, GENTILE P, EYMERY J, MEZIERE J, BAVARD A, SCHULLI T U, FOURNEL F
    Surf. Sci. (2006) 600 (16): 3187-3193
  14. (1) [1.73] Temperature- and coverage-dependent evolution of the Au/Pd(110) surface structure,
    KRALJ M, BAILLY A, SAINT-LAGER MC, DEGEN S., KRUPSKI A., BECKER C., DOLLE P., DE SANTIS M., WANDELT K.,
    Surf. Sci. 600, 2614 (2006)
  15. (110) [23.13] High-Curie-temperature ferromagnetism in self-organized Ge1-xMn nanocolumns
    JAMET, M; BARSKI, A; DEVILLERS, T; POYDENOT, V; DUJARDIN, R; BAYLE-GUILLEMAUD, P; ROTHMAN, J; BELLET-
    AMALRIC, E; MARTY, A; CIBERT, J; MATTANA, R; TATARENKO, S
    Nature Materials, Vol. 5, P. 653-659 ( 2006)
  16. (11) [2.20] X-ray scattering study of hydrogen implantation in silicon
    SOUSBIE N, CAPELLO L, EYMERY J, ET AL.
    J. Appl. Phys. 99 (2006) 103509
  17. (1) [1.23] Surface plasma treatments enabling low temperature direct bonding
    MORICEAU H, RIEUTORD F, MORALES C, ET AL..
    Microsyst. Techn: Micro and Nanosyst. Inform. Stor. Proc. Syst. 12 (2006) 378382
  18. (1) [3.64] Long range molecular organization of an organic monolayer grafted on a mineral substrate
    STRUTH B, TERECH P, RIEUTORD F
    Chem. Phys. Chem. 7 (2006) 756-761
  19. (3) [1.94] Extension of the resonant scattering technique to liquid crystals without resonant element
    FERNANDES P, BAROIS P, GRELET E, ET AL.
    Eur. Phys. J. E 20 (2006) 81-87
  20. (143) [12.93] Nanowirebased onedimensional electronics
    THELANDER C, AGARWAL P, BRONGERSMA S, ET AL.
    Materials Today 9 (2006) 28-35
  21. (1) [1.58] X-ray scattering: A powerful probe of lattice strain in materials with small dimensions
    THOMAS O, LOUBENS A, GERGAUD P, ET AL.
    Appl. Surf. Sci. 253 (2006) 182-187
  22. (1) [0.16] Residual stress analysis in micro and nanostructured materials by Xray diffraction
    GERGAUD P, GOUDEAU P, SICARDY O, ET AL.
    Int. J. Mat. Prod. Tech. 26 (2006) 354- 371
  23. Stresses in copper damascene lines: insitu measurements and finite element analysis
    GERGAUD P, BALDACCI A, RIVERO C, SICARDY O, BOIVIN P, MICHA JS, THOMAS O
    AIP CONFERENCE PROCEEDINGS.
    (2006) (816): 205-210
  24. Evolution of Lattice Strain in Hydrogenimplanted Silicon Prior to layer Splitting: An Xray
    Scattering study

    L. CAPELLO, F. RIEUTORD, A. TAUZIN, F. MAZEN, N. SOUSBIE, F. LETERTRE
    ECS Transactions, vol. 6, 119-127 (2006)
  25. (5) [1.73] Ge quantum dots growth on nanopatterned Si(001) surface: Morphology and stress relaxation study
    PASCALE A, GENTILE P, EYMERY J, MEZIERE J, BAVARD A, SCHULLI T U, FOURNEL F
    Surf. Sci. (2006) 600 (16): 3187-93
  26. Rough Surface Adhesion Mechanisms for Wafer Bonding
    F. RIEUTORD, L. CAPELLO, R. BENEYTON, C. MORALES, A.M. CHARVET, H. MORICEAU
    Semiconductor Wafer Bonding 9: Science, Technology, And Applications
    ECS Transactions, vol. 3, ECS Transactions, 2006, 205-215
  27. Effect of prebonding surface treatment on SiSi Direct Bonding: Bonding void decrease
    R. BENEYTON, F. FOURNEL, F. RIEUTORD, C. MORALES, H. MORICEAU
    ECS Transactions, vol. 6, pp. 239-248, 2006

2007

  1. (20) [10.37] Grazing incidence X-ray measurements of epitaxial InAs/InP nanowires.
    J. EYMERY, F. RIEUTORD, V. FAVRE-NICOLIN, O. ROBACH, L. FRÖBERG, T. MÅRTENSSON, and L. SAMUELSON
    Nano Letters 7 (2007) 2596–2601
  2. (10) [3.32] Self-similarity during growth of the Au/TiO2(110) model catalyst as seen by the scattering of x-rays at grazing-
    angle incidence

    R. LAZZARI, G. RENAUD, J. JUPILLE, AND F. LEROY
    Phys. Rev. B 76 (2007) 125412
  3. (9) [3.32] Grazing-incidence small-angle x-ray scattering from dense packing of islands on surfaces: Development of
    distorted wave Born approximation and correlation between particle sizes and spacing

    R. LAZZARI, F. LEROY, AND G. RENAUD
    Phys. Rev. B 76 (2007) 125411
  4. (10) [3.32] Size and temperature dependent epitaxy for a strong film substrate mismatch : the case of Pt/MgO(001)
    J. OLANDER, R. LAZZARI, J. JUPILLE, B. MANGILI, J. GONIAKOWSKI, G. RENAUD
    Phys. Rev. B 76 (2007) 075409
  5. (1) [3.32] Structure and magnetic properties of Mn/Pt(110)-(1x2): a joint x-ray diffraction and theoretical study
    M. DE SANTIS, Y. GAUTHIER, H. C. N. TOLENTINO, G. BIHLMAYER, S. BLÜGEL, V. LANGLAIS,
    Phys. Rev. B 75, 205432 (2007)
  6. (1) [3.32] Role of hydrogen interaction in two-dimensional molecular packing with strong molecule-substrate bonding
    V. LANGLAIS, X. TORRELLES, Y. GAUTHIER, M. DE SANTIS,
    Phys. Rev. B 76, 035433 (2007)
  7. (7) [1.73] X-ray scattering from stepped and kinked surfaces: An approach with the paracrystal model
    LEROY F, LAZZARI R, RENAUD G
    Surf. Sci. 601 (2007) 1915-1929
  8. (4) [1.73] Nanostructuration of a CoO film by misfit dislocations
    P. TORELLI, E. A. SOARES, G. RENAUD, S. VALERI, X. X. GUO AND P. LUCHES
    Surf. Sci. 601 (2007) 2651-2655
  9. (6) [1.73] Structural and morphological evolution of Co on faceted Pt/W(111) surface upon thermal annealing
    C. REVENANT, F. LEROY, G. RENAUD, R. LAZZARI, A. LETOUBLON, T. MADEY
    Surf. Sci. 601 (2007) 3431
  10. [1.73] Chlorine chemisorption on Cu(001) by surface X-ray diffraction: Geometry and substrate relaxation
    H. C. N. TOLENTINO, M. DE SANTIS, Y. GAUTHIER, V. LANGLAIS,
    Surf. Science 601 (2007) 2962-2966
  11. [1.73] Surface structure and composition of the missing-row reconstruction of VC0.8(110): A LEED, GIXRD and
    photoemission study

    Y. GAUTHIER, I. ZASADA, M. DE SANTIS, V. LANGLAIS, C. VIROJANADARA,
    Surf. Science 601 (2007) 3383-3394
  12. Structure of the 3C-SiC(100)-5x2 Surface Reconstruction Investigated by Synchrotron Radiation Based Grazing Incidence
    X-ray Diffraction

