Recollection of contributions to the

Workshop on the Coupling of Synchrotron Radiation IR and X-rays with Tip based Scanning Probe Microscopies

 

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 held at the ESRF -  Grenoble - France
on 16 - 18 November 2005
 
Wednesday, 16 November 2005
Introduction: Motivation of the workshop F Comin - ESRF - Grenoble - France
Photon detection

Element-Specific Contrast in Local Probe Microscopy via X-Ray Spectroscopy: Present Status and Future Perspectives

 J Purans - ISSP - Riga -Latvia

Scanning µ-x ray excited luminescence in semiconductors

 G Martinez-Criado  -ESRF - Grenoble - France

First Attempt to Use Conductive AFM for chemical nanocharacterizing

 

 V Sammelselg - University of Tartu - Estonia
Thursday, 17 November 2005
Electron detection

Combination of Atomic Force Microscopy and X ray beam : experimental set up and objectives

 J Chevrier - UJF LEPES - Grenoble - France

Towards Charge and Photon Imaging of Nanostructures Using X-UV Pumped Scanning Probe

 B Hamilton - School of Electrical Engineering and Electronics - Manchester - UK
Coupling of Scanning Tunneling Microscope with Hard X-ray Micro-Beam from 27m Long Undulator at SPring-8 A Saito - Osaka University & RIKEN/SPring8 - Osaka - Japan

Combination of Scanning Probe Microscope and X-rays for Detection of Electrons

 O Dhez - OGG, INFM/CNR - Grenoble - France
Instrumentation development and related issues
Towards Soft X-ray Scanning Microscopy Using Tapered Capillaries & Laser-Based High-Harmonic Sources W S Brocklesby -Optoelectronics Research Centre - Southampton University - UK
Near-field Magneto-optical Microscopy L M Alvarez-Prado - Departamento de Fisica - Ovieado - Spain
Poster session
Development of Laboratory Setup for X-Ray/AFM Experiments A Kuzmin - Institute of Solid State Physics - Riga - Latvia
Towards X-Ray Diffraction on Single Islands K Mundboth - ESRF - Grenoble - France
Nano-XEOL using near-field detection D Pailharey -  CRMC-N - CNRS -Marseille - France
Local collection with a STM tip of photoelectrons emitted by a surface irradiated by visible or UV laser beam D Tonneau - CRMCN - Faculté des sciences de Luminy - Marseille - France

Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

 P Chrétien - Laboratoire de génie électrique de Paris - Paris - France
Poster  
Poster  
Friday, 18 November 2005
IR-SNOM

Near-Field Scanning Optical Microscopy: a Brief Overview

 S Huant - UJF Grenoble & CNRS - Grenoble - France
Chemically Resolved Imaging of Biological Cells and Thin Films by Free Electron Laser Infrared Scanning Near-Field Optical Microscopy A Cricenti - ISM-CNR - Rome - Italy
From apertureless near-field optical microscopy to infrared near-field night vision Y DeWilde - ESPCI - Paris - France

Edge Radiation IR end station at ESRF

 J Susini - ESRF - Grenoble - France