Recent Publications:

Coherent nanoscale X-ray probe for crystal interrogation at ID01, ESRF –
The European Synchrotron

 S. Leake et al. , Materials and Design 119, 470 (2017).

Direct Evidence of Chlorine Induced Preferential Crystalline
Orientation in Methylammonium Lead Iodide Perovskites Grown on TiO

M. Bouchard et al. J. Phys. Chem. C, (2017). DOI: 10.1021/acs.jpcc.6b11529

MicrostraindistributionmappingonCuInSe2 thin films bymeansof

N. Schäfer et al. Ultramicroscopy169, 89 (2016).

Miniaturized beamsplitters realized by X-ray waveguides

S. Hoffmann-Urlaub, T. Salditt, Acta Cryst. (2016). A72 doi:10.1107/S205327331601144X

Years 2015

Bussone G., Schäfer-Eberwein H., Dimakis E., Biermanns A., Carbone D., Tahraoui A., Geelhaar L., Bolívar P.H., Schülli T.U., Pietsch U. - Correlation of electrical and structural properties of single as-grown GaAs nanowires on Si (111) substrates

Nano Letters 15, 981-989 (2015)


Chahine G.A., Zoellner M.H., Richard M.I., Guha S., Reich C., Zaumseil P., Capellini G., Schroeder T., Schülli T.U. - Strain and lattice orientation distribution in SiN/Ge complementary metal-oxide-semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy

Applied Physics Letters 106, 071902-1-071902-4 (2015)


Di Luccio T., Carbone D., Masala S., Ramachandran K., Kornfield J. - Synthesis of CdS nanocrystals in polymeric films studied by in-situ GID and GISAXS

MRS Proceedings 1810, 1-6 (2015)


Keplinger M., Mandl B., Kriegner D., Holý V., Samuelsson L., Bauer G., Deppert K., Stangl J. - X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment

Journal of Synchrotron Radiation 22, 59-66 (2015)


Labat S., Richard M.I., Dupraz M., Gailhanou M., Beutier G., Verdier M., Mastropietro F., Cornelius T.W., Schülli T.U., Eymery J., Thomas O. - Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging

ACS Nano 9, 9210-9216 (2015)


Le Bolloc'h D., Sinchenko A.A., Jacques V.L.R., Ortega L., Lorenzo E., Lejay P., Schülli T., Chahine G., Monceau P. - Sliding state of the quasi-two dimensional CDW system TbTe3 probed by coherent x-ray diffraction

Physica B 460, 96-99 (2015)


Liewald C., Noever S., Fischer S., Roemer J., Schülli T.U., Nickel B. - Microdiffraction imaging-a suitable tool to characterize organic electronic devices

AIMS Materials Science 2, 269-278 (2015)


Liscio F., Ferlauto L., Matta M., Pfattner R., Murgia M., Rovira C., Mas-Torrent M., Zerbetto F., Milita S., Biscarini F. - Changes of the molecular structure in organic thin film transistors during operation

Journal of Physical Chemistry C 119, 15912-15918 (2015)


Marcal L.A.B., Richard M.I., Magalhães-Paniago R., Cavallo F., Lagally M.G., Schmidt O.G., Schülli T.U., Deneke C., Malachias A. - Direct evidence of strain transfer for InAs island growth on compliant Si substrates

Applied Physics Letters 106, 151905-1-151905-5 (2015)


Richard M.I., Zoellner M.H., Chahine G.A., Zaumseil P., Capellini G., Häberlen M., Storck P., Schülli T.U., Schroeder T. - Structural mapping of functional Ge layers grown on graded SiGe buffers for sub-10 nm CMOS applications using advanced X-ray nanodiffraction

ACS Applied Materials & Interfaces 7, 26696-26700 (2015)


Salditt T., Hoffmann S., Vassholz M., Haber J., Osterhoff M., Hilhorst J. - X-ray optics on a chip: Guiding X rays in curved channels

Physical Review Letters 115, 203902-1-203902-5 (2015)


Tran Thi T.N., Dubois S., Baruchel J., Enjalbert N., Fernandez B., Schülli T., Lafford T.A. - Czochralski and mono-like p-type and n-type silicon solar cells: Relationship between strain and stress induced by the back contact, and photovoltaic performance

Solar Energy Materials and Solar Cells 135, 17-21 (2015)


Vianne B., Escoubas S., Richard M.I., Labat S., Chahine G., Schülli T., Farcy A., Bar P., Fiori V., Thomas O. - Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction

Microelectronic Engineering 137, 117-123 (2015)


Vianne B., Krauss C., Escoubas S., Richard M.I., Labaf S., Chahine G., Schülli T., Micha J.S., Fiori V., Farcy A., Thomas O. - Effect of the temperature on the strain distribution induced in silicon interposer by TSVs: A comparison between micro-Laue and monochromatic nanodiffraction

In: "Proceedings of the 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM)", (IEEE, 2015) pp.59-62


Vianne B., Richard M.I., Escoubas S., Labat S., Schülli T., Chahine G., Fiori V., Thomas O. - Through-silicon via-induced strain distribution in silicon interposer

Applied Physics Letters 106, 141905-1-141905-5 (2015)


Zoellner M.H., Richard M.I., Chahine G.A., Zaumseil P., Reich C., Capellini G., Montalenti F., Marzegalli A., Xie Y.H., Schülli T.U., Häberlen M., Storck P., Schroeder T. - Imaging structure and composition homogeneity of 300 mm SiGe virtual substrates for advanced CMOS applications by scanning X-ray diffraction microscopy

ACS Applied Materials & Interfaces 7, 9031-9037 (2015)




