ID26 is an insertion device source consisting of three mechanically independent undulators (two 35-mm and one revolving 35/27-mm period).


HDM1 Water-cooled 620 mm long flat mirror. Each mirror of the beamline has three different coatings (Pt, Si and Pd) for efficient harmonic rejection.
Kohzu Monochromator Cryogenically-cooled fixed-exit double-crystal monochromator
Monochromator crystals Flat Si[111] pair and Flat Si[311] pair
Spectral range 2.4 - 30 keV
Intrinsic resolution (DE/E) Si[111]: 1.4 x 10-4  Si[311]: 0.3 x 10-4
HFM2 1000 mm long mirror with benders for horizontal focalization
VFM3 600 mm long mirror with benders for vertical focalization
Flux at sample > 1013 ph/sec using Si(111) monochromator. Flux factor 5 less for Si(311)


The following options are available for X-ray absorption and emission experiments. experiments:

  • An emission spectrometer using five spherically bent analyzer crystals is available for energies 4.5 - 17 keV (DE/E < 0.001).
  • Photo-diodes for flux monitoring and for experiments with absorber concentrations above 1mM.
  • Multi-element Germanium Detector for XAS measurements at lower concentrations.
  • Avalanche Photodiode (APD).
  • Bent crystal Laue Analzyers (BCLA). Please contact the beamline staff in case you are interested in using a BCLA.

Available Scanning Modes

  • X-ray absorption spectra with continuous scanning of undulator gap to minimize radiation damage to the samples.

Further details are given in the page on Scanning Modes

Sample Environment

Low temperature measurements can be performed by means of a displex cryostat with the sample in vacuum. Temperatures down to ~10 K can be obtained using He as cryogen. A mass flow control system for gases that is controlled by the beamline computer is available. Please visit the sample environment web page for more possibilities (Sample Environment Support Service).