    M. SILLY, H. ENRIQUEZ, J. ROY, M. D’ANGELO, P. SOUKIASSIAN, T. SCHÜLLI, M. NOBLET AND G. RENAUD
    Mater. Sci. Forum 556-557, 533 (2007)
  13. [4.10] Unexpected stability of phospholipid langmuir monolayers deposited on triton X-100 aqueous solutions
    P. FONTAINE, M.C. FAURE, F. MULLER, M. POUJADE, J.S. MICHA, F. RIEUTORD, M. GOLDMANN
    Langmuir 23(26), 12959 (2007)
  14. (11) [3.73] Strain field in silicon on insulator lines using high resolution x-ray diffraction
    GAILHANOU M, LOUBENS A, MICHA JS, CHARLET B., MINKEVICH AA, FORTUNIER R., THOMAS O.
    Appl. Phys. Lett. 90 (2007) 111914
  15. (8) [3.32] Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm
    MINKEVICH AA, GAILHANOU M, MICHA JS, CHARLET B., CHAMARD V., THOMAS O.
    Phys. Rev. B 76 (2007) 104106
  16. (1) [2.20] Quantitative study of hydrogen-implantation-induced cavities in silicon by grazing incidence small angle x-ray
    scattering

    L. CAPELLO, F. RIEUTORD, A. TAUZIN, F. MAZEN
    J. Appl. Phys. 102 (2007) 026106
  17. (4) [1.74] New reactor dedicated to in operando studies of model catalysts by means of surface x-ray diffraction and grazing
    incidence small angle x-ray scattering

    M.-C. SAINT-LAGER, A. BAILLY, P. DOLLE, R. BAUDOING-SAVOIS, P. TAUNIER, S. GARAUDÉE, S. CUCCARO, S.
    DOUILLET, O. GEAYMOND, G. PERROUX, O. TISSOT, J.-S. MICHA, O. ULRICH, and F. RIEUTORD
    Rev. Sci. Instrum. 78 (2007) 083902
  18. (1) [1.45] Water penetration mechanisms in nuclear glasses by X-ray and neutron reflectometry
    REBISCOUL D, RIEUTORD F, NE F, FRUGIER P,CUBITT R, GIN S
    J. Non Cryst. Solids 353 (2007) 2221-2230
  19. (5) [1.21] Investigation by High Resolution X-ray Diffraction of the local strains induced in Si by periodic arrays of oxide filled trenches
    EBERLEIN M, ESCOUBAS S, GAILHANOU M, THOMAS O., MICHA JS, ROHR P., COPPARD R.
    Phys. Stat. Sol. A 204 (2007) 2542-2547

2008

  1. (22) [28,1] Shape Changes of Supported Rh Nanoparticles During Oxidation and Reduction Cycles
    P. NOLTE, A. STIERLE, N. Y. JIN-PHILLIPP, N. KASPER, T. U. SCHULLI, H. DOSCH,
    Science 321, 1654 (2008)
  2. (6) [7,18] Depth Magnetization Profile of a Perpendicular Exchange Coupled System by Soft X-ray Resonant Magnetic
    Reflectivity

    J. M. TONNERRE, M. DE SANTIS, S. GRENIER, H.C.N. TOLENTINO, V. LANGLAIS, E. BONTEMPI, M. GARCIA-
    FERNANDEZ, AND U. STAUB
    Phys. Rev. Lett. 100, 157202 (2008)
  3. (4) [7,18] Controlling structure and morphology of CoPt nanoparticles through dynamical or static coalescence effects
    J. PENUELAS, P. ANDREAZZA, C. ANDREAZZA-VIGNOLLE, H.C.N. TOLENTINO, M. DE SANTIS, AND C. MOTTET
    Phys. Rev. Lett. 100, 115502 (2008)
  4. [3.32] Structure and morphology of thin MgO films on Mo(001)
    S. BENEDETTI, P. TORELLI, S. VALERI, H.M. BENIA, N. NILIUS, G. RENAUD
    Phys. Rev. B 78, 195411 (2008)
  5. (5) [3.32] Kink ordering and organized growth of Co clusters on a stepped Au(111) surface: A combined GISAXS, GIXD and
    STM study

    F. LEROY, G. RENAUD, A. LÉTOUBLON, A. ROHART, Y. GIRARD, V. REPAIN, S. ROUSSET, A. COATTI, Y. GARREAU
    Phys. Rev. B 77, 045430 (2008)
  6. (4)[3.32] Growth of Co on Au(111) studied by multiwavelength anomalous grazing-incidence small-angle x-ray scattering:
    From ordered nanostructures to percolated thin films and nanopillars

    F. LEROY, G. RENAUD, A. LETOUBLON, R. LAZZARI,
    Phys. Rev. B 77, 235429 (2008)
  7. (6) [3.32] Self-organized growth of Ni clusters on a cobalt-oxide thin film induced by a buried misfit dislocation network
    P. TORELLI, E.A. SOARES, G. RENAUD, L. GRAGNANIELLO, S. VALERI, X. GUO AND P. LUCHES,
    Phys. Rev. B 77, 081409(R) (2008)
  8. (1) [1.73] Coalescence of domes and superdomes at a low growth rate or during annealing: Towards the formation of flat-
    top superdomes

    M.-I. RICHARD, G. CHEN, T.U. SCHÜLLI, G. RENAUD, G. BAUER,
    Surf Sci. 602, 2157 (2008)
  9. (2) [1.73] Structural investigation of silicon nanowires using GIXD and GISAXS: Evidence of complex saw-tooth faceting
    T. DAVID, D. BUTTARD, T. SCHÜLLI, F. DALLHUIN, P. GENTILE
    Surf. Sci 602, 2675 (2008)
  10. (1) [1.58] Real time investigation of the growth ofsilicon carbide nanocrystals on Si(100) using synchrotron X-ray diffraction
    S. MILITA, M. DE SANTIS, D. JONES, A. PARISINI, V. PALERMO,
    Applied Surface Science 254 (7), 2162 (2008)
  11. [3.73] Germanium oxynitride (GeOxNy) as a back interface passivation layer for Germanium-on-insulator substrates
    T. SIGNAMARCHEIX, F. ALLIBERT, F. LETERTRE, T. CHEVOLLEAU, L. SANCHEZ, E. AUGENDRE, C. DEGUET, H.
    MORICEAU, L. CLAVELIER, F. RIEUTORD
    Appl. Phys. Lett. 93 (2), 022109 (2008)
  12. (11) [3.73] Spontaneous compliance of the InP/SrTiO3 heterointerface
    G. SAINT-GIRONS, C. PRIESTER, P. REGRENY, G. PATRIARCHE, L. LARGEAU, V. FAVRE-NICOLIN, G. XU, Y.
    ROBACH, M. GENDRY, G. HOLLINGER
    Appl. Phys. Lett. 92, 241907 (2008)
  13. (3) [1.90] Effects of thermal annealing on C/FePt granular multilayers: in situ and ex situ studies
    D. BABONNEAU, G. ABADIAS, J. TOUDERT, T. GIRARDEAU, E. FONDA, J.-S. MICHA and F. PETROFF,
    J. Phys : Cond. Mat. 20, 035218 (2008)
  14. [2.00] Looking by grazing incidence small angle x-ray scattering at gold nanoparticles supported on rutile TiO2(110) during
    CO oxidation