Years 2008-2009

  1. Coherent diffraction tomography of nanoislands from grazing-incidence small-angle x-ray scattering
    O. M. Yefanov, A. V. Zozulya, I. A. Vartanyants, J. Stangl, T. H. Metzger, G. Bauer,  T. Boeck  and M. Schmidbauer
    APPLIED PHYSICS LETTERS 94, 123104 (2009)
  2. Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometry
    Ch. Deneke, J. Schumann, R. Engelhard, J. Thomas, C. Müller, M. S. Khatri, A.Malachias, M. Weisser,T. H. Metzger and O. G. Schmidt
    Nanotechnology 20 045703 (2009)
  3. Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques
    D Carbone, A Biermanns, B Ziberi, T H Metzger, U Pietsch, F Frost and O Plantevin
    Chapter in the book: Self-organized Surface Nanopatterns Induced by Ion Beam Sputtering, edited by  Mario Castro, Rodolfo Cuerno, Raul Gago and Luis Vazquez
    Journal of Physics Condensed Matter (JPCM)  accepted for publication (2009)
  4. Planar hybrid superlattices by compression of rolled-up nanomembrane
    T. Zander, Ch. Deneke and O. G. Schmidt, Ch. Mickel, A. Malachias and T. H. Metzger
    APPLIED PHYSICS LETTERS 94, 053102  (2009)
  5. Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction
    T. Scheler, M. Rodrigues, T. W. Cornelius, C. Mocuta, A. Malachias, R. Magalhães-Paniago, F. Comin, J. Chevrier, and T. H. Metzger
    APPLIED PHYSICS LETTERS 94, 023109 (2009)
  6. Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays
    M.-I. Richard, V. Favre-Nicolin, G. Renaud, T. U. Schülli, C. Priester, Z. Zhong and T.-H. Metzger
    APPLIED PHYSICS LETTERS 94, 013112 (2009)
  7. Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
    V. Holý , K. Mundboth, C. Mokuta , T.H. Metzger , J. Stangl , G. Bauer , T. Boeck ,M. Schmidbauer
    Thin Solid Films 516,  8022, (2008)
  8. One-step synthesis of semiconductor clusters confined in Silicalite-1 using 3-Mercaptopropyl-trimethoxysilane as Co-template
    K.-L. Wong, S. Mintova, T. H. Metzger
    Chem. Mater. 20 (17), 5721 (2008)
  9. Effects of stabilizing binder and dispersion media on spin-on zeolite thin films
    L. Lakiss, I. Yordanov, T. Metzger, S. Mintova
    Thin Solid Films 2008.
  10. lPO4-18 Seed Layers and Films by Secondary Growt
    Lubomira Tosheva, Eng-Poh Ng, Svetlana Mintova, Manfred Holzl, Till H. Metzger and Aidan M. Doyle
    Chem. Mater. 20,  5721 (2008)
  11. X-ray scattering and diffraction from ion beam induced ripples in crystalline silicon
    Andreas Biermanns, Ullrich Pietsch, Jörg Grenzer, Antje Hanisch, Stefan Facsko, Geradina Carbone, and Till Hartmut Metzger
    JOURNAL OF APPLIED PHYSICS 104, 044312  (2008)
  12. Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray Microdiffraction
    A. Malachias, Ch. Deneke, B. Krause, C. Mocuta, S. Kiravittaya, T. H. Metzger, and O. G. Schmidt
    PHYSICAL REVIEW B 79, 035301 (2009)
  13. Diffuse x-ray scattering from inclusions in ferromagnetic Ge1−xMnx layers
    V. Holý, R. T. Lechner, S. Ahlers, L. Horák, T. H. Metzger, A. Navarro-Quezada, A.Trampert; D. Bougeard, and G. Bauer
    PHYSICAL REVIEW B 78, 144401  (2008)
  14. Imaging of nanoislands in coherent grazing-incidence small-angle x-ray scattering experiments
    A. V. Zozulya, O. M. Yefanov, I. A. Vartanyants,K. Mundboth,C. Mocuta, T. H. Metzger, J. Stangl, G. Bauer, T. Boeck, and M. Schmidbauer
    PHYSICAL REVIEW B 78, 121304 R (2008)
  15. Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands
    . Mocuta,1 J. Stangl, K. Mundboth, T. H. Metzger, G. Bauer, I. A. Vartanyants, M. Schmidbauer, and T. Boeck
    PHYSICAL REVIEW B 77, 245425 (2008)
  16. Crystal truncation planes revealed by three-dimensional reconstruction of reciprocal space
    I. A. Vartanyants, A. V. Zozulya, K. Mundboth, O. M. Yefanov, M.-I. Richard, E. Wintersberger, J. Stangl, A. Diaz, C. Mocuta, T. H. Metzger, G. Bauer, T. Boeck, and M. Schmidbauer
    PHYSICAL REVIEW B 77, 115317  (2008)
  17. Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography
    A. Rastelli, M. Stoffel, A. Malachias, T. Merdzhanova, G. Katsaros, K. Kern, T. H. Metzger and O.G. Schmidt
    Nano Lett.,  8, 1404–1409  (2008)
  18. Versatile vacuum chamber for in-situ surface x-ray scattering studies
    D. Carbone, O. Plantevin, R. Gago, C. Mocuta, O.Bikondoa, L. Petit, H. Djazouli, A. Alija, and T. H. Metzger
    J. Synchrotron Rad. 15, 414–419, (2008)
  19. Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
    D Carbone, A Alija,O Plantevin, R Gago, S Facsko and THMetzger
    Nanotechnology 19 , 035304 (2008)
  20. Nanostructures in the light of synchrotron radiation: Surface sensitive x-ray techniques and anomalous scattering
    Till Metzger, Vincent Favre-Nicolin, Gilles Renaud, Hubert Renevier, Tobias Schülli
  21. Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction; Virginie Chamard, Julian Stangl, Stephane Labat, Bernhard Mandl, Rainer; T. Lechner and Till H. Metzger; J. Appl. Cryst. 41, 272–280 (2008).
  22. Standing-wave effects in grazing-incidence x-ray diffraction from polycrystalline multilayers;J. Krčmář, V. Holý, L. Horák, T. H. Metzger, and J. Sobota; J. Appl. Phys. 103, 033504 (2008)
  23. In-line holography and coherent diffractive imaging with x-ray waveguides; L. De Caro, C. Giannini, D. Pelliccia, C. Mocuta, T. H. Metzger, A. Guagliardi, A. Cedola, I. Burkeeva, and S. Lagomarsino; Phys. Rev. B 77, 081408 (2008)
  24. X-ray structural investigation of Co/Cu granular multilayers with giant magnetoresistance  F. Spizzo, C. Ferrero, A. Mazuelas, F. Albertini, F. Casoli, L. Nasi, and T. H. Metzger, J. Appl. Phys. 103, 07D525 (2008)
  25. X-ray Structure Analysis of Free-Standing Lipid Membranes Facilitated by Micromachined Apertures; Andre Beerlink, P.-J. Wilbrandt,E. Ziegler, D. Carbone, T. H. Metzger, and Tim Salditt ; Langmuir, 24 , 4952 (2008)
  26. X-ray pushing of a mechanical microswing; A. Siria, M. S. Rodrigues, O. Dhez, W.Schwartz, G. Torricelli, S. LeDenmat, N. Rochat, G. Auvert, O. Bikondoa, T. H. Metzger, D. Wermeille, R. Felici, F. Comin and J. Chevrier ; arXiv:0801.2050v2 [physics.ins-det] 22 Jan (2008)
  27. Strain and composition of ultra small Ge quantum dots studied by x-ray scattering and in situ surface x-ray absorption spectroscopy Crystal truncation planes revealed by three-dimensional reconstruction of reciprocal space
    I. A. Vartanyants, A. V. Zozulya, K. Mundboth, O. M. Yefanov, M.-I. Richard, Wintersberger, J. Stangl, A. Diaz, C. Mocuta, T. H. Metzger, G. Bauer, T. Boeck, and M. Schmidbauer
    PHYSICAL REVIEW B 77,115317 (2008)

