Figure 77

Fig. 77: Full Rietveld structure refinement of a diffraction spectrum of MgSiO₃ at 86 GPa and 2310 K integrated from an image plate exposed for 10 minutes using a monochromatic beam focussed to 10 µm x 15 µm. Sample and platimum (the pressure calibrant) reflections are shown by lower and upper ticks respectively.