The beamline provides a high-brilliance beam focused down to nanometer size, allowing quantitative 3D characterization of the morphology and the elemental composition of specimens in their native state by combining coherent imaging techniques and X-ray fluorescence microscopy.
Status:
open
Disciplines
Materials and Engineering
Medicine
Environmental Sciences
Earth and Planetary Sciences
Physics
Life Sciences
Applications
Biomedicine
Environmental sciences
Energy
Nanotechnology
Advanced materials
Techniques
Coherent imaging
Tomography
MicroXRF - micro X-ray fluorescence
Scanning transmission X-ray microscopy
Imaging, phase-contrast
Energy range
17.0
- 33.6
keV
Beam size
Minimum (H x V) : 30.0
x 30.0
nm²
Maximum (H x V) : 400.0
x 400.0
µm²
Detectors
Fluorescence: two six elements silicon drift diode detectors
Imaging 1: high-resolution imaging detector lens-coupled to a FReLoN F_K4320 (2048x2048 pixels, 1.1 um pixel size)
Imaging 2: high-resolution imaging detector lens-coupled to a FReLoN F_E230-84 (4096x4096 pixels, 1.5 um pixel size) and to a SVCam-HR16070 (4864x3232 pixels, 1.5 um pixel size)
Far-field Ptychography: hybrid detector with 4 modules MAXIPIX detector