    M.C. SAINT-LAGER, A. BAILLY, M. MANTILLA, S. GARAUDEE, R. LAZZARI, P. DOLLE, O. ROBACH, J. JUPILLE, I.
    LAOUFI, P. TAUNIER
    Gold Bulletin 41, 159 (2008)
  15. (3) [2.20] Hydrophilic low temperature direct wafer bonding
    C. VENTOSA, F. RIEUTORD, L. LIBRALESSO, C. MORALES, F. FOURNEL, H. MORICEAU,
    J. Appl. Phys. 104 123524 (2008)
  16. The phase problem in x-ray reflectivity
    F. Rieutord
    in X-ray and neutron reflectivity edited by A. Gibaud and J. Daillant (Springer, Berlin, 2008)

2009

  1. [18.0] (47) Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray
    Scattering

    G. Renaud, R. Lazzari and F. Leroy
    Surf. Sci. Rep. 64 255-380 (2009)
  2. [7.2] (35) Enhanced Relaxation and Intermixing in Ge Islands Grown on Pit-Patterned Si(001)
    Substrates

    T. U. Schülli, G. Vastola, M.-I. Richard, A. Malachias, G. Renaud, F. Uhlik, F. Montalenti, G. Chen,
    L.Miglio, F. Schäffler, G. Bauer
    Phys. Rev. Lett. 102, 025502 (2009)
  3. [3.9] (4) Multiple scattering effects in strain and composition analysis of nanoislands by grazing
    incidence x-rays

    M.-I. Richard, V. Favre-Nicolin, G. Renaud, T. Schülli, C. Priester, Z. Zhong and T.-H. Metzger
    Appl. Phys. Lett. 94, 013112 (2009)
  4. [3.9] (3) X-ray measurements of the strain and shape of dielectric/metallic wrap-gated InAs
    nanowires

    J. Eymery, V. Favre-Nicolin, L. Froberg and L. Samuelson
    Appl. Phys. Lett. 94 131911 (2009)
  5. [3.9] (3) A model of interface defect formation in silicon wafer bonding
    S. Vincent, I. Radu, D. Landru, F. Letertre, F. Rieutord
    Appl. Phys. Lett. 94 (10) 101914 (2009)
  6. [3.8] (20) Nucleation mechanism of GaN nanowires grown on (111) Si my molecular beam epitaxy
    O. Landré, C. Bougerol, H. Renevier and B. Daudin
    Nanotechnology 20 415602 (2009)
  7. [3.4] (9) In situ x-ray scattering study on the evolution of Ge island morphology and relaxation for
    low growth rate: advanced transition to superdomes

    M.-I. Richard, T. U. Schülli, G. Renaud, E. Wintersberger, G. Chen, G. Bauer and V. Holy
    Phys. Rev. B 80, 045313 (2009)
  8. [3.4] (3) Defect-pinned nucleation, growth and dynamic coalescence of Ag islands on MgO(001): An
    in situ grazing-incidence small-angle x-ray scattering study

    C. REVENANT, G. RENAUD, R. LAZZARI AND J. JUPILLE,
    Phys. Rev. B 79, 235424 (2009)
  9. [3.4] (11) Adhesion of growing nanoparticles at a glance: Surface differential reflectivity
    spectroscopy and grazing incidence small angle x-ray scattering

    R. LAZZARI, G. RENAUD, C. REVENANT, J. JUPILLE AND Y. BORENSZTEIN,
    Phys. Rev. B 79, 125428 (2009)
  10. [2.7] (2) Prebonding Thermal Treatment in Direct Si-Si Hydrophilic Wafer Bonding
    C. Ventosa, F. Rieutord, L. Libralesso, F. Fournel, C. Morales, H. Moriceau
    J. Electrochem. Soc. 156 (11) H818 (2009)
  11. [2.2] (4) Hydrated cholesterol: Phospholipid domains probed by synchrotron radiation
    Solomonov I, Daillant J, Fragneto G, Kjaer K, Micha J.S., Rieutord F, Leiserowitz L
    Euro. Phys. J. E 30 215 (2009
  12. [2.2] (8) Elastic relaxation in patterned and implanted strained silicon on insulator
    S. Baudot, F. Andrieu, F. Rieutord, J. Eymery
    J. Appl. Phys. 105 (11) 114302 (2009)
  13. [2.2] (1) Mechanism of Thermal Silicon Oxide Direct Wafer Bonding
    C. Ventosa, C. Morales, L. Libralesso, F. Fournel, A.M. Papon, D. Lafond, H. Moriceau, J.D. Penot,
    F. Rieutord
    Electrochem. Solid State Lett. 12 (10) H373 (2009)
  14. [0.9] (3) Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and
    multiwavelength anomalous diffraction

    M.-I. RICHARD, N.A. KATCH, M.G. PROIETTI, H. RENEVIER, V. FAVRE-NICOLIN, Z.
    ZHONG, G. CHEN, M. STOFFEL, O. Schmidt, G. Renaud, T.U. Schülli and G. Bauer
    Eur. Phys. J. Special Topics 167, 3 (2009)
  15. [0.9] (4) Real-time icosahedral to fcc structure transition during CoPt nanoparticles formation
    Penuelas J, Andreaaza P, Andreazza-Vignolle C, Mottet C, De Santis M and Tolentino HCN
    Eur. Phys. J. Special Topics 167 p19-25, (2009)
  16. [0.5] Structure, morphology and magnetism of an ultra-thin [NiO/CoO]/PtCo bilayer with
    perpendicular exchange bias

    H. C. N. Tolentino, M. De Santis, J.-M. Tonnerre, A. Y. Ramos, V. Langlais, S. Grenier, A. Bailly
    Brazilian Journal of Physics 39 p150 (2009)
  17. Towards synchrotron-based nanocharacterization
    P. Bleuet, L. Arnaud, X. Biquard, P. Cloetens, L. Doyen, P. Gergaud, P. Lamontagne, M. Lavayssière,
    J.-S. Micha, O. Renault, F. Rieutord, J. Susini, O. Ulrich
    AIP Conf. Proc. 1173 181 (2009)

2010

  1. [36.2] (12) Substrate-enhanced supercooling in AuSi eutectic droplets
    T.U. Schülli, R. Daudin, G. Renaud, A. Vaysset, O. Geaymond and A. Pasturel,
    Nature 464, 1174 (2010)
  2. [5.0] (1) Nanoscale Patterning by C60 Ordering on Pt(110)
    Torrelles X, Langlais V, De Santis M, Tolentino HCN et al.
    J. Phys. Chem. C 114 p 15645 (2010)
  3. [4.0] (1) Growth, structure and magnetic properties of FePt nanostructures on NaCl(001) and
    MgO(001)

    Liscio F., Makarov D., Maret M., Doisneau-au-cottignies B., Roussel H., Albrecht M.
    Nanotechnology 21 (6) 065602 (2010)
  4. [3.4] (1) Strain and correlation of self-organized Ge(1-x)Mn(x) nanocolumns embedded in Ge (001)
    Tardif S., Favre-Nicolin V., Lancon F., et al.
    Phys. Rev. B 82 (10) 104101 (2010)
  5. [3.4] (2) Elastic strain relaxation in GaN/AlN nanowire superlattice
    O. Landré, D. Camacho, C. Bougerol, Y.M. Niquet, V. Favre-Nicolin, G. Renaud, H. Renevier and B.
    Daudin
    Phys. Rev. B 81 153306 (2010)
  6. [3.4] (1) Probing nanoscale structural and order/disorder phase transitions of supported Co-Pt
    clusters under annealing

