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Accurate strain measurements in highly strained Ge microbridges

Gassenq A., Tardif S., Guilloy K., Dias G.O., Pauc N., Duchemin I., Rouchon D., Hartmann J.M., Widiez J., Escalante J.M., Niquet Y.M., Geiger R., Zabel T., Sigg H., Faist J., Chelnokov A., Rieutord F., Reboud V., Calvo V.,
Applied Physics Letters 108, 241902-1-241902-4 (2016)