This beamline offers diffraction data collection on microcrystalline MX samples and on fine needle MX samples, as well as determination of the region of highest diffraction quality from larger MX samples.
Max Nanao 1, Shibom Basu 2, Ulrich Zander 2, Thierry Giraud 1, John Surr 1, Matias Guijarro 1, Mario Lentini 1, Franck Felisaz 2, Jeremy Sinoir 2, Christian Morawe 1, Amparo Vivo 1, Antonia Beteva 1, Marcus Oscarsson 1, Hugo Caserotto 1, Fabien Dobias 1, David Flot 1, Didier Nurizzo 1, Jonathan Gigmes 1, Nicolas Foos 1, Ralf Siebrecht 3, Thomas Roth 1, Pascal Theveneau 1, Olof Svensson 1, Gergely Papp 1, Bernard Lavault 3, Florent Cipriani 2, Ray Barrett 1, Carole Clavel 1, Gordon Leonard 1
2022 Mar 1;29(Pt 2):581-590. doi: 10.1107/S1600577522000984
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European Synchrotron Radiation Facility - 71, avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France.