    P. Andreazza, C. Mottet, C. Andreazza-Vignolle, J. Penuelas, H. C. N. Tolentino, M. De Santis, R.
    Felici and N. Bouet
    Phys. Rev. B 82 (15) 155453 (2010)
  7. [3.4] (6) Highly ordered growth of Fe and Co clusters on alumina on Ni3Al(111)
    A. Buchsbaum, M. De Santis, H.C.N. Tolentino, M. Schmid and P. Varga
    Phys. Rev. B 81 (11) 115420 (2010)
  8. [3.4] (6) Nanostructuring surfaces: Deconstruction of the Pt(110)-(1 X 2) surface by C-60
    X. Torrelles, V. Langlais, M. De Santis, H.C.N. Tolentino and Y. Gauthier
    Phys. Rev. B 81 041404(R) (2010)
  9. [2.1] (2) Confinement induced phase transition in a DNA-lipid hydrated complex
    E. Andreoli de Oliveira , E. R. Teixeira da Silva, A. Fevrier, E. Grelet, F. Nallet and L. Navailles
    Europhysics Letters 91 (2) 28001 (2010)
  10. [2.0] (4) Supported bilayers: Combined specular and diffuse X-ray scattering
    Malaquin L, Charitat T and Daillant J
    Euro. Phys. J. E 31 p 285 (2010)
  11. [2.2] (1) Study of the formation, evolution and dissolution of interfacial defects in silicon wafer
    bonding

    S. Vincent, J. D. Penot, I. Radu, F. Letertre, and F. Rieutord,
    J. Appl. Phys. 107 093513 (2010)
  12. [2.1] (1) Influence of the U3O7 domain structure on cracking during the oxidation of UO2
    Desgranges, L, Palancher, H, Gamaleri, M, Micha JS., Optasanu V, Raceanu L, Montesin T, Creton N.
    J. Nucl. Mat. 402 p 167 (2010)
  13. [1.5] X-ray microbeam strain investigation on Cu-MEMS structures
    Perroud O, Vayrette R, Rivero C, Thomas O, Micha J.-S., Ulrich O
    Microelectronic Engineering 87 p 394 (2010)
  14. [1.5] Physics of Cu/Cu direct bonding: Applications to 3D heterogeneous or monolithic integration
    P. Gueguen, C. Ventosa, L. Di Cioccio, H. Moriceau, F. Grossi, M. Rivoire, P. Leduc and L. Clavelier
    Microelectronic Engineering 87 p 477-484 (2010
  15. [1.2] A ferromagnetic semiconductor for spin injection in silicon
    Jamet, T. Devillers, I-S. Yu, A. Barski, P. Bayle-Guillemaud, J. Rothman, V. Favre-Nicolin, S. Tardif,
    S. Cherifi, J. Cibert, L. Grenet, P. Noé and V. Calvo (Ge,Mn)
    Int. J. Nanotechnol., Vol. 7 (2010), 575
  16. [1.1] (4) Determination of global and local residual stresses in SOFC by X-ray diffraction
    Villanova J, Sicardy O, Fortunier R, Micha J.S., Bleuet P
    Nucl. Inst. Meth. Phys. B 268 p 282 (2010)
  17. Stress field in deformed polycrystals at the micron scale
    Castelnau, O, Bornert, M., Robach, O., Micha, J. -S.,Ulrich, O., Chiron, R.,Le Bourlot, C.
    ICEM 14: 14th International Conference on experimental mechanics
    Book Series: EPJ Web of Conferences 6 35005 (2010)
  18. Defect formation at hydrophilic silicon bonding interfaces
    F. Rieutord, S. Vincent, J. D. Penot, H. Moriceau, and I. Radu,
    ECS Transactions, 33 p 451(2010)
  19. Efficiency of H2O diffusion barriers at Si-Si direct bonding interfaces
    H. Moriceau, F. Rieutord, L. Libralesso, C. Ventosa, F. Fournel, C. Morales, T. Mc Cormick, T.
    Chevolleau, and I. Radu
    ECS Transactions 33 p467 (2010)
  20. Single Crystal Silicon Film Transfer onto polymer
    M. Argoud, H. Moriceau, C. Fretigny, F. Rieutord, C. Morales, and L. Clavelier
    ECS Transactions 33 p217 (2010)
  21. Overview on recent direct wafer bonding advances and applications
    H. Moriceau, F. Rieutord, F. Fournel, Y. Le Tiec, and L. Di Cioccio
    in The 5th International Workshop on Advanced Materials Science and Nanotechnology
    (IWAMSN2010) Hanoi (2010)
  22. Stress field in deformed polycrystals at the micron scale
    Castelnau, O ; Bornert, M ; Robach, O ; Micha, JS ; Ulrich, O ; Chiron, R ; Le Bourlot, C
    ICEM 14: 14TH INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS, VOL
    6 Book Series: EPJ Web of Conferences Volume: 6 Article Number: 35005
  23. Chapter 10: Nanostructures in the light of synchrotron radiation: Surface sensitive x-ray techniques and anomalous scattering
    T. METZGER, V. FAVRE-NICOLIN, G. RENAUD, H. RENEVIER, T. SCHÜLLI
    in : « Characterization of Semiconductor Heterostructures and Nanostructures »
    Edited by C. Lamberti, Elsevier 2008, p 361-403

