ID01

Synopsis

ID01 is a x-ray diffraction and scattering beamline devoted to the study of a wide variety of materials, from nanostructures to bulk, with the ability to perform imaging of strain and structure using full field diffraction imaging, coherent x-ray diffraction methods and/or nanodiffraction. Typical samples range from microelectronic devices to novel metal-organic solar cells or battery electrodes.
Status:  open

Disciplines

  • Materials and Engineering
  • Chemistry
  • Physics
  • Environmental Sciences
  • Medicine

Applications

  • Materials science
  • Condensed matter physics
  • Chemistry

Techniques

  • XRD - X-ray diffraction
  • CDI - coherent diffraction imaging
  • GISAXS - grazing incidence small-angle scattering
  • Ptychography
  • Microbeam

Energy range

  • 6.0 - 24.0  keV

Beam size

  • Minimum (H x V) : 65.0 x 56.0  nm²
  • Maximum (H x V) : 6.0 x 1.0  mm²

Sample environments

  • Nanotranslations stages
  • Furnace (T < 1000°C)
  • He miniflow cryostat (T > 2.5K)

Detectors

  • 0D: Cyberstar NaI scintillation detector
  • 0D: APD
  • 0D: Roentec
  • 0D: Amptek
  • 2D: Maxipix pixel detector (516x516) 55 micron pixels
  • 2D: Andor Zyla fiber optics CCD (2561x2160) 6.5 micron pixels
  • 2D: Eiger 2M (1030x2164) 75 micron pixels

Technical details

For XRD, the beamline offers nanodiffraction (Fresnel zone plates/ KB mirrors), microdiffraction (beryllium lenses), and coherent X-ray diffraction. A high-precision Huber diffractometer is available. The sample stage is installed on a granite table for stability requirements and is decoupled from the detector arm. A compact hexapod is on top of the sample stage for fine alignment of the sample. Piezo stages with capacitive encoders for high precision nanotranslations are on top of the hexapod. 0D, 1D and 2D detectors are available. Several in-situ chambers are available; including cooling, heating, gas flow and vacuum.

SXDM (quicK-MAPping)

[1] Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping, G. A. Chahine et al., J. Appl. Cryst. 47, 762 (2014)

FFDM

[2] Full-field X-ray diffraction microscopy using polymeric compound refractive lenses, J. Hilhorst, F. Marschall, T. N. Tran Thi, A. Last and T.  U. Schülli, J. Appl. Cryst. 47, 1882 (2014)

BCDI

[3] Inversion domain boundaries in GaN wires revealed by coherent bragg imaging, S. Labat et al. ACS Nano, 9 (9), pp 9210-9216, (2015)