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Oxide at the Al-rich Fe0.85Al0.15(110) surface

Dai Z.B., Alyabyeva N., Van den Bossche M., Borghetti P., Chenot S., David P., Koltsov A., Renaud G., Jupille J., Cabailh G., Noguera C., Goniakowski J., Lazzari R.,
Physical Review Materials 4, 074409-1-074409-11 (2020)

Topological band crossings in epitaxial strained SnTe

Fragkos S., Sant R., Alvarez C., Golias E., Marquez-Velasco J., Tsipas P., Tsoutsou D., Aminalragia-Giamini S., Xenogiannopoulou E., Okuno H., Renaud G., Rader O., Dimoulas A.,
Physical Review Materials 3, 104201-1-104201-8 (2019)

Accurate strain measurements in highly strained Ge microbridges

Gassenq A., Tardif S., Guilloy K., Dias G.O., Pauc N., Duchemin I., Rouchon D., Hartmann J.M., Widiez J., Escalante J.M., Niquet Y.M., Geiger R., Zabel T., Sigg H., Faist J., Chelnokov A., Rieutord F., Reboud V., Calvo V.,
Applied Physics Letters 108, 241902-1-241902-4 (2016)