2011

  1. [14.1] (25) M-plane core-shell InGaN/GaN multiple-quantum-well on GaN wires for electroluminescent device
    R. Koester, J. S. Hwang, D. Salomon, X. Chen, C. Bougerol, J.-P. Barnes, D. Le Si Dang, L. Rigutti, M. Tchernycheva, C. Durand and J. Eymery
    Nano Letters 11, p 4839-4845 (2011)
  2. [4.5] (7) Full local elastic strain tensor from Laue microdiffraction: simultaneous Laue pattern and spot energy measurement
    O. Robach, J.-S. Micha, O. Ulrich and P. Gergaud
    J. Appl. Cryst.. 44 p 688–696 (2011)
  3. [5.2] (27) Size and Catalytic Activity of Supported Gold Nanoparticles: An in operando Study during CO Oxidation
    I. Laoufi, M.-C. Saint-Lager, R. Lazzari, J. Jupille, O. Robach, S. Garaudee, G. Cabailh, P. Dolle, H. Cruguel, A. Bailly
    J. Phys. Chem. C 115 (11) pp 4673-4679 (2011)
  4. [5.2] (11) Competition between polar and nonpolar growth of MgO films on Au(111)
    S. Benedetti , N. Nilius, P. Myrach, P. Torelli, G. Renaud, H.-J. Freund, S. Valeri
    J. Phys. Chem. C 115, 23043 (2011)
  5. [5.0] (3) In situ grazing-incidence X-ray diffraction during electrodeposition of birnessite thin films: Identification of solid precursors
    M. Ndjeri, S. Peulon, M.L. Schlegel, A. Chaussé
    Electrochem. Commun. 13, (5) p 491-494 (2011)
  6. [4.4] (3) In situ synchrotron analysis of lattice rotations in individual grains during stress-induced martensitic transformations in a polycrystalline CuAlBe shape memory alloy
    Berveiller S., Malard B., Wright J., et al.
    Acta Mater. 59 (9) p 3636-3645 (2011)
  7. [4.4] (4) Impact of instrumental constraints and imperfections on the dislocation structure in micron-sized Cu compression pillars
    Kirchlechner C., Keckes J., Motz C., Grosinger W., Kapp M.W., Micha J.S., Ulrich O. and Dehm G.
    Acta Mater. 59 (14) p 5618-5626 (2011)
  8. [4.1] (6) Catalytic properties of supported gold nanoparticles: new insights into the size-activity relationship gained from in operando measurements
    M.-C. Saint-Lager, I. Laoufi, A. Bailly, O. Robach, S. Garaudée and P. Dolle
    Faraday Discuss., 152, p253–265 (2011)
  9. [3.8] (3) Effect of doping on global and local order in crystalline GeTe
    Biquard X., Krbal M., Kolobov A. V. et al
    Appl. Phys. Lett. 98 (23) 231907 (2011)
  10. [3.8] (1) In situ x-ray study of the formation of defects in Ge islands on Si(001)
    M.-I. Richard, T. U. Schülli, and G. Renaud
    Appl. Phys. Lett. 99 161905 (2011)
  11. [3.8] (7) Catalyst-free growth of high-optical quality GaN nanowires by metal-organic vapor phase epitaxy
    X.J. Chen, B. Gayral, D. Sam-Giao, C. Bougerol, C. Durand and J. Eymery
    Appl. Phys. Lett. 99 (25) 251910 (2011)
  12. [4.0] Metal positioning using dislocation arrays.
    A. Bavard, F. Fournel and J. Eymery
    Nanotechnology 22, 215301(2011)
  13. [3.6] (2) Twins and their boundaries during homoepitaxy on Ir(111)
    S. Bleikamp, J. Coraux, O. Robach, G. Renaud and T. Michely,
    Phys. Rev. B 83 064103 (2011)
  14. [3.6] (4) Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis
    M.I. Richard, A. Malachias, J.-L. Rouvière, T.-S. Yoon, E. Holmström, Y.-H. Xie, V. Favre-Nicolin, V. Holy, K. Nordlund, G. Renaud, T.-H. Metzger
    Phys. Rev. B 84, 075314 (2011)
  15. [3.6] (4) Atomic structure and composition of the 2 × N reconstruction of the Ge wetting layer on Si(001) investigated by surface x-ray diffraction
    T. Zhou, G. Renaud, J. Issartel, C. Revenant, T.U. Schülli, R. Felici and A. Malachias,
    Phys. Rev. B 83, 195426 (2011)
  16. [2.6] H2O diffusion barriers at Si-Si Direct bonding interfaces for low temperature anneals
    H. Moriceau, F. Rieutord, L. Libralesso, C. Ventosa, F. Fournel, C. Morales, T. Mc Cormick, T. Chevolleau and I. Radu
    J. Electrochem. Soc. 158 (9) H919 (2011)
  17. [2.6] (1) An overview of patterned metal/dielectric surface bonding: mechanism, alignment and characterization
    L. Di Cioccio, P. Gueguen, R. Taibi, D. Landru, G. Gaudin, C. Chappaz, F. Rieutord, F. de Crecy, I. Radu, L.-L. Chapelon, and L. Clavelier
    J. Electrochemical Soc. 158 (6) P81-86 (2011)
  18. [2.2] (1) Highly anisotropic epitaxial (L1)0 FePt on Pt(001)
    Soares M.M., Tolentino H.C.N., De Santis M., Ramos A.Y., Cezar J.C.
    J. Appl. Phys. 109 p.07D725-1-07D725-3 (2011)
  19. [2.2] (4) Structure and magnetism of Ge3Mn5 clusters
    A. Jain, M. Jamet, A. Barski, T. Devillers, I.-S. Yu, C. Porret, P. Bayle-Guillemaud, V. Favre-Nicolin, S. Gambarelli, V. Maurel, G. Desfonds, J. F. Jacquot, and S. Tardif
    J. Appl. Phys. 109, 013911 (2011)
  20. [1.8] (5) In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples
    C. Kirchlechner, J. Keckes, J.-S.Micha and G. Dehm
    Advanced Engineering Materials 13 (8) p 837-844 (2011)
  21. [1.7] (11) A new white beam x-ray microdiffraction setup on the BM32 beamline at the European Synchrotron Radiation Facility
    O. Ulrich, X. Biquard, P. Bleuet, O. Geaymond, P. Gergaud, J. S. Micha, O. Robach, and F. Rieutord
    Rev. Sci. Instrum. 82, 033908 (2011)
  22. [1.5] (15) Dislocation storage in single slip-oriented Cu micro-tensile samples: New insights via X-ray microdiffraction
    C. Kirchlechner, D. Kiener, C. Motz, S. Labat, N. Vaxelaire, O. Perroud, J. -S. Micha, O. Ulrich, O. Thomas, G. Dehm, and J. Keckes
    Phil. Mag. 91 (7-9) Special Issue p 1256-1264 (2011)
  23. [1.3] Water management on semiconductor surfaces
    Y. Le Tiec, C. Ventosa, N. Rochat, F. Fournel, H. Moriceau, L. Clavelier, F. Rieutord, J. Butterbaugh, and I. Radu
    Microelectronic Engineering 88, p3432-3436 (2011)
  24. [1.2] Combined In Situ Grazing Incidence Small Angle X-Ray Scattering and Grazing Incidence X-Ray Diffraction Study of the Growth of Ge Islands on Pit-Patterned Si(001) Substrates
    M.-I. Richard, T. Schülli, G. Renaud, Z.-Z. Zhong and G. Bauer
    J. Nanoscience & Nanotechnology 11, 9123 (2011)
  25. [1.1] (4) Analysis of strain error sources in micro-beam Laue diffraction
    F. Hofmann, S. Eve, J. Belnoue, J.-S. Micha, and A.M. Korsunsky
    Nucl. Instrum. Meth. A 660 (1) p 130-137 (2011)
  26. (1) X-Ray diffraction determination of macro and micro stresses in SOFC electrolyte and evolution with redox cycling of the anode
    Villanova J., Sicardy O., Fortunier R., Micha J.S., Bleuet P.
    Materials Science Forum, vol. 681, p.25-30 (2011)
  27. X-ray Diffraction analysis of elastic strains at the nanoscale
    O. Thomas, O. Robach, S. Escoubas, JS. Micha, N. Vaxelaire, O. Perroud
    Chapter in “Mechanical stress on the nanoscale : simulation, material systems and
    characterization techniques”
    Ed. : M. Hanbücken, P. Müller, U. Gösele, R. B. Wehrspohn, Wiley-VCH Books, 2011

