Nanotech and High Tech Materials

The ESRF has a long tradition in exploring assemblies of nano-objects by looking at the average properties of a sample. Today, thanks to the dramatic progress in instrumentation and methods, we are focussing more on individual nano objects. Progress in automation and throughput will allow users to produce statistics over a large number of objects, allowing conventional X-ray-based techniques to be used in combination with local probes. Such possibilities are changing the way X-ray based techniques contribute to nanoscience. Today we are still only using 5% of the X-ray beam when going to the smallest beam sizes. In the future, thanks to the ultra-low emittance of ESRF–EBS, we will be able to use most of the photons produced by the source and thus benefit from higher temporal and spatial resolution, throughput and sensitivity.

  • Identification of nanostructures for hgh-density data storage.
  • Characterisation of nanowires ofr new device technologies.
  • Designing 3D integrated structures for next-generation semiconductor devices.
  • Better understanding of how nanoparticles enter biological cells.