ESRF - EBS Workshop Series


Workshop on
Dark Field X-ray Microscopy for EBSL2

ESRF - Grenoble - France
15 - 17 April 2020

Venue   ESRF auditorium

Carsten Detlefs, ESRF Grenoble
Henning F. Poulsen, Technical University of Denmark


Eva Jahn, ESRF Grenoble
Sonya Girodon, ESRF Grenoble


Please register here


Dark-field x-ray microscopy is a newly developed technique to measure orientation and strain in crystalline materials with spatial resolution down to 100 nm. At the end of the EBS shutdown, Beamline ID06 HXRM will be the first instrument worldwide to offer this technique via a general user programme. Furthermore, the project has been selected as one of the Upgrade Beamlines, EBSL2, to be constructed on ID03.

The aim of this workshop is to present this new instrument and seed a new user community. Via discussions with potential users, we aim to determine the needs of future users for instrumentation such as sample environments, auxiliary measurements, sample preparation, etc.




A fee is charged to contribute towards lunches at the EPN campus restaurant from Wednesday 15 to Friday 17 April, coffee breaks during the workshop and the "aperitif dinatoire" during the poster session.

Fees will be reduced for students.

Participants should arrange and pay for their own travel to/from Grenoble and accommodation.

Call for abstracts

You find the instructions here


Submission of abstracts for contributed talks: 01/03/2020

Confirmation for oral contributions: 08/03/2020

Submission of poster contributions: 22/03/2020

Registration: 22/03/2020

This project has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement No 870313.