2012

  1. [10.6] (1) Controlling Interactions in supported bilayers from weak electrostatic repulsion to high osmotic pressure
    A. Hemmerle, L. Malaquin , T. Charitat,, S. Lecuyer, G. Fragneto and J. Daillant
    Proc. Nat. Acad. Sciences USA 109 (49) 19938-19942 (2012)
  2. [6.2] (3) From metastable to stable modifications—in situ Laue diffraction investigation of diffusion processes during the phase transitions of (GeTe)nSb2Te3 (6 <= n <= 15) crystals
    M. N. Schneider, X. Biquard, C. Stiewe, T. Schröder, P. Urban and O. Oeckler
    Chemical Communications 48 (16) 2192-2194 (2012)
  3. [5.2] (3) CO-Induced Scavenging of Supported Pt Nanoclusters: A GISAXS Study
    N. Chaabane, R. Lazzari, J. Jupille, G. Renaud, and E. A. Soares
    J. Phys. Chem. C, 116 (44), 23361-23370 (2012)
  4. [4.5] (1) Strains in light ion implanted polycrystals: influence of grain orientation
    A. Richard, H. Palancher, E. Castelier, J. S. Micha, M. Gamaleri, G. Carlot, H. Rouquette, P.
    Goudeau, G. Martin, F. Rieutord, J. P. Piron and P. Garcia
    J. Appl. Cryst. 45 (4) 826-833 (2012)
  5. [4.5] (1) Multi scale measurements of residual strains in stabilized zirconia layer
    J. Villanova, C. Maurice, J.-S. Micha, P. Bleuet, O. Sicardy and R. Fortunier
    J. Appl. Cryst. 45 (5) p 926-935. (2012)
  6. [4.4] (3) Expected and unexpected plastic behavior at the micron scale: An in situ Laue tensile study
    C. Kirchlechner , P.J. Imrich, W. Grosinger, M.W. Kapp, J. Keckes, J.S. Micha, O. Ulrich, O.
    Thomas, S. Labat, C. Motz, and G. Dehm
    Acta Mater. 60 (3) 1252-1258 (2012)
  7. [3.8] (5) In situ study of self-assembled GaN nanowires nucleation on Si(111) by plasma-assisted molecular beam epitaxy
    K. Hestroffer, C. Leclere, V. Cantelli, C. Bougerol, H. Renevier and B. Daudin
    Appl. Phys. Lett. 100 (21) 212107 (2012)
  8. [3.6] (4) Interface-driven phase separation in multifunctional materials: The case of the ferromagnetic semiconductor GeMn
    E. Arras, F. Lançon, I. Slipukhina, É. Prestat, M. Rovezzi, S. Tardif, A. Titov, P. Bayle-Guillemaud, F. d’Acapito, A. Barski, V. Favre-Nicolin, M. Jamet, J. Cibert, and P. Pochet
    Phys. Rev. B 85, 115204 (2012)
  9. [3.6] (1) Chemically ordered MnPt ultrathin films on Pt(001) substrate: Growth, atomic structure, and magnetic properties
    M. M. Soares, M. De Santis, H. C. N. Tolentino, A. Y. Ramos, M. El Jawad and Y. Gauthier
    Phys. Rev. B 85, 205417 (2012)
  10. [3.6] (1) Epitaxial orientation changes in a dewetting gold film on Si(111)
    R. Daudin, T. Nogaret, T.-U. Schülli, N. Jakse, A. Pasturel and G. Renaud
    Phys. Rev. B 86, 094103 (2012)
  11. [3.6] Dynamics, anisotropy, and stability of silicon-on-insulator dewetting fronts
    F. Leroy, F. Cheynis, T. Passanante, and P. Müller
    Phys. Rev. B 85, 195414 (2012) and erratum 85 239901 (2012)
  12. [3.6] (2) Local deformations and incommensurability of high quality epitaxial graphene on a weakly interacting transition metal
    N. Blanc, J. Coraux, C. Vo-Van, A. T. N’Diaye, O. Geaymond, and G. Renaud
    Phys. Rev. B 86, 235439 (2012)
  13. [2.4] (5) Floating lipid bilayers: Models for physics and biology
    Fragneto G., Charitat T., and Daillant J.
    European Biophysics Journal 41, 863-874 (2012)
  14. [2.2] (1) Measurement of bonding energy in an anhydrous nitrogen atmosphere and its application to silicon direct bonding technology
    F. Fournel, L. Contini, C. Morales, J. Da Fonseca, H. Moriceau, F. Rieutord, A. Barthelemy and I. Radu
    J. Appl. Phys. 111 (10) 104907 (2012)
  15. [2.2] (8) Structural and optical analyses of GaP/Si and (GaAsPN/GaPN)/GaP/Si nanolayers for integrated photonics on silicon
    T. Nguyen Thanh, C. Robert, W. Guo, A. Letoublon, C. Cornet, G. Elias, A. Ponchet, T. Rohel, N. Bertru, A. Balocchi, O. Durand, J.-S. Micha, M. Perrin, S. Loualiche, X. Marie and A. Le Corre
    J. Appl. Phys. 112, 053521 (2012) and Publisher erratum: J. Appl. Phys. 112, 079904 (2012)
  16. [2.2] Low temperature direct bonding mechanisms of tetraethyl orthosilicate based silicon oxide films deposited by plasma enhanced chemical vapor deposition
    C. Sabbione, L. Di Cioccio, L. Vandroux, J.-P. Nieto, and F. Rieutord
    J. Appl. Phys. 112, 063501 (2012)
  17. [1.7] (2) Advances in martensitic transformations in Cu-based shape memory alloys achieved by in situ neutron and synchrotron X-ray diffraction methods
    B. Malard, P. Sittner, S. Berveiller, E. Patoor
    Compt. Rend. Physique 13 (2012) 280–292
  18. [1.5] Investigation of reversible plasticity in a micron-sized, single crystalline copper bending beam by X-ray μLaue diffraction
    C. Kirchlechner, W. Grosinger, M.W. Kapp, P.J. Imrich, J.-S. Micha, O. Ulrich, J. Keckes, G. Dehm and C. Motz
    Philosophical Magazine 92 (25-27), 3231-3242 (2012)
  19. [1.4] (4) Growth and dewetting of gold on Si(1 1 1) investigated in situ by grazing incidence small angle x-ray scattering
    R. Daudin, C. Revenant, G. Davi and G. Renaud
    Physica E 44, 1905 (2012)
  20. [1.2] Low temperature direct bonding: an attractive technique for heterostructures build-up
    H. Moriceau, F. Rieutord, F. Fournel, C. Moulet, L. Libralesso, P. Gueguen, R. Taibi and C. Deguet
    Microelectronics Reliability 52 (2) p 331-341 (2012)
  21. [1.2] Regular arrays of palladium and palladium-gold clusters supported on ultrathin alumina films: stability under oxygen
    G. Sitja, M. Marsault, F. Leroy et al.
    Int. J. Nanotech. 9 (3-7) 567-575 (2012)
  22. [1.1] (3) Si exfoliation by MeV proton implantation
    C. Braley, F. Mazen, A. Tauzin, F. Rieutord, C. Deguet and E. Ntsoenzok
    Nucl. Instr. Methods B 277, 93-97 (2012)
  23. [1.1] (1) Smart CutTM: review on an attractive process for innovative substrate elaboration
    H. Moriceau, F. Mazen, C. Braley, F. Rieutord, A. Tauzin, and C. Deguet,
    Nucl. Instrum. Meth. B 277, p 84-92 (2012)
  24. Strain and dislocation gradients from diffraction : Spatially-resolved local structure and defects Robach, O., Kirchlechner, C., Micha, J.-S., Ulrich, O., Biquard, X., Geaymond, O., Castelnau, O., Bornert, M., Petit, J., Berveiller, S., Sicardy, O., Villanova, J., and Rieutord, F.
    Chapter 5 in "Strain and dislocation gradients from diffraction" (2012) Imperial College Press and World Scientific Publishing.
    R. I. Barabash and G. E. Ice editors

