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Characterization of Al-implanted Si wafers by using high resolution grazing emission x-ray fluorescence combined with synchrotron radiation

last modified 21-01-2009 11:56

Ph.D Student Yves Kayser, Ph.D Student Wei Cao, Prof. Dr. Jean-Claude Dousse, Dr. Joanna Hoszowska, Ph.D Student Pavel Jagodzinski, Dr. Matjaz Kavcic, Dr. Aldona Kubala-Kukus, Prof. Dr. Marek Pajek Jean-Luc Schenker, Dr. Jakub Szlachetko

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European Synchrotron Radiation Facility