Years 1995-2007






  1. Design of the anomalous scattering beamline at the European Synchrotron Radiation Facility
    S. Lequien, L. Goirand, F. Lesimple
    Review of Scientific Instruments 66, 1725 - 5. International Conference on Synchrotron Radiation Instrumentation - New York, USA ,1994-07-18 / 22 (1995)
  2. X-ray section topographic investigation of the growth process of SiC crystals
    S. Milita R. Madar, J. Baruchel, A. Mazuelas
    Materials Science Forum 264-268, 29-32 (1998)
  3. Morphological characterization of ion-sputtered C-Ag, C/C-Ag and Ag/C films by GISAXS
    D. Babonneau, A. Naudon, D. Thiaudiere, S. Lequien
    J Applied Crystallography 32, 226-233 (1999)
  4. Combined X-ray and neutron diffraction from binary liquids and amorphous semiconductors
    A.C. Barnes, M.A. Hamilton, P. Buchanan, M.L. Saboungi
    J Non Cryst Solids 250-252, 393-404 (1999)
  5. A high temperature furnace for in situ and time-resolved X-ray diffraction studies
    M.J. Capitan, N. Thouin, G. Rostaing
    Review of Scientific Instruments 70, 2248 (1999)
  6. X-ray diffuse scattering fro icosahedral Al-Pd-Mn quasicrystals
    M.J. Capitan, Y. Calvayrac, A. Quivy, J.L. Joulaud, S. Lefebvre, D. Gratias
    Physical Review B 60, 6398 (1999)
  7. Frontiers in SAXS and SANS
    B. Deme, Diat O., Narayanan T., Zemb T.
    Conference : Frontiers in SAXS and SANS - Grenoble, France, 1999-02-12 / 13 (1999)
  8. Crystallization of amorphous Si0.5Ge0.5 films studied by in-situ X-ray diffraction and in-situ electron microscopy
    F.T. Edelmann, T. Raz, Y. Komem, P. Zaumseil, H.J. Osten, M.J. Capitan
    Philosophical Magazine A 79(11), 2617-2628 (1999)
  9. Readout electronics for position-sensitive gas filled detectors at the European Synchrotron Radiation Facility
    C. Herve, T. Le Caer
    Review of Scientific Instruments 70, 226 (1999)
  10. Lateral ordering of coherent Ge islands on Si(001) studied by triple-crystal grazing incidence diffraction
    I. Kegel, T.H. Metzger, J. Peisl, P. Schittenhelm and G. Abstreiter
    Appl.Phys. Lett. 74, 2978 (1999)
  11. Elastic stress relaxation in Ga0.18In0.82As0.73P0.27 quantum wires on InP
    D. Luebbert, B. Jenichen, H. T. Grahn, T. Baumbach, A. Mazuelas, T. Kojima, S. Arai
    J. Phys. D.: Appl. Phys. 32(10A),A21 (1999)
  12. Influence of the transverse and longitudinal coherence in dynamical theory of x-ray diffraction
    V. Mocella, J.P. Guigay, Y. Epelboin, J. Härtwig, J.Baruchel and A. Mazuelas
    J. Phys. D.: Appl. Phys. 32, A88 (1999)
  13. Grazing incidence small angle x-ray scattering from free-standing nanostructures
    M. Rauscher,R.Paniago,H. Metzger, Z. Kovats, J. Domke, J. Peisl, H.-D. Pfannes, J.Schulze and I.Eisele
    J. Appl. Phys. 86, 6763 (1999)
  14. X-ray imaging and diffraction from surface phonons on GaAs
    W. Sauer, M. Streibl, T.H. Metzger, A.G.C. Haubrich, S. Manus, A. Wixforth, J. Peisl, A. Mazuelas, J. Haertwig , and J. Baruchel
    Appl. Phys. Lett. 75, 1709 (1999)
  15. Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering
    J. Stangl, V. Holý, P. Mikulik, G. Bauer, I. Kegel, T.H. Metzger, O. G. Schmidt, C. Lange, K. Eberl
    Appl. Phys. Lett. 74, 3785 (1999)
  16. In-situ characterisation of strain distribution in broad area high power lasers under operation by high resolution X-ray diffraction and topography using synchrotron radiation
    U. Zeimer, T. Baumbach, J. Grenzer, D. Lübbert, A. Mazuelas, U. Pietsch, G. Erbert
    J. Phys. D.: Appl. Phys. 32, A123 (1999)
  17. Diffuse X-ray Rods and Scattering from Point Defect Clusters in Ion Implanted Silicon
    U. Beck, T.H. Metzger, J. Peisl and J.R.Patel
    Appl.Phys. Lett. 76, 2698 (2000)
  18. Icosahedral quasicrystals applied as a harmonic-free crystal analyser
    M.J. Capitan, J. Alvarez
    J Applied Crystallography 33, 888-892 (2000)
  19. The ID01 beamline at the E.S.R.F.: The diffuse scattering technique applied to surface and interface studies
    M.J. Capitan, D. Thiaudiere, L. Goirand, R. Taffut, S. Lequien
    Physica B 283, 256 (2000)
  20. Anomalous X-ray diffraction with soft X-ray synchrotron radiation
    P. Carpentier, C. Berthet-Colominas, M. Capitan, M.L. Chesne, E. Fanchon, S. Lequien, H. Stuhrmann, D. Thiaudiere, J. Vicat, P. Zielinski, R. Kahn
    Cellular and Molecular Biology 46, 935 (2000)
  21. GISAXS study of Cu-Ni alloy clusters obtained by double ion implantation in silicate glasses
    E. Cattaruzza, F. Dacapito, F. Gonella, A. Longo, A. Martorana, G. Mattei, C. Maurizio and D.Thiaudiere
    J Applied Crystallography 33, 740-743 (2000)
  22. Neutron and X-ray investigation of disordered quasicrystals
    K. Hradil, T. Scholpp, F. Frey, T. Haibach, M.A. Estermann, M. Capitan
    Materials Science and Engineering 303, 294-296 (2000)
  23. Feasibility and review of anomalous X-ray diffraction at long wavelengths in materials research and protein crystallography
    R. Kahn, P. Carpentier, C. Berthet-Colominas, M. Capitan, M.-L. Chesne, E. Fanchon and S. Lequien
    J. Synchrotron Radiation 7, 131-138 (2000)
  24. Clusters and planar defects in boron implanted silicon an x-ray diffuse scattering study
    I. Kegel, M. Sztucki, T.H. Metzger, D. Luebbert, J. Arthur, and J.R. Patel
    Mat. Res. Soc. Symp. 610, B5.5.1 (2000)
  25. Nanometer-Scale Resolution of Strain and Interdiffusion in Self-Assembled InAs Quantum Dots
    I. Kegel, T.H. Metzger, A. Lorke, J. Peisl, J. Stangl, G. Bauer, J. M. Garcia, P. M. Petroff
    Phys.Rev. Lett. 85, 1694 (2000)
  26. Residual strain in Ge pyramids on Si(111) investigated by x-ray crystal truncation rod scattering
    Z. Kovats, M. Rauscher, H. Metzger, J. Peisl, R. Paniago, H.-D. Pfannes, J. Schulze, I. Eisele, F. Boscherini, S. Ferrer
    Phys.Rev. B 62, 8223 (2000)
  27. Carbon nanotubes synthesised in channels of AlPO4-5 single crystals: first X-ray scattering investigations
    P. Launois, R. Moret, D. Le Bolloc'h, P.A. Albouy, Z.K. Tang, G. Li, J. Chen
    Solid State Comms. 116, 99 (2000)
  28. Grazing incidence small angle X-ray scattering applied to the characterization of aggregates in surface regions
    A. Naudon, D. Babonneau, D. Thiaudiere, S. Lequien
    Physica B 283, 69-74 (2000)
  29. Diffuse x-ray streaks from stacking faults in Si analyzed by atomistic simulations
    K. Nordlund, U. Beck, T.H. Metzger and J. Patel
    Appl.Phys. Lett. 76, 846 (2000)
  30. Grazing incidence small-angle x-ray scattering from laterally ordered pyramidal Ge islands on Si(111)
    R. Paniago, T.H. Metzger, M. Rauscher, Z. Kovats, J. Peisl, J. Schulze and I.Eisele, S. Ferrer
    J.Appl. Cryst. 33, 433 (2000)
  31. Anomalous X-ray diffraction studies of hydration effects in concentrated aqueous electrolyte solutions
    S. Ramos, A.C. Barnes, G.W. Neilson, M. Capitan
    Chemical Physics 258, 151-161 (2000)
  32. The hydration structure of Br- from anomalous X-ray diffraction
    S. Ramos, A.C. Barnes, G.W. Neilson, D. Thiaudiere and S. Lequien
    J Physics: Condens. Matter 12(8A), p203-208 (2000)
  33. Partial pressure alarm system for the use on beam lines without any physical limitation to the storage ring vacuum system
    D. Schmied, E. Burtin, I. Parat
    7th European Particle Accelerator Conference EPAC 2000 - Vienna, Austria, Proceedings of EPAC 2000 pp. 2295-2297 (2000)
  34. Structural and morphological studies of Co/SiO2 discontinuous multilayers
    D. Thiaudiere, O. Proux, J.-S. Micha, C. Revenant, J.R. Regnard, S. Lequien
    Physica B 283, 114-118 (2000)
  35. Fully hydrated and highly oriented membranes: an experimental setup amenable to specular and diffuse x-ray scattering
    M. Vogel, C. Muenster, W. Fenzl, D. Thiaudiere, T. Salditt
    Physica B 283, 32-36 (2000)
  36. Thermal unbinding of highly oriented phospholipid membranes
    M. Vogel, Muenster C., Fenzl W., Salditt T.
    Physical Review Letters 84, 390 (2000)
  37. High resolution X-ray and neutron diffraction of super- and disorder in decagonal Al-Co-Ni
    E. Weidner, K. Hradil, F. Frey, M. De Boissieu, A. Letoublon, W. Morgenroth, H.G. Krane, M. Capitan, A.P. Tsai
    Materials Science and Engineering A 294-296, 308-314 (2000)
  38. Structure of the near-surface waveguide layers produced by diffusion of Titanium in Lithium Niobate