2013

  1. [3.6] Local band bending and grain-to-grain interaction induced strain nonuniformity in polycrystalline CdTe films
    V. Consonni, N. Baier, O. Robach, C. Cayron, F. Donatini and G. Feuillet
    accepted in Phys Rev. B
  2. Energetic Structure of μLaue Peaks from a Plastically-Deformed Cu Cantilever Revealed by a Three-
    Dimensional X-ray Detector
    A. Abboud, C. Kirchlechner, J.-S. Micha, O. Ulrich, S. Send, N. Pashniak, R. Hartmann, L. Struder, J.
    Keckes and U. Pietsch
    submitted to J. Appl. Cryst
  3. [30.6] A tunable multicolour 'rainbow' filter for improved stress and dislocation density field mapping in polycrystals using X-ray Laue microdiffraction
    O. Robach, J.-S. Micha, O. Ulrich, O. Geaymond, O. sicardy, L. Haertwig, F. Rieutord
    Acta Cryst A 69, 164-170 (2013)
  4. [7.4] Point defect-induced strains in epitaxial graphene
    N. Blanc, F. Jean, A. V. Krasheninnikov, G. Renaud, and J. Coraux
    Phys. Rev. Lett., 111, 085501 (2013)
  5. [4.5] Integration techniques for SXRD data obtained with a 2D detector
    J. Drnec, T. Zhou, S. Pintea, W. Onderwaater, E. Vlieg, G. Renaud and R. Felici,
    J. appl. Cryst., In press. (2013)
  6. [4.1] Operando atomic structure and active sites of TiO2(110)-supported gold nanoparticles during carbon monoxide oxidation
    M.C. Saint-Lager, I. Laoufi and A. Bailly
    Faraday Discussions 162, 179-190 (2013)
  7. [3.8] In-situ observation of stress-induced stochastic twin boundary motion in off stoichiometric NiMnGa single crystals
    R.I. Barabash, C. Kirchlechner, O. Robach, Odile; O. Ulrich, J.-S. Micha, A. Sozinov and O.M.Barabash
    Appl. Phys. Lett. 103 (2), 021909 (2013)
  8. [3.8] Interface Accommodation Mechanism for Weakly Interacting Epitaxial Systems
    A. Danescu, B. Gobaut, J. Penuelas, G. Grenet, V. Favre-Nicolin, N. Blanc, T. Zhou, G. Renaud, and G. Saint-Girons
    Appl. Phys. Lett. 103, 021602 (2013)
  9. [3.8] Effect of H-implantation in the local elastic properties of silicon crystals
    S. Reboh, F. Rieutord, L. Vignoud, F. Mazen, D. Landru, M. Zussy, and C. Deguet
    Appl. Phys. Lett. 103, 181911 (2013)
  10. [3.8] Agglomeration dynamics of germanium islands on a silicon oxide substrate: A grazing incidence small-angle x-ray scattering study
    F. Cheynis, F. Leroy, T. Passanante et al.
    Appl. Phys. Lett. 102 (16), 161603 (2013)
  11. [3.6] Robust perpendicular exchange coupling in an ultrathin CoO/PtFe double layer: Strain and spin orientation
    A. D. Lamirand, M. M. Soares, A.Y. Ramos, H.C.N. Tolentino, M. De Santis, J. C. Cezar, A. de
    Siervo and M. Jamet
    Phys. Rev. B 88, 140401 (2013)
  12. [3.6] Different commensurabilities and 10-1300 K thermal expansion of graphene on Ir(111) as a function of preparation
    F. Jean, T. Zhou, N. Blanc, J. Coraux and G. Renaud,
    Phys. Rev. B 88, 165406 (2013
  13. [2.6] Treatments of deposited SiOx surfaces enabling low temperature direct bonding
    C. Rauer, H. Moriceau, F. Fournel, A.-M. Charvet, C. Morales, N. Rochat, L. Vandroux, F. Rieutord, T. Mc Cormick, and I. Radu
    J. Electrochem. Soc., (2013)
  14. [2.5] Metal organic vapour-phase epitaxy growth of GaN wires on Si (111) for light-emitting diode applications
    D. Salomon, A. Dussaigne, M. Lafossas, C. Durand, C. Bougerol, P. and J. Eymery
    Nanoscale Res. Lett. 8, 61-1 (2013)
  15. [2.2] Lattice strain of hydrogen-implanted silicon : correlation between X-ray scattering analysis and ab-initio simulations
    F. Rieutord, F. Mazen, S. Reboh, J. D. Penot, L. Bilteanu, J. P. Crocombette, V. Vales, V. Holy, and L. Capello
    J. Appl. Phys. 113, 153511, (2013)
  16. [2.2] Nanoscale organization by elastic interactions between H and He platelets in Si
    S. Reboh, F. Rieutord, F. Mazen, N. Cherkashin, M. F. Beaufort, J.-F. Barbot, M. Vallet, P. F. P. Fichtner, and J. Grilhé
    J. Appl. Phys. 114, 073517 (2013)
  17. [2.2] Development of microcracks in hydrogen-implanted silicon substrates
    J. D. Penot, D. Massy, F. Rieutord, F. Mazen, S. Reboh, F. Madeira, L. Capello, D. Landru, and O. Kononchuk
    J. Appl. Phys. 114, 123513, (2013)
  18. [2.0] Mechanism of Edge Bonding Void Formation in Hydrophilic Direct Wafer Bonding
    A. Castex, B. M., F. Rieutord, K. Landry, and C. Lagahe-Blanchard
    Electrochem. Sol. State Lett. 2, 47-50, (2013)
  19. [1.6] Quantitative study of microtwins in GaP/Si thin film and GaAsPN quantum wells grown on silicon substrates
    T. Nguyen Thanh, C. Robert, E. Giudicelli, A. Létoublon, C. Cornet, A. Ponchet, T. Rohel, A. Balocchi, J.S. Micha, M. Perrin, S. Loualiche, X. Marie, N. Bertru, O. Durand, A. Le Corre
    J. Crystal Growth 378, 25-28 (2013)
  20. [1.3] Structural investigation of nanoporous alumina film with grazing incidence small angle X-ray scattering
    D. Buttard, T. Schülli and R. Lazzari
    Phys. Stat. Solid. A 210, 2521-2525 (2013)
  21. [1.1] Thermal bump removal of a Crystal Monochromator by designing an optimal shape
    J.-S. Micha, O. Geaymond, F. Rieutord
    4th international workshop on Metrology for X-ray Optics, Mirror Design, and Fabrication
    Barcelona, 4th to 6th July 2012
    Nucl. Instr. Methods A 710, 155-160 (2013)
  22. [0.9] Hydrophobic direct bonding of silicon reconstructed surfaces
    C. Rauer, F. Rieutord, J. M. Hartmann, A.-M. Charvet, F. Fournel, D. Mariolle, C. Morales, and H. Moriceau
    Microsystem Technologies, 19, 675 (2013)
  23. Nanostructures observed by surface sensitive x-ray scattering and highly focused beams
    T. Schulli, V. Favre-Nicolin M.-I. Richard and G. Renaud,
    Chapter in „Characterization of Semiconductor Heterostructures and Nanostructures“, C. Lamberti
    ed.; second edition, 2013, pp 113-173., Elsevier.
  24. Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures
    H. Renevier and M.G. Proietti
    Chapter in: "Characterization of Semiconductor Heterostructures and Nanostructures. 2. Edition",
    Lamberti C. (Eds.)Agostini G. (Eds.) (Elsevier, 2013) pp.311-359
  25. Propriétés structurales de surfaces, interfaces et nanostructures étudiées à l’aide des rayons X
    G. Renaud,
    Reflets de la Physique n°34-35 et Le BUP, Hors Série N°1 , pp 65-69, 2013

