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The X-Tip project

The 6th Framework programme of the European Commission supports a Specific Targeted Research Program (STRP), named X-Tip, aimed to explore and develop technologies associating the mapping and handling capabilities of Local Probe Microscopies with the X-Ray Synchrotron Radiation characterisation tools. The program envisages exploring different detection schemes ranging from classic Total Electron Yield from a metallic tip, to visible photon collection and capacitance measurements. One of the workpackages deals specifically with mechanical interactions between Tip and Surface, exploring the possibilities of X-ray characterisation under tip handling and modification. The X-Ray characterisation of NEMS structures under tip induced modifications enters in this workpackage.

IR-SNOM

The stability and spectral tuning range of Synchrotron Radiation Infrared radiation prompted a steady increase of the number of IR beamlines in SR facilities. The combination of Near Field technologies with SR Infrared besides giving the opportunity of imaging the area explored by the infrared beam consents to achieve lateral resolutions independent of the focal spot of the IR radiation pushing them below the diffraction limit. The program will explore the advancement on the fields, the technical challenges and the future activities on the field.