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Using XPCS to measure velocity and strain fields

QUICK INFORMATION
Type
Seminar
Start Date
19-05-2017 11:00
Location
Science Building Seminar room : SB-036
Speaker's name
Mark Sutton
Speaker's institute
McGill University (Montréal- Canada)
Contact name
CRG LIAISON OFFICE
Host name
Oier BIKONDOA
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Using heterodyne XPCS where one measures the interference of a static speckle pattern versus a pattern from a flowing sample, one can measure a projection of the velocity field of the flowing material. Somewhat similarly, one can measure a projection of small strain fields by studying spatial cross-correlations between speckle patterns taken with and without strain.

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