2014

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Abboud, A., C. Kirchlechner, S. Send, J. S. Micha, O. Ulrich, N. Pashniak, L. Strueder, J. Keckes, and U. Pietsch. “A New Method for Polychromatic X-Ray Mu Laue Diffraction on a Cu Pillar Using an Energy-Dispersive Pn-Junction Charge-Coupled Device.” Review of Scientific Instruments 85, no. 11 (2014). doi:10.1063/1.4900482.
Cantelli, V., O. Geaymond, O. Ulrich, T. Zhou, N. Blanc, and G. Renaud. “The In Situ Growth of Nanostructures on Surfaces (INS) Endstation of the ESRF BM32 Beamline: A Combined UHV-CVD and MBE Reactor for in Situ X-Ray Scattering Investigations of Growing Nanoparticles and Semiconductor Nanowires.” Journal of Synchrotron Radiation 22 (2015): 688–700. doi:10.1107/s1600577515001605.
Consonni, V., N. Baier, O. Robach, C. Cayron, F. Donatini, and G. Feuillet. “Local Band Bending and Grain-to-Grain Interaction Induced Strain Nonuniformity in Polycrystalline CdTe Films.” Physical Review B 89, no. 3 (2014). doi:10.1103/PhysRevB.89.035310.
Daudin, R., T. Nogaret, A. Vaysset, T. U. Schuelli, A. Pasturel, and G. Renaud. “Formation, Stability, and Atomic Structure of the Si(111)-(6x6)Au Surface Reconstruction: A Quantitative Study Using Synchrotron Radiation.” Physical Review B 91, no. 16 (2015). doi:10.1103/PhysRevB.91.165426.
Drnec, Jakub, Tao Zhou, Stelian Pintea, Willem Onderwaater, Elias Vlieg, Gilles Renaud, and Roberto Felici. “Integration Techniques for Surface X-Ray Diffraction Data Obtained with a Two-Dimensional Detector.” Journal of Applied Crystallography 47 (2014): 365–77. doi:10.1107/s1600576713032342.
Gobaut, B., J. Penuelas, A. Benamrouche, Y. Robach, N. Blanc, V. Favre-Nicolin, G. Renaud, L. Largeau, and G. St-Girons. “Growth of Ge Islands on SrTiO3 (001) 2 X 1 Reconstructed Surface: Epitaxial Relationship and Effect of the Temperature.” Surface Science 624 (2014): 130–34. doi:10.1016/j.susc.2014.02.009.

2015

Guilloy, Kevin, Nicolas Pauc, Alban Gassenq, Pascal Gentile, Samuel Tardif, Francois Rieutord, and Vincent Calvo. “Tensile Strained Germanium Nanowires Measured by Photocurrent Spectroscopy and X-Ray Microdiffraction.” Nano Letters 15, no. 4 (2015): 2429–33. doi:10.1021/nl5048219.
Jean, Fabien, Tao Zhou, Nils Blanc, Roberto Felici, Johann Coraux, and Gilles Renaud. “Effect of Preparation on the Commensurabilities and Thermal Expansion of Graphene on Ir(111) between 10 and 1300 K (vol 88, 165406, 2013).” Physical Review B 90, no. 23 (2014). doi:10.1103/PhysRevB.90.239901.
———. “Topography of the graphene/Ir(111) Moire Studied by Surface X-Ray Diffraction.” Physical Review B 91, no. 24 (2015). doi:10.1103/PhysRevB.91.245424.
Kirchlechner, C., P. J. Imrich, W. Liegl, J. Poernbacher, J. S. Micha, O. Ulrich, and C. Motz. “On the Reversibility of Dislocation Slip during Small Scale Low Cycle Fatigue.” Acta Materialia 94 (2015): 69–77. doi:10.1016/j.actamat.2015.04.029.
Kuswik, P., P. L. Gastelois, M. M. Soares, H. C. N. Tolentino, M. De Santis, A. Y. Ramos, A. D. Lamirand, M. Przybylski, and J. Kirschner. “Effect of CoO/Ni Orthogonal Exchange Coupling on Perpendicular Anisotropy of Ni Films on Pd(001).” Physical Review B 91, no. 13 (2015). doi:10.1103/PhysRevB.91.134413.
Lamirand, Anne D., Marcio M. Soares, Maurizio De Santis, Aline Y. Ramos, Stephane Grenier, and Helio C. N. Tolentino. “Strain Driven Monoclinic Distortion of Ultrathin CoO Films in the Exchange-Coupled CoO/FePt/Pt(001) System.” Journal of Physics-Condensed Matter 27, no. 8 (2015). doi:10.1088/0953-8984/27/8/085001.
Lamirand, Anne D., Marcio M. Soares, AlineY Ramos, Helioc N. Tolentino, Maurizio De Santis, Julio C. Cezar, and Abner de Siervo. “Spin Orientation in an Ultrathin CoO/PtFe Double-Layer with Perpendicular Exchange Coupling.” Journal of Magnetism and Magnetic Materials 373 (2015): 6–9. doi:10.1010/j.jmmm.2014.02.039.
Leclere, Cedric, Thomas W. Cornelius, Zhe Ren, Anton Davydok, Jean-Sebastien Micha, Odile Robach, Gunther Richter, Laurent Belliard, and Olivier Thomas. “In Situ Bending of an Au Nanowire Monitored by Micro Laue Diffraction.” Journal of Applied Crystallography 48 (2015): 291–96. doi:10.1107/s1600576715001107.
Petit, J., O. Castelnau, M. Bornert, F. G. Zhang, F. Hofmann, A. M. Korsunsky, D. Faurie, et al. “Laue-DIC: A New Method for Improved Stress Field Measurements at the Micrometer Scale.” Journal of Synchrotron Radiation 22, no. Pt 4 (2015): 980–94. doi:10.1107/s1600577515005780.
Rauer, C., H. Moriceau, F. Rieutord, J. M. Hartmann, F. Fournel, A. M. Charvet, N. Bernier, et al. “Mechanism Involved in Direct Hydrophobic Si(100)-2x1:H Bonding.” Microsystem Technologies-Micro-and Nanosystems-Information Storage and Processing Systems 21, no. 5 (2015): 961–68. doi:10.1007/s00542-015-2443-5.
Richard, A., E. Castelier, H. Palancher, J. S. Micha, H. Rouquette, A. Ambard, Ph Garcia, and Ph Goudeau. “Multi-Scale X-Ray Diffraction Study of Strains Induced by He Implantation in UO2 Polycrystals.” Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 326 (2014): 251–55. doi:10.1016/j.nimb.2013.10.057.
Richard, M. I., A. Malachias, T. U. Schuelli, V. Favre-Nicolin, Z. Zhong, T. H. Metzger, and G. Renaud. “Ordered Domain Lateral Location, Symmetry, and Thermal Stability in Ge:Si Islands.” Applied Physics Letters 106, no. 1 (2015). doi:10.1063/1.4905844.
Rieutord, F., C. Rauer, and H. Moriceau. “Interfacial Closure of Contacting Surfaces.” Epl 107, no. 3 (2014). doi:10.1209/0295-5075/107/34003.
Sanchez, Dario Ferreira, David Laloum, Monica Larissa Djomeni Weleguela, Olivier Ulrich, Guillaume Audoit, Adeline Grenier, Jean-Sebastien Micha, et al. “X-Ray Mu-Laue Diffraction Analysis of Cu through-Silicon Vias: A Two-Dimensional and Three-Dimensional Study.” Journal of Applied Physics 116, no. 16 (2014). doi:10.1063/1.4899318.
Sanchez, Dario Ferreira, Julie Villanova, Jerome Laurencin, Jean-Sebastien Micha, Alexandre Montani, Patrice Gergaud, and Pierre Bleuet. “X-Ray Micro Laue Diffraction Tomography Analysis of a Solid Oxide Fuel Cell.” Journal of Applied Crystallography 48 (2015): 357–64. doi:10.1107/s1600576715002447.