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Modern coherent X-ray scattering techniques: applications and future development

QUICK INFORMATION
Type
Seminar
Start Date
03-09-2019 09:00
End Date
03-09-2019 10:00
Location
Room 500 - 501, Central Building
Speaker's name
Yuriy CHUSHKIN
Speaker's institute
ESRF Grenoble, France
Contact name
Claudine Roméro
Host name
Michael Wulff
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The advent of the third-generation synchrotron sources laid down the foundation for the development of new X-ray scattering techniques utilizing X-ray beams with high degree of coherence. Scattering of the coherent beams by optically heterogeneous materials produces characteristic grainy picture in the far-field called speckle pattern. It reflects exact arrangement of heterogeneous regions in materials. The analysis of the speckle pattern is used to study structural and dynamical properties of a sample. When heterogeneous regions evolve in time the speckle pattern changes.  The speckle intensity fluctuations provide a measure of structural relaxation in a material and is used in X-ray Photon Correlation Spectroscopy for investigation of equilibrium and non-equilibrium dynamics at nanometre and atomic length scales in various materials. The static speckle pattern can be used to obtain an image of an object by Fourier inversion. This lensless approach is exploited in coherent diffraction microscopy for high resolution imaging of isolated microscopic objects and in ptychography for imaging extended objects by scanning.  The techniques outperform the conventional lensbased X-ray microscopy in terms of dose efficiency, resolution and sensitivity.

Forthcoming synchrotron sources upgrades, promising a 100 times increase in coherent flux, will directly improve the performance of coherent X-ray scattering techniques in terms of spatial and temporal resolution and will enable addressing new scientific questions. In this presentation we will review the XPCS, forward scattering CDI and ptychography techniques  highlighting their area of applications, advantages, limits and prospects for future development and applications in view of the EBS-ESRF.

Visitors from off-site please contact Claudine Roméro tel +33 (0)4 76 88 20 27 to arrange for a gate pass.
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