ID01 - Microdiffraction imaging


ID01 is a x-ray diffraction and scattering beamline, devoted to the study of a wide variety of materials, from nanostructures to bulks, with the ability to perform imaging and strain studies using coherent x-ray diffraction methods and/or nanodiffraction. ID01 is also dedicated to SAXS, GID, GISAXS and anomalous scattering studies.
Status:  open


  • Materials and Engineering
  • Physics
  • Chemistry
  • Environmental Sciences
  • Medicine


  • Materials science
  • Condensed matter physics


  • XRD - X-ray diffraction
  • CDI - coherent diffraction imaging
  • SAXS - small-angle X-ray scattering
  • GISAXS - grazing incidence small-angle scattering
  • GID - grazing incidence diffraction
  • Anomalous scattering

Energy range

  • 6.0 - 24.0  keV

Beam size

  • Minimum (H x V) : 150.0 x 100.0  nm²
  • Maximum (H x V) : 6.0 x 1.0  mm²

Sample environments

  • Nanotranslations stages
  • Furnace (T < 1000°C)
  • He miniflow cryostat (T > 2.5K)


  • 0D: Cyberstar NaI scintillation detector
  • 0D: APD
  • 0D: Roentec
  • 0D: Amptek
  • 2D: Maxipix pixel detector
  • 2D: Andor fiber optics CCD

Technical details

For XRD, the beamline offers nanodiffraction (Fresnel zone plates), microdiffraction (beryllium lenses), and coherent X-ray diffraction. A high-precision Huber diffractometer is available. The sample stage is installed on a granite table for stability requirements and is decoupled from the lifting detector arm. A compact hexapod is on top of the sample stage for fine alignment of the sample. Piezo stages with capacitive encoders for high precision nanotranslations are on top of the hexapod. 0D, 1D and 2D detectors are available, including a 4x4 chips Maxipix pixel detector. In-situ cooling, heating  are available at ID01.

[1] Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with threedimensional reciprocal space mapping, G. A. Chahine M.-I. Richard, R. A. Homs-Regojo, T. N. Tran-Caliste, D. Carbone, V. L. R. Jacques, R. Grifone, P. Boesecke, J. Katzer, I. Costina, H. Djazouli, T. Schroeder and T. U. Schülli, J. Appl. Cryst. 47, 762 (2014).

[2] Full-field X-ray diffraction microscopy using polymeric compound refractive lenses, J. Hilhorst, F. Marschall, T. N. Tran Thi, A. Last