    Y. Avrahami, E. Zolotoyabko, W. Sauer, T. H. Metzger, J. Peisl
    Mat. Res. Soc. Symp. - Proceedings 590, 213 (2000)
  39. Strain and temperature distribution in broad-area high-power laser diodes under operation determined by high resolution X-ray diffraction and topography
    U. Zeimer, J. Grenzer, T. Baumbach, D. Luebbert, A. Mazuelas, and G. Erbert
    Mat. Science and Enginee. B80, 87-90 (2001)
  40. Transient ordering states in decagonal Al-Co-Ni and Al-Cu-Co-Si phases
    Weidner E, Frey F, Hradil K
    Phil.Mag.A 81, 2375 (2001)
  41. Influence of the electrolyte viscosity on the structural features of porous silicon
    Servidori M, Ferrero C, Lequien S, Milita S, Parisini A, Romestain R, Sama S, Setzu S, Thiaudiere D
    Solid State Commun. 118, 85 (2001)
  42. Porous silicon characterization by X-ray reflectivity: problems arising from using a vacuum environment with synchrotron beam
    Sama S, Ferrero C, Lequien S, Milita S, Romestain R, Servidori M, Setzu S, Thiaudiere D
    J. Phys. D:Appl. Phys. 34, 841 (2001)
  43. An anomalous X-ray diffraction study of yttrium(III) hydration
    Ramos S, Neilson GW, Barnes AC, Mazuelas A
    J. Phys. Chem. B 105, 2694 (2001)
  44. Coplanar and non-coplanar X-ray reflectivity characterization of lateral W/Si multilayer gratings
    Mikulik P, Jergel M, Baumbach T, Majkova E, Pincik E, Luby S, Ortega L, Tucoulou R, Hudek P, Kostic I
    J. Phys. D 34, A188 (2001)
  45. The lifetime of defects in silicon after ion-implantation and annealing
    Metzger TH., Sztucki M., Servidori M.
    ESRF Highlights (2001)
  46. Nanoscale crystal orientation in silicalite-1 films studied by grazing incidence X-ray diffraction
    T. H. Metzger, S. Mintova, T. Bein
    Microporous and Mesoporous Materials 43,191 (2001)
  47. Treatment of grazing-incidence small-angle X-ray scattering data taken above the critical angle
    Martorana A, Longo A, d'Acapito F, Maurizio C, Cattaruzza E, Gonella F
    J. Appl. Cryst. 34, 152 (2001)
  48. Direct observation of the coexistence of coherent and incoherent InAs self-assembled dots by X-ray scattering
    Malachias A, Magalhaes-Paniago R, Neves BRA, Rodrigues WN, Moreira MVB, Pfannes HD, Kycia S, Metzger TH
    Appl. Phys. Lett. 79, 4342 (2001)
  49. The CuCl2/Al2O3 catalyst investigated in interaction with reagents
    Lamberti C, Prestipino C, Capello L, Bordiga S, Zecchina A, Spoto G, Diaz Moreno S, Marsella A, Cremaschi B, Garilli M, Vidotto S, Leofanti G,
    Int. J. Mol. Sci. 2, 230 (2001)
  50. The status of gas-filled detector developments at a third generation synchrotron source (ESRF)
    Kocsis M
    Nucl. Instr. Meth. Phys. Res. A 471, 103 (2001)
  51. Determination of strain fields and composition of self-organized quantum dots using X-ray diffraction
    I.Kegel, T. H. Metzger, A. Lorke, J. Peisl, J. Stangl, G. Bauer,K. Nordlund, W.V. Schoenfeld and P. Petroff
    Phys. Rev. B 63, 035318 (2001)
  52. Depth-sensitive structural study of silicalite-1 films with grazing incidence X-ray diffraction
    S. Mintova, T. H. Metzger, and T. Bein
    accepted for publication in proceedings of the 13th int. Zeolite Conference Montpellier (2001)
  53. Strain and Composition distribution in free-standing SiGe islands from X-ray diffraction
    J. Stangl, A. Daniel, V. Holy, T. Roch, G. Bauer, I. Kegel, T. H. Metzger, T. Wiebach, O.G. Schmid, K.Eberl
    Appl. Phys. Lett. 79, 10, 1474 (2001)
  54. X-ray determination of vertical ordering of InAs quantum dots in InAs/GaAs multilayers
    J. C.González, R. Magalhães-Paniago, W. N. Rodrigues, A. Malachias, M.V.B. Moreira, A.G. de Oliveira I.Mazzaro, C. Cusatis T.H. Metzger, J. Peisl
    Appl. Phys. Lett. 78 (8), 1056 (2001)
  55. Rinsing and drying studies of porous silicon by high resolution X-ray diffraction
    Chamard V, Pichat C, Dolino G
    Solid State Communic. 118, 135 (2001)
  56. Evidence of pore correlation in porous silicon: An X-ray grazing-incidence study
    Chamard V, Bastie P, Le Bolloch D, Dolino G, Elkaim E, Ferrero C, Lauriat JP, Rieutord F, Thiaudiere D
    Phys.Rev.B 64, 245416 (2001)
  57. GID study of Ge quantum dots: small in size and high in density
    Derivaz M, Noe P, Dianoux R, Barski A, Schulli TU, Metzger TH
    ESRF Highlights (2001)
  58. Structure of metal nanowires in nanoporous alumina membranes studied by EXAFS and X-ray diffraction
    Benfield RE, Grandjean D, Dore JC, Wu Z, Kroll M, Sawitowski T, Schmid G
    European Phys.Jour. D 16, 399 (2001)
  59. Structure and bonding of gold metal clusters, colloids, and nanowires studied by EXAFS, XANES, and WAXS
    Benfield RE, Grandjean D, Kroll M, Pugin R, Sawitowski T, Schmid G
    J.Phys.Chem.B 105, 1961(2001)
  60. In situ real-time analysis of the formation of a quasicrystalline phase in Al-Co multilayers by solid-state reaction
    Bergman C, Joulaud JL, Capitan M, Clugnet G, Gas P
    J. Non-cryst. Solids 287, 193 (2001)
  61. Diffraction on lysozome crystals
    Boesecke P et al
    Zeitsch. Fuer Kristall. Supplem. 18, 40 (2001)
  62. Anomalous diffraction with soft X-ray synchrotron radiation: DANES from pentakismethylammonium undecachlorodibismuthate at the K absorption edge of chlorine
    Carpentier P, Capitan M, Chesne ML, Fanchon E, Kahn R, Lequien S, Stuhrmann H, Thiaudiere D, Vicat J, Zajac W, Zielinski P,
    J. Alloys Compounds 328, 64 (2001)
  63. Structure and ordering of GaN quantum dot multiplayer
    V. Chamard, T. H. Metzger, E. Bellet-Amalric, B. Daudin, C. Adelmann, H. Mariette, G. Mula
    Appl. Phys. Lett. 79, (13), 1971 (2001)
  64. Structural investigations on self-organised Si/SiGe islands by grazing incidence small angle X-ray scattering
    T. Roch, V. Holy, J. Stangl, E.Hoflinger, A. Daniel, G. Bauer, I. Kegel, H. Metzger, J. Zhu, K. Brunner, G. Abstreiter
    Phys. Stat. Sol. (b) 224, 241 (2001)
  65. Composition fluctuations in the demixed supercooled liquid state of Zr41Ti14Cu12.5Ni10Be22.5: A combined ASAXS and SANS study
    Hoell A, Bley F, Wiedenmann A, Simon JP, Mazuelas A, Boesecke P
    Scripta Mater. 44, 2335 (2001)
  66. Grazing incidence small-angle X-ray scattering study of self-organized SiGe wires
    V. Holy, T. Roch, J. Stangl, A. Daniel, G. Bauer, T. H. Metzger, Y. H. Zhu, K. Brunner and G. Abstreiter
    Phys. Rev. B 63, 205318 (2001)
  67. X-ray studies of self-organised wires in SiGe/Si multilayers
    T. Roch, V. Holy, A. Daniel, E. Hoflinger, M Meduna, THMetzger, G. Bauer, K. Brunner, G Abstreiter
    J. Phys. D 34, a6 (2001)
  68. X-ray study of surfaces and interfaces
    Asadchikov VE et al
    Proc. SPIE 4449, 253 (2001)
  69. Soft X-ray diffraction up to wavelengths of 6.0 angstrom becomes feasible at ID1 of ESRF
    Carpentier P, Boesecke P, Bois JM, Chesne ML, Fanchon E, Kahn R, Stuhrmann H; Vicat J
    Acta Phys. Pol.A 101, 603 (2002)
  70. Structural studies of mesoporous alumina membranes by small angle X-ray scattering
    Dore JC, Benfield RE, Grandjean D, Schmid G, Kroll M, Le Bolloc'h D
    Stud. Surf. Sci. Catal 144, 163 (2002)
  71. Diffraction by domains in decagonal Al-Co-Ni quasicrystals
    Frey F, Weidner E
    J. Alloys & Compounds 342, 105 (2002)
  72. Temperature dependence of the 8-angstrom superstructure in decagonal Al-Co-Ni
    Frey F, Weidner E, Hradil K, de Boissieu M, Letoublon A, McIntyre G, Currat R, Tsai AP
    J. Alloys & Compounds 342, 57 (2002)
  73. Formation of icosahedral Al-Cu-Fe quasicrystal in annealed metallic multilayers
    Grenet T, Giroud F, Joulaud JL, Capitan M
    Phil. Mag. A 82, 2909 (2002)
  74. The chemistry of the oxychlorination catalyst: an insitu time resolved XANES study
    Lamberti C, Prestipino C, Bonino F, Capello L, Bordiga S, Spoto G, Zecchina A, Diaz Moreno S, Cremaschi B, Garilli M, Marsella A, Carmello D, Vidotto S, Leofanti G
    Angew. Chem. Int. Ed. 41, 2341 (2002)
  75. Statics and kinetics of the ordering transition in the AuAgZn2 alloy
    Livet F, Bley F, Simon JP, Caudron R, Mainville J, Sutton M, Lebolloc'h D
    Phys.Rev.B 66, 134108 (2002)
  76. Alignment of Carbon nanotubes
    Lucas M et al.
    AIP conf Proc 633, 579 (2002)
  77. Grazing-incidence small-angle X-ray scattering and X-ray diffraction from magnetic clusters obtained by Co plus Ni sequential ion implantation in silica
