ID03 - Surface Diffraction Beamline


The beamline is dedicated to the in-situ studies of the structure and morphology of surfaces. It hosts two diffractometers, one for UHV studies and one that can host different user-specific apparatuses. Real-time experiments are possible, giving the possibility of studying growth processes or reaction at surfaces (as heterogenous catalysis).
Status:  open


  • Physics
  • Chemistry
  • Environmental Sciences
  • Life Sciences


  • Surface science
  • Nanoscience
  • Catalysis
  • Liquid-solid interfaces
  • Solid-Solid interfaces
  • Growth
  • Surface phase transitions


  • SXRD - surface X-ray diffraction
  • GID - grazing incidence diffraction
  • XRR - X-ray reflectivity
  • GISAXS - grazing incidence small-angle scattering
  • Anomalous diffraction
  • Resonant diffraction
  • DAFS - diffraction anomalous fine structure
  • MOKE - magnetic optical Kerr effect

Energy range

  • 5.0 - 30.0  keV

Beam size

  • Minimum (H x V) : 3.0 x 2.0  µm²
  • Maximum (H x V) : 600.0 x 600.0  µm²

Sample environments

  • UHV end station:
  • -Pressure range 10^-10 mbar - 1 bar
  • -T range 15K - 2000K
  • -Quartz balance
  • -Auger electron spectroscopy (AES)
  • -e-beam evaporators
  • -Knudsen cells
  • Flow reactor
  • -pressure range: min pressure 10^-9 mbar
  • -pressure range in flow conditions: 10 mbar - 2 bars (up to 5 is possible)
  • -mass flow controller for oxygen, carbon mono-oxide, argon, methane, and other gases on request
  • -T range 300K - 1200K
  • -ion sputtering
  • -e-beam evaporator
  • -Mass spectrometer
  • Batch reactor
  • -pressure range 1*10^-9 mbar - 3 bars
  • -T range 300K - 1200K
  • -ion sputtering
  • -mass spectrometer
  • Batch reactor for harsh conditions (suitable for use with HCl, H2S gases and similar)
  • -pressure range 1*10^-9 mbar - 3 bars
  • -T range 300K - 1200K
  • -ion sputtering
  • -mass spectrometer


  • Maxipix 2D pixel detector standard on both diffractometers
  • Scintillator counter with energy analyzer
  • Avalanche photodiode
  • FReLon CCD camera
  • MAR CCD camera
  • Sensicam

[1] S. Ferrer and F. Comin, "Surface diffraction beamline at the ESRF", Review of Scientific Instruments 66 (1995) 1674-1676. [2] P. Bernard, K. Peters, J. Alvarez, et al., "Ultrahigh vacuum high pressure chamber for surface x-ray diffraction experiments", Review of Scientific Instruments 70 (1999) 1478-1480. [3] O. Balmes, R. van Rijn, D. Wermeille, A. Resta, L. Petit, H. Isern, T. Dufrane, R. Felici, "The ID03 surface diffraction beamline for in-situ and real-time X-ray investigations of catalytic reactions at surfaces", Catalysis Today 145 (2009) 220-226. [4] R. van Rijn, M.D. Ackermann, O. Balmes, T. Dufrane, A. Geluk, H. Gonzalez, H. Isérn, E. de Kuyper, L. Petit, V.A. Sole, D. Wermeille, R. Felici, and J.W.M. Frenken, "Ultrahigh vacuum/high-pressure flow reactor for surface x-ray diffraction and grazing incidence small angle x-ray scattering studies close to conditions for industrial catalysis", Review of Scientific Instruments 81 (2010) 014101-1-014101-8.

Latest publications

View all publications
Metal ion-exchange on the muscovite mica surface

de Poel W., Vaessen S.L., Drnec J., Engwerda A.H.J., Townsend E.R., Pintea S., de Jong A.E.F., Jankowski M., Carlà F., Felici R., Elemans J.A.A.W., van Enckevort W.J.P., Rowan A.E., Vlieg E.,
Surface Science 665, 56-61 (2017)