xop documentation

XOP Documentation

XOP on-line documentation

XOP 2.4 comes with an on-line application built with the idea of helping the users in choosing the right applications from the XOP

collection and access quicker the on-line documentation of the individual aplications.

Xop tutorial

One efficient way to learn how to use XOP and SHADOW is to follow a number of practical exercises. They illustrate the different problems that XOP and SHADOW can tackle, practical information of how to introduce the inputs in XOP, and the solution to the exercises. In addition, the input files for XOP are also available, which could be very useful to reproduce the solutions on your computer. The material of the tutorial available from the XOP distribution consists of:

• A PDF document containing the exercises and the solutions:  "Computer simulations and ray-tracing for X-ray optics"
• The input files for XOP

They are available in the XOP on-line documentation

General XOP's References

• M. Sánchez del Río and R. J. Dejus. "XOP v2.4: recent developments of the x-ray optics software toolkit"  (2011) SPIE proceedings 8141
  
• M. Sánchez del Río and R. J. Dejus. "Status of XOP: an x-ray optics software toolkit"  (2004) SPIE proceedings 5536, 171-174
• M. Sánchez del Río and R. J. Dejus." XOP 2.1: A new version of the X-ray optics software toolkit " Synchrotron Radiation Instrumentation: Eighth International Conference, edited by T. Warwick et al. (2004) Americal Institute of Physics, pags 784-787.

• M. Sánchez del Río and R. J. Dejus." XOP: Recent developments " (1998) SPIE proceedings 3448  240-345

• M. Sánchez del Río and R. J. Dejus. " XOP: A Multiplatform Graphical User Interface for Synchrotron Radiation Spectral and Optics Calculations " (1997) SPIE proceedings vol. 3152,  148-157

• Roger J. Dejus and Manuel Sanchez del Rio, "XOP: A graphical user interface for spectral calculations and x-ray optics utilities", Rev. Sci. Instrum. 67(9) 1996 Proceedings of the conference on Synchrotron Radiation Instrumentation '95.

Particular references (specific for describing and using some of the XOP applications) :

• XCRYSTAL (crystal diffraction, including bent crystals): M. Sanchez del Rio, N. Perez-Bocanegra, X. Shi, V. Honkimäki and L. Zhang, Simulation of X-ray diffraction profiles for bent anisotropic crystals. J. Appl. Cryst. (2015). 48, 477-491    [ doi:10.1107/S1600576715002782 ] (free preprint available at ArXiv)

• XAID extension: M. Sanchez del Rio. "XAID: a package for XAFS data analysis based on IDL" J. Phys. IV, Coll C2-209 1997.