    Maurizio C, Longo A, Martorana A, Cattaruzza E, D'Acapito F, Gonella F, de Julian C, Mattei G, Mazzoldi P, Padovani S, Boesecke P
    J.Appl.Cryst. 36, 732 (2002)
  78. Magainin2 in phospholipid bilayers:peptide orientation and lipid chain ordering studied by X-ray diffraction
    Muenster C, Spaar A, Bechinger B, Salditt T
    Biochim.Biophys. Acta 1562, 37 (2002)
  79. Neutron and X-ray diffr. Studies
    Neilson GW, Adya AK, Ansell S
    Ann.Rep on the Progress of Chem C98, 273 (2002)
  80. Two-dimensional X-ray waveguides and point sources
    Pfeiffer F, David C, Burghammer M, Riekel C, Salditt, T
    Science 297, 230 (2002)
  81. Self-assembly of alkane capped silver and silica nanoparticles
    Rensmo H, Ongaro A, Ryan D, Fitzmaurice D
    J.Mater.Chem 12, 2762 (2002)
  82. In situ study of strain evolution during thin film Ti/Al(Si,Cu) reaction using synchrotron radiation
    Rivero C, Bostrom O, Gergaud P, Thomas O, Boivin P, Mazuelas A
    Microelectron. Eng. 64, 81 (2002)
  83. X-ray and neutron scattering and solid state NMR investigations on precursor-derived B-C-N ceramics using isotopic substitution
    Sauter D, Weinmann M, Berger F, Lamparter P, Muller K, Aldinger F
    Chem.Mater. 14, 2859(2002)
  84. X-ray study of the structure and order in lithographic Cu3Au nano-cuboids
    Schulli T, Trenkler J, Monch I, Le Bolloc'h D, Dosch H
    Europyhs.Lett 14, 2859 (2002)
  85. Anomalous X-ray diffraction on InAs/GaAs quantum dot systems
    Schulli TU, Sztucki M, Chamard V, Metzger TH, Schuh D
    Appl.Phys.Lett 81, 448 (2002)
  86. Anomalous X-ray diffraction on InAs/GaAs quantum dot systems
    Schulli TU, Sztucki M, Chamard V, Schuh D
    ESRF Highlights (2002)
  87. Diamond nanoparticules to carbon onions transformation:xray diffraction studies
    Tomita S, Burian A, Dore JC, LeBolloc'h D, Fujii M, Hayashi S
    Carbon 40, 1469 (2002)
  88. Structural relation between Si and SiC formed by carbon ion implantation
    F. Eichhorn, N. Schell, A. Muecklich, H. Metzger, W. Matz, R. Koegler
    J. Appl. Phys. 91, 1287, (2002)
  89. X-ray diffraction from rectangular slits
    D. Le Bolloc’h, F. Livet, F. Bley, T. Schulli, M. Veron and T. H. Metzger
    J.Synchrotron Radiation 9, 258 (2002)
  90. X-ray analysis of temperature induced defect structures in Boron implanted Silicon
    M. Sztucki, T. H. Metzger, I. Kegel, A. Tilke, D. Luebbert, J. Arthur, J. Patel, J. L. Rouviere
    J. Appl. Physics 92, 3694 (2002)
  91. Anomalous X-ray diffraction on InAs/GaAs Quantum Dot systems
    T. Schulli, M. Sztucki, V. Chamard, T. H. Metzger, D. Schuh
    Appl. Phys. Lett. 81, 448 (2002)
  92. Structure and Ordering of GaN quantum dot multilayers investigated by X-ray grazing incidence techniques
    V. Chamard, T. H. Metzger, C. Ferrero, E. Bellet-Amalric, B. Daudin, H. Mariette, G. Mula
    EMRS proceedings (2002) and Physica E-LOW Dim. Systems 13, 1115 (2002)
  93. Application of third generation synchrotron sources to studies of non-crystalline materials: In-Se amouphous films
    Burian A, Jablonska A, Burian AM, Lebolloc'h D, Metzger H, Proux O, Hazemann JL, Mosset A, Raoux D
    Acta Physica Polonica A 101,701 (2002)
  94. Squeezing X-ray Photons
    T. H. Metzger
    Science 297, 205 (2002)
  95. Strain in buried self-assembled SiGe wires studied by grazing incidence X-ray diffraction.
    T. Roch, V. Holy, A. Hesse, J. Stangl, T. Frommherz, G. Bauer, T. H. Metzger, S. Ferrer
    Phys. Rev. B 65, 245324 (2002)
  96. X-ray diffuse scattering study of the kinetics of stacking fault growth and annihilation in boron-implanted silicon
    D. Luebbert and J. Arthur , M. Sztucki and T. H. Metzger, P. B. Griffin, J. R. Patel
    Applied Physics Letters 81, 3167 (2002)
  97. Self-organized semiconductor nanostructures: shape, strain and composition
    J. Stangl, V. Holy, G. Springholz, G. Bauer, I. Kegel, T.H. Metzger
    Materials Science and Engineering C 19 349–358 (2002)
  98. Strain in buried self-assembled SiGe wires studied by grazing incidence X-ray diffraction
    T. Roch, V. Holy, A. Hesse, J. Stangl, T. Frommherz, G. Bauer, T. H. Metzger, S. Ferrer
    Phys. Rev. B 65, 245324 (2002)
  99. Investigation of GaN quantum dot stacking in multilayers with X-ray grazing incidence techniques
    V. Chamard, T. H. Metzger, E. Bellet-Amalric, B. Daudin, H. Mariette
    Mat. Science and Engineering B93, 24 (2002)
  100. Pure silica BETA colloidal zeolite assembled in thin films
    S. Mintova, M. Reinelt, T. H. Metzger, J. Senker and T. Bein
    Chem. Comm. 326, Dec. (2002)
  101. Structure and ordering of GaN quantum dot multiplayer investigatedby X-ray grazing incidence techniques
    V.Chamard, T.H.Metzger, C.Ferrero, E.Bellet-Amalric, B.Daudin, H.Mariette, G.Mula
    Physica E 13, 1115 (2002)
  102. Growth of highly strained germanium dots on Si.001. covered by a silicon nitride layer
    M. Derivaz, P. Noe´ , R. Dianoux, and A. Barski, T. Schulli and T. H. Metzger
    Appl. Phys. Lett. 81, 3843 (2002)
  103. Self-organized semiconductor nanostructures: Shape, strain and composition
    Stangl J.,Holy V.,Springholz G.,Bauer G.,Kegel I.,Metzger T.H.
    Materials Science and Engineering C 19, 349-358 (2002).
  104. Short range order of hydrocarbon chains in fluid phospholipid bilayers studied by X- ray diffraction from highly oriented membranes
    Spaar A, Salditt T
    Biophys J 85, 1576 (2003)
  105. X-ray analysis of temperature induced defect structures in boron implanted silicon
    Sztucki M, Metzger TH, Kegel I, Tilke A, Rouviere JL, Lubbert D, Arthur J, Patel JR
    J. Appl. Phys. 92, 3694 (2003)
  106. Field-induced pseudocrystalline ordering in concentrated ferrofluids
    Wiedenmann A, Hoell A, Kammel M, Boesecke P
    Phys. Rev. E 68, 31203 (2003)
  107. Anomalous diffraction in grazing incidence to study the strain induced GaN quantum dots stacked in an AlN multilayer
    V. Chamard, T. H. Metzger,M. Sztucki, M. Tolan, E. Bellet-Amalric, B. Daudin, C. Adelmann, H. Mariette
    NIMB 200, 95 (2003)
  108. Influence of the Si spacer layers on the structures of Ge/Si quantum dot bilayers
    X. Jiang, T.H. Metzger, M. Sztucki, Z. Jiang, W. Jiang, and D. Xian
    NIMB 200, 40 (2003)
  109. Size and ordering of sputtered Co nanoparticles in Co/Cu multilayers
    F. Spizzo, F. Ronconi, F. Albertini, F. Casoli, L. Pareti, G. Turilli, F. Bolzoni, A. Mazuelas, C. Ferrero, G. Ghiringhelli, A. Tagliaferri and H. Metzger
    NIMB 200, 142 (2003)
  110. Grazing incidence synschrotron X-ray diffraction study of crystal orientation in microporous films
    S. Mintova, T.H. Metzger, T. Bein
    NIMB 200, 160 (2003)
  111. Structural investigation of semiconductor nanostructures by X-ray techniques
    J. Stangl, A. Hesse,T. Roch, V. Holy, G. Bauer, T. Schuelli, T. H. Metzger
    NIMB 200, 11 (2003)
  112. Fe-containing mesoporous films for carbon nanotubes
    Petkov N, Mintova S, Karaghiosoff K, Bein T
    Mater. Sci. and Eng. C 23, 145 (2003)
  113. Anomalous X-ray diffraction studies of Sr2+ hydration in aqueous solution
    Ramos S, Neilson GW, Barnes AC, Capitan MJ
    J. Chem. Phys. 118, 5542 (2003)
  114. Liquid-peptide interaction in oriented bilayers probed by interface sensistive scattering methods
    Salditt T
    Current Opinion in Struct. Biology 13, 467 (2003)
  115. Thermal fluctuations and positional correlations in ordered lipid membranes
    Salditt T, Vogel M, Fenzl M
    Phys. Rev. Lett. 90, 178101 (2003)
  116. Depth resolved investigations of boron implanted silicon
    M.Sztucki, T.H.Metzger , S.Milita, F.Berberich, N.Schell, J.L.Rouviere , J.Patel
    NIMB 200, 52 (2003)
  117. Focusing crystal analyser for the rejection of inelastic X-ray scattering
    M. A. Hamilton, T. H. Metzger, a. Mazuelas and T. Buslaps
    J. Synchrotron Rad. 10, 255 (2003)
  118. Depth Profiling of the Lateral Pore Size and Correlation Distance in Thin Porous Silicon Layers by Grazing Incidence Small Angle X-ray Scattering
    C. Ferrero, M. Servidori, D. Thiaudière, S. Milita, S. Lequien, S. Sama, S. Setzu, and T. H. Metzger
    J. Electrochem. Soc. 150, E366 (2003)
  119. Crystal growth of nanosized zeolites in solutions and films: In –situ grazing incidence diffraction (GID) study using synchrotron X-ray radiation
    S.Mintova, B. Jean, T.H. Metzger, T. Bein
    J. Mat. Lett. 22, 751 (2003)
  120. Synthesis of colloidal AIPO4-18 crystals and their use for supported film growth
    M. Vilaseca, S. Mintova, V. Valtchec, T. H. Metzger,T. Bein
    J. Mat. Chem 13 1526 (2003)
  121. Stable Mesostructured Silicate Films Containing Nanosized Zeolite
    N. Petkov, S. Mintova, B. Jean, T. H. Metzger, T. Bein
    Chem. Mater. 15, 2240-2246 (2003)
  122. Direct Determination of Strain and Composition Profiles in SiGe Islands by Anomalous X-ray Diffraction at High Momentum Transfer
    T. U. Schulli, J. Stangl, Z. Zhong, R. T. Lechner, M. Sztucki, T. H. Metzger, and G. Bauer
    Phys. Rev. Lett. 90, 066105-1 (2003)
  123. Cell-wall recovery after irreversible deformation of wood
    Keckes J, Burgert I, Frühmann K, Müller M, Kölln K, Hamilton M, Burghammer M, Roth SV, Tschegg SS, Fratzl P
    Nature Materials 2, 811 (2003)
  124. Thin layers of columns of an amphiphilic hexa-peri-hexabenzocoronene at silicon wafer surfaces
    Kubowicz S, Pietsch U, Watson MD, Tchebotareva N, Mullen K, Thunemann AF
    Langmuir 19, 5036 (2003)
  125. Ultra small-angle X-ray scattering: conditions, limits and results in speckle experiments
    Livet F, Bley F, Ehrburger-Dolle F, Geissler E, Lebolloc'h D, Schulli T
    J. Appl. Cryst 36, 774 (2003)
  126. In-situ study of stress evolution during solid state reaction of Pd with Si(001) using synchrotron radiation
    Megdiche A, Gergaud P, Curtil C, Thomas O, Chenevier B, Mazuelas A
    Microelectron. Eng. 70, 436 (2003)
  127. Nanochannels in track-etched membranes
    Pepy G, Balanzat E, Jean B, Kuklin A, Sertova N, Toulemonde M
    J. Appl. Cryst. 36, 649 (2003)
  128. On the driving forces for the vertical alignment in nitride quantum dot multilayers
    V. Chamard, T.H. Metzger, M. Sztucki, V. Holy, M. Tolan, E.Bellet-Amalric, C. Adelmann, B. Daudin and H.Mariette
    Europhys. Lett. 63, 268 (2003)
  129. Structural study of self-assembled Co nanoparticles
    Y. Chushkin, M. Ulmeanu, S. Luby, and E. Majkova, I. Kostic, P. Klang and V.Holy, Z. Bochnicek, M. Giersig and M. Hilgendorff, T. H. Metzger
    J. Appl. Phys. 94, 12, (2003)
  130. Structural Properties of LTA Films assembled from Aluminosilicate clear solutions and dense gels: a GID X-ray study
    S. Mintova, V. Valtchev, N. Petkov, B. Jean, T.H. Metzger, T. Bein
    Stud. Surf. Sci. Catal. 154, 717 (2004)
  131. Pure silica BETA colloidal zeolite assembled in thin films
    S. Mintova, M. Reinelt, T. H. Metzger, J. Senker and T. Bein
    Chem Commun. 2003, 326–327
  132. Functionalized cubic mesostructured silica films
    N. Petkov, S. Mintova, B. Jean, T. Metzger, T. Bein
    Mater. Sci. and Eng. C 23, 827 (2003)
  133. Crystal growth of nanosized zeolites in solutions and films: In situ grazing incidence diffraction (GID) study using synchrotron X-ray radiation
    S. Mintova, B. Jean,T. H. Metzger, T. Bein
    J. Mat. Sci. Lett. 22, 751 (2003) I S TRY
  134. Synthesis of colloidal AlPO4 -18 crystals and their use for supported film growth
    M. Vilaseca, S. Mintova, V. Valtchev, T. H. Metzger and T. Bein
    J. Mater. Chem. 13, 1526–1528 (2003)
  135. In situ stress determination during a solid state reaction between Pd films and a Si substrate using synchrotron rad.
    Gergaud P, Megdiche M, Curtil C,Thomas O,Chenevier B, Mazuelas A
    Microel. Eng 70, 463 (2003)
  136. Thermal diffuse scattering in grazing incidence diffraction
    Grigorian SA, Grenzer J, Pietsch U, Vartanyants IA
    J. Phys. Cond. Matter 15, 3367 (2003)
  137. X-ray waveguides and thin macromolecular films
    T.Salditt, F.Pfeiffer, H.Perzl, A.Vix, U.Mennicke, A.Jarre, A.Mazuelas, T.H.Metzger
    Physica B-Cond.Matt. 336(1-2), 181 (2003)
  138. Stable Mesostructured Silicate Films Containing Nanosized Zeolite N. Petkov, S. Mintova, B. Jean, T. H. Metzger, and T. Bein
    Chem. Mater. 15, 2240-2246 (2003)
  139. Strain analysis of a quantum-wire system produced by cleaved edge overgrowth using grazing incidence X-ray diffraction
    M. Sztucki, T. U. Schulli, T. H. Metzger, V. Chamard, R. Schuster, D. Schuh
    Appl. Phys. Lett. 83, 5 (2003)
  140. Hardening precipitation in a Mg-4Y-3RE alloy
    Antion C, Donnadieu P, Perrard F, Deschamps A, Tassin C, Pisch A
    Acta Materialia 51, 5335 (2003)
  141. X-ray investigations of surface roughnesses
    Asadchikov VE, Kozhevnikov IV, Krivonosov YS
    Crystallogr. Rep. 48, 836 (2003)
  142. Diffuse X-ray rods and scattering from point defect clusters in ion implanted silicon
    Beck U, Metzger TH, Peisl J, Patel JR; Appl. Phys. Lett 83, 2489 (2003)
  143. Counterion distribution in urchinlike charged copolymer micelles Monte Carlo simulation and small angle X-ray scattering
    Belloni L, Delsanti M, Fontaine P, Muller F, Guenoun P, Mays JW, Boesecke P, Alba M
    J. Chem. Phys 119, 7560 (2003)
  144. Highly oriented, charged multilamellar membranes osmotically stressed by a polyelectrolyte of the same sign
    Brotons G, Salditt T, Dubois M, Zemb T
    Langmuir 19, 8235 (2003)
  145. Ordering parameters of self-organized three dimensional quantum dot lattices determined from anomalous X-ray diffraction
    R.T. Lechner, T. U. Schülli, V. Holy, G. Springholz, J. Stangl, A. Raab and G. Bauer, T.H. Metzger
    Appl. Phys. Lett. 84, 885 (2004)
  146. Structural properties of self-organized semiconductor nanostructures
    Stangl J, Holy V, Bauer G
    Rev .Mod. Phys. 76, 725 (2004)
  147. Structural properties of self-organized semiconductor nanostructures
    Stangl J, Schuelli TU, Hesse A, Holy V, Bauer G, Stoeffel M, Schmidt OG
    Adv. Solid State Phys. 44, 227 (2004)
  148. Structure of assemblies of metal nanowires in mesoporous alumina membranes studied by EXAFS, XANES, X-ray diffraction and SAXS
    Benfield RE, Grandjean D, Dore JC, Esfahanian H, Wu ZH, Kroll M, Geerkens M, Schmid G
    Faraday Discuss. 125, 327 (2004)
  149. The use of synchrotron radiation techniques in the characterization of strained semiconductor heterostructures and thin films
    Lamberti C
    Surf.Sci. Rep. 53, 1 (2004)
  150. Transmission electron microscopy study of the formation of FAU-type zeolite at room temperature
    Valtchev VP, Bozhilov KN
    J. Phys. Chem. B 108, 15587 (2004)
  151. X-ray diffuse scattering from self-organized mesoscopic semiconductor structures
    Schmidbauer M
    Springer Tracts in Mod.Phys 199, (2004)
  152. Strain distribution in nitride quantum dot multilayers
    V. Chamard, T Schulli, M. Sztucki, T. H. Metzger, E. Sarigiannidou, J.-L. Rouviere, M. Tolan, C. Adelmann, B. Daudin
    Physical Review B 69, 125327 (2004)
  153. Direct determination of strain and InGaAs nano-islands using anomalous incidence X-ray diffraction
    M. Sztucki, T.U. Schülli, T.H. Metzger, D. Schuh, V. Chamard
    Superlattices and Microstructures 36 11, (2004)
  154. Evolution of end-of-range defects in Si after Xe implantation grazing incidence diffuse X-ray scattering
    L. Capello, T.H. Metzger
    Materials Science and Engineering B 114-115, 77-81 (2004)
  155. Im Inneren von Halbleiter-Nanostrukturen; Wie sich Interdiffusion und Gitterdehnung auf der Nanometer-Skala messen lassen
    Julian Stangl, Tobias Schülli, Hartmut Metzger und Günther Bauer
    Physik Journal 3 Nr. 33, (2004)
  156. In-situ synchrotron studies of structural changes in wood during microtensile tests
    Keckes J, Burgert I, Frühmann K, Müller M, Kölln K, Hamilton M, Burghammer M, Roth SV, Tschegg SS, Fratzl P
    Proc. 2nd Internat. Symp. on Wood machining, p.37 (2004)
  157. Magnetic nanoparticles through organometallic synthesis: evolution of the magnetic properties from isolated nanoparticles to organised nanostructures
    Dumestre F, Martinez S, Zitoun D, Fromen MC, Casanove MJ, Lecante P, Respaud M, Serres A, Benfield RE, Amiens C, Chaudret B
    Faraday Discuss. 125, 265 (2004)
  158. Microstructure and morphology evolution in chemical solution deposited semiconductor films: 2. PbSe on As face of GaAs(111)
    Shandalov M, Golan Y
    Eur. Phys. J - Appl.Phys. 28, 51 (2004)
  159. Nanostructure and field-induced arrangement of magnetosomes studied by SANSPOL
    Hoell A, Wiedenmann A, Heyden U, Schueller D
    Physica B 350, e309 (2004)
  160. On the use of grazing incidence small angle X-ray scattering(GISAXS) in the morphological study of ion implanted materials
    d'Acapito F, Maurizio C, Gonella F, Mondelli C, Longo A, Martorana A, Mattei G
    J. Synchr. Rad. 11, 272 (2004)
  161. Application of X-ray scattering technique to the study of supersmooth surfaces
    Nuclear Instruments and Methods in Physics Research A 530, 575-595 (2004).
  162. Silicalite-1/polymer films with low-k dielectric constants
    Applied Surface Science 226, 155-160 (2004).
  163. Strain determination in multilayers by complementary anomalous X-ray diffraction
    Physical Review B 69, 195307 (2004).
  164. AlPO4-18 synthesized from colloidal precursors and its use for the preparation of thin films
    Applied Surface Science 226, 1-6 (2004).
  165. Giant linear Fresnel Zone Plate as a hard X-ray condenser
    A. Mazuelas, A. Snigirev, I. Snigireva, C. David, P. Boesecke, H. Djazouli T.H. Metzger
    Proceedings of SPIE Vol. 5539, 259 (2004)
  166. 3D hexagonal versus trigonal ordering in self-organized PbSe quantum dot superlattices
    Lechner RT, Schulli TU, Holy V, Stangl J, Raab A, Springholz G, Bauer G
    Physica E (2004) ***
  167. Biomimetic membranes of lipid-peptide model systems prepared on solid support
    Li CH, Constantin D, Salditt T
    J.Phys.Cond.Matter. 16, S2439 (2004)
  168. Biomolecular and amphiphilic films probed by surface sensitive X-ray and neutron scattering
    Salditt T, Brotons G
    Analytical and Bioanalytical Chem. 379, 960 (2004)
  169. Conformation of peptides in lipid membrane studied by X-ray grazing incidence scattering
    Spaar A, Muenster C, Salditt T
    Biophys. J 87, 396 (2004)
  170. Epitaxial MgB2 thin films on ZrB2 buffer layers: structural characterization by synchrotron radiation
    Ferrando V, Tarantini C, Bellingeri E, Manfrinetti P, Pallecchi I, Marre D, Plantevin O, Putti M, Felici R, Ferdeghini C
    Supercond. Sci. Technol. 17, 1434 (2004)
  171. Thermal fluctuations and stability of solid-supported lipid membranes
    Salditt T
    J.Phys. Cond. Matter. 17, R287 (2005)
  172. Upper critical fields up to 60 T in dirty magnesium diboride thin films
    Ferdeghini C, Ferrando V, Tarantini C, Bellingeri E, Grasso G, Malagoli A, Marre D, Putti M, Manfrinetti P, Pogrebnyakov A, Redwing JM, Xi XX, Felici R, Haanappel E
    IEEE Trans. On Appl.Superconductivity 15, 3234 (2005)
  173. Zeolite beta films sintesized from basic and near-neural precursor sollutions and gels
    Mintova S, Tosheva L, Hozl M, Metzger TH, Valtchev V, Bein T
    Mat. Sci. Eng.C 25, 570 (2005)
  174. Synchrotron X-ray studies of vitreous SiO2 over Si(001). I. Anisotropic glass contribution
    M. Castro-Colin, W. Donner, S. C. Moss, Z. Islam, S. K. Sinha, R. Nemanich, H. T. Metzger, P. Bösecke, and T. Schülli
    Physical Review B 71, 045310 (2005)
  175. Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous X-ray diffraction and reciprocal space mapping
    T. U. Schülli, M. Stoffel, A. Hesse, J. Stangl, R. T. Lechner, E. Wintersberger, M. Sztucki, T. H. Metzger, O. G. Schmidt, and G. Bauer
    Phys. Rev. B 71, 035326 (2005)
  176. X-ray methods for strain and composition analysis in self-organized semiconductor nanostructures
    Till Hartmut Metzger, Tobias Urs Schülli and Martin Schmidbauer
    C. R. Physique 6 , 47–59 (2005)
  177. Effect of crystal morphology on the orientation of LTL-type zeolite films
    O. Larlusa, L. Tosheva, M. Hölzl, S. Mintova, T. Metzger, V. P. Valtchev;
    Stud. Surf. Sci. Catal. (2005) ***
  178. Effect of in-flight annealing and deposition method on gas-sensitive SnOx films made from size-selected nanoparticles
    M. K. Kennedy, F. E. Kruis, H. Fissan, H. Nienhaus, A. Lorke, T. H. Metzger
    Sensors and Actuators B 108, 62 (2005)
  179. Ordered micro/mesoporous composite prepared as thin films
    Petkov N, Holzl M, Metzger TH, Mintova S, Bein T
    JOURNAL OF PHYSICAL CHEMISTRY B 109, 4485-4491 (2005)
  180. X-ray Scattering from Self-Assembled InAs Islands
    A. Malachias, B. R. A. Neves, W. N. Rodrigues, M. V. B. Moreiro, S. Kyciay, T. H. Metzger, and R. Magalhaes-Paniago
    Brazilian Journal of Physics 34, 571 (2005)
  181. SARS E protein in phospholipid bilayers: an anomalous X-ray reflectivity study
    Z. Khattari, G. Brotons, E. Arbely, I.T. Arkin, T.H. Metzger, T. Salditt
    Physica B 357, 34–38 (2005)
  182. Shape, strain, and ordering of lateral InAs quantum dot molecules
    B. Krause and T. H. Metzger, A. Rastelli, R. Songmuang, S. Kiravittaya, and O. G. Schmidt
    Phys. Rev. B 72, 085339 (2005)
  183. Magnetic target nanoparticles for cancer therapy with neutrons and Synchrotron Radiation
    Nawroth T, Boesecke P, Bravin A, Corde S, LeDuc G, Grillo I, May RP
    Proc. Conf. Neutrons in Biology (2005)
  184. Monodisperse bile-salt nanotubes in water: Kinetics of formation
    Jean B, Oss-Ronen L, Terech P, Talmon Y
    Adv. Mater. 17, 728 (2005)
  185. Nondestructive identification of colloidal molecular sieves stabilized in water
    Mihailova B, Mintova S, Karaghiosoff K, Metzger T, Bein T
    J. Phys. Chem. B 109, 17060 (2005)
  186. Softer and soft X-rays in macromolecular crystallography
    Alexiou C, Schmid RJ, Jurgons R, Kremer M, Wanner G, Bergemann C, Huenges E, Nawroth T, Arnold W, Parak FG
    J. Synchr. Rad 12, 410 (2005)
  187. Spontaneous lateral modulation in short-period superlattices investigated by grazing- incidence X-ray diffraction
    Caha O, Mikulik P, Novak J, Holy V, Moss SC, Norman A, Mascarenhas A, Reno JL, Krause B
    Phys.Rev.B 72, 35313 (2005)
  188. Strain induced changes in the magnetic phase diagram of metamagnetic heteroepitaxial Eu/Se/PbSe1-xTex multilayers
    Lechner RT, Springholtz G, Schuelli TU, Stangl J, Schwartzl T, Bauer G
    Phys. Rev. Lett. 94, 157201 (2005)
  189. Solid-phase epitaxial regrowth of a shallow amorphised Si layer studied by X-ray and medium energy ion scattering
    L. Capello, T.H. Metzger, M. Werner , J.A. van den Berg , M. Servidori , M. Herden, T. Feudel
    Materials Science and Engineering B 124–125, 200 (2005)
  190. X-ray study of atomic ordering in self-assembled Ge islands grown on Si(001)
    A.Malachias, T. U. Schülli, G. Medeiros-Ribeiro, L. G. Cançado, M. Stoffel, O. G. Schmidt, T. H. Metzger, and R. Magalhães-Paniago
    Phys. Rev. B 72, 165315 (2005)
  191. Coherent X-ray diffraction from quantum dots
    I. A. Vartanyants, I. K. Robinson, J. D. Onken, M. A. Pfeifer, G. J. Williams, F. Pfeiffer, H. Metzger, Z. Zhong, and G. Bauer
    Phys. Rev. B 71, 245302 (2005)
  192. Measurement of Si 311 defect properties using X-ray scattering
    K. Nordlund, T. H. Metzger, A. Malachias, and L. Capello, P. Calvo and A. Claverie; F. Cristiano
    J. Appl. Phys. 98, 073529 (2005)
  193. Zeolite beta films synthesized from basic and near-neutral precursor solutions and gels
    L. Tosheva , M. Holzl , T.H. Metzger , V. Valtchev , S. Mintova , T. Bein
    Materials Science and Engineering C 25, 570 – 576 (2005)
  194. Anomalous X-ray diffraction from self-assembled PbSe/PbEuTe quantum dots
    Holy V, Schulli TU, Lechner RT, Springholz G, Bauer G
    J. Alloys & Compounds 401, 1 (2005)
  195. Coherent X-ray scattering and speckle pattern of solid-supported multilayers of surfactant bilayers
    Brotons G, Constantin D, Madsen A, Salditt T,
    Physica B 357, 61 (2005)
  196. Differential anomalous X-ray scattering studies of amorphous In-Se
    Jablonska A, Burian A, Metzger TH, LeBolloc'h D, Hamilton M, Raoux D
    J. Alloys Compounds , 401, 41 (2005)
  197. Grazing Incidence diffrcation strain analysis of laterally patterned Si wafers treated focused ge and Au ion beam implantation
    Grenzer J, Pietsch U, Bischoff L
    Phys. Stat. Sol. A 202, 1009 (2005)
  198. High temperature investigation of Si/SiGe based cascade structures using X-ray scattering methods
    Meduna M, Novak J, Falub CV, Chen G, Bauer G, Tsujino S, Gruetzmacher D, Mueller E, Campidelli Y, Kermarrec O, Bensahel D, Schell N
    J.Phys.D-Appl. Phys. 38, a121 (2005)
  199. In-situ WAXS studies of structural changes in wood foils and in individual wood cells during microtensile tests
    Keckes J, Burgert I, Frühmann K, Müller M, Kölln K, Hamilton M, Burghammer M, Roth SV, Tschegg SS, Fratzl P
    Fibre Diff. Rev. 13, 48 (2005)
  200. Pseudoepitaxial transrotational structures in 14 nm-thick NiSi layers on [001] silicon
    Alessandra Alberti, Corrado Bongiorno, Brunella Cafra, Giovanni Mannino, Emanuele Rimini, Till Metzger, Cristian Mocuta, Thorsten Kammler and Thomas Feudel
    Acta Cryst. B 61, 486–491(2005).
  201. Local order in Pt–47 at. % Rh measured with X-ray and neutron scattering
    Ch. Steiner, B. Schönfeld, M. J. Portmann, M. Kompatscher, G. Kostorz, A. Mazuelas, T. Metzger, J. Kohlbrecher, and B. Demé
    Phys. Rev. B 71, 104204 (2005)
  202. X-ray spectroscopy and X-ray diffraction at wavelengths near the K-absorption edge of phosphorus
    Biou V, Bosecke P, Bois JM, Brandolin G, Kahn R, Mas C, Nauton L, Nury H,Pebay- Peyroula E, Vicat J, Stuhrmann H
    J. Synchr. Rad. 12, 402 (2005)
  203. A microfluidic setup for studies of solid-liquid interfaces using X-ray reflectivity and fluorescence microscopy
    Reich C, Hochrein MB, Krause B, Nickel B
    Rev. Sci. Instrum 76, 959103 (2005)
  204. An anomalous X-ray diffraction study of the hydration structures of Cs+ and I- in concentrated solutions
    Ramos S, Neilson GW, Barnes AC, Buchanan P
    J. Chem. Phys 123, 214501 (2005)
  205. Structural changes during tensile testing of an all-cellulose composite by in-situ synchrotron X-ray diffraction
    Gindl W, Martinschitz KJ, Boesecke P, Keckes J
    Composite Sci. and Technol. 66, 2639 (2006)
  206. Structure and mobility of lipid membranes on a thermoplastic substrate
    Hochrein MB, Reich C, Krause B, Radler JO, Nickel B
    Langmuir 22, 538 (2006)
  207. Structure of antimicrobial peptites in oriented lipid membranes probed by X-ray scattering
    Salditt T, Li C, Spaar A
    Biophys. Biochim. Acta in press(2006)
  208. Structure of two-component lipid membranes on solid support: an X-ray reflectivity study
    Novakova E, Giewekemeyer K, Salditt T
    Phys. Rev. E 74, 051911 (2006)
  209. X-ray diffraction of charge density wave under large electric current
    LeBolloc'h D, S.Ravy, J.Dumas, F.Picca, J.Marcus, F.Livet, N.Kirova, N.Marsy, C.Mocuta
    Proc. Workshop low dim. charge density wave conductors (2006)
  210. Temperature influence on the production of nanodot patterns by ion beam sputtering of Si(001)
    R. Gago, L. Vázquez, O. Plantevin, J. A. Sánchez-García, M. Varela, M.C. Ballesteros, J. M. Albella, and T. H. Metzger
    Phys. Rev. B 73, 155414 (2006)
  211. Strain and composition of ultrasmall Ge quantum dots studied by X-ray scattering and in situ surface X-ray absorption spectroscopy
    R. Dujardin, V. Poydenot, T. U. Schülli, G. Renaud, O. Ulrich, A. Barski, M. Derivaz, S. Colonna, and T. Metzger
    J. Appl. Phys. 99, 063510 (2006)
  212. Efficient High Area OFETs by Solution Based Processing of a PI- Electron Rich Donor
  213. P. Miskiewicz, M. Mas-Torrent, J. Jung, S. Kotarba, I. Glowacki, E. Gomar-Nadal, D. B. Amabilino, J. Veciana, B. Krause, D. Carbone, C. Rovira, and J.Ulanski
    Chem. Mater. 18,  4724  (2006)
  214. Investigation of shape, strain, and interdiffusion in InGaAs quantum rings using grazing incidence X-ray diffraction
    Michael Sztucki, Till Hartmut Metzger,Virginie Chamard, Anke Hesse, and Václav Holý
    J. Appl. Phys. 99, 033519 (2006)
  215. Strain determination in MBE-grown InAs quantum wires on InP
    A. Mazuelas, L. González, J. M. García, Y. González, T. Schuelli, C. Priester, and H. T. Metzger
    Phys. Rev. B 73, 045312 (2006)
  216. Structural properties of ion-implanted silicon studied by combined X-ray scattering methods
    L. Capello, T.H. Metzger, V. Holý , M. Servidori , A. Malachias
    J. Appl. Cryst. 39, 571–581 (2006)
  217. Distribution of local strain and density in a nanocrystal reconstructed from coherent X-ray diffraction with a focused beam
    Chamard V, M. Dolle, G. Baldinozzi, F. Livet, M. de Boissieu, F. Bley, P. Donnadieu, T.H.Metzger, C. Mocuta, F. Picca, S. Labat, O. Thomas
    Phys. Rev. Lett. submitted (2006)
  218. Effect of molecular weight on the structure and crystallinity of poly(3-hexylthiophene)
    Zen A, Saphiannikova M, Neher D, Grenzer J, Grigorian S, Pietsch U, Asawapirom U, Janietz S, Scherf U, Lieberwirth I, Wegner G
    Macromolecules 39, 2162 (2006)
  219. Elasticity of fluctuating charged membranes probed by X-ray grazing incidence diffuse scattering Brotons G, Belloni L, Zemb Th, Salditt T
    Europhys. Lett. 75, 992 (2006)
  220. Hexagonally ordered ammonium lithocholate self-assembled nanotubes with highly monodisperse sections
    Terech P, Jean B, Ne F
    Advanced Mater. 18, 1571 (2006)
  221. Microstructural anisotropy at the ion-induced rippled amorphous / crystalline interface of silicon
    Grigorian S, Grenzer J, Datta DP, Hazra S, Chini TK, Sanyal MK, Pietsch U
    Appl. Phys. Lett. 89, 231915 (2006)
  222. SARS coronavirus E protein in phospholipid bilayers: an X-ray study
    Khattari Z, Brotons G, Akkawi M, Arbely E, Arkin IT, Salditt T
    Biophys. J 90, 2038 (2006)
  223. Local structure of a rolled-up single crystal: an X-ray microbeam diffraction study of individual semiconductor nanotubes
    B. Krause, C. Mocuta, and T. H. Metzger, Ch.Deneke and O. G. Schmidt
    Phys. Rev. Lett. 96, 165502 (2006)
  224. Zero-strain GaAs quantum-dot molecules as investigated by X-ray diffuse scattering
    M.Hanke, M.Schmidbauer, D.Grigoriev, P.Schafer, R. Kohler, Zh.M.Wang, Yu.I.Mazur, G.J.Salamo, T.H.Metzger
    Appl.Phys. Lett. 89, 053116 (2006)
  225. Strain and composition of ultrasmall Ge quantum dots studied by X-ray scattering and in situ surface X-ray absorption spectroscopy
    R. Dujardin,Poydenot, T. U. Schülli, G. Renaud, O. Ulrich, and A. Barski, M. Derivaz, S. Colonna, T. Metzger
    J. Appl. Phys. 99, 063510 (2006)
  226. Coherent X-ray Diffraction Imaging Experiment on ID01 at ESRF
    A. Schropp1, I. Vartanyants, C. G. Schroer, E. Weckert, C. Mocuta, T. Metzger, O. Kurapova
    Proc. 8th Int. Conf. X-ray Microscopy IPAP Conf. Series 7 pp.383-385 (2006)
  227. Influence of pre-amorphization on the structural properties of ultra-shallow arsenic implants in silicon
    L. Capello, T. H. Metzger, M. Werner, J. A. van den Berg, M. Servidori, L. Ottaviano, C. Spinella, G. Mannino, T. Feudel, M. Herden; accepted
    J. Appl. Phys. 100, 103533 (2006)
  228. A novel gas-filled detector for synchrotron radiation applications
    Kocsis M, Boesecke P, Carbone D, Herve C, Becker B, Diawara Y, Durst R, Khazins D, He B, Medved S, Sedov V, Thorson T, Wachter G
    Nucl. Instrum. Meth. 563, 172 (2006)
  229. Changes in microfibril angle in cyclically deformed dry coir fibers studied by in-situ synchrotron X-ray diffraction
    Martinschitz KJ, Bösecke P, Gravey C, Gindl W, Keckes J
    J. Mater. Sci in press (2006)
  230. Combined studies of gratings by X-ray reflectivity, GISAXS and AFM
    Yan M., Bardeau J.F., Brotons G., Metzger H., Gibaud A.
    KEK Japan (2006)
  231. Guided self-assembly of lateral InAs/GaAs quantum-dot molecules for single molecule spectroscopy
    L. Wang, A. Rastelli, S. Kiravittaya, R. Songmuang, O. G. Schmidt, B. Krause, T. H. Metzger
    Nanoscale Res. Lett. 1, 74 (2006)
  232. Temperature influence on the production of nanodot patterns by ion beam sputtering of Si(001) R. Gago, L. Vázquez, O. Plantevin, J. A. Sánchez-García, M. Varela, M. C. Ballesteros, J. M. Albella & T. H. Metzger
    Phys. Rev. B 73, 155414 (2006)
  233. Order enhancement and coarsening of self-organized silicon nanodot patterns induced by ion-beam sputterin R. Gago, L. Vázquez, O. Plantevin, T. H. Metzger, J. Muñoz-García, R. Cuerno & M. Castro Appl. Phys. Lett. 89, 233101 (2006)
  234. Multiple-length-scale small-angle X-ray scattering analysis on maghemite nanocomposites A. Millan, A. Urtizberea, NJD Silva, P. Boesecke, E. Natividad, F. Palacio, E. Snoeck, L. Soriano, A. Gutiérrez, C Quirós J. Appl. Cryst. 40, S696-S700 (2007).
  235. Defect cores investigated by X-ray scattering close to forbidden reflections in silicon M.-I. Richard, T. H. Metzger, V. Holý & K. Nordlund  Phys. Rev. Lett. 99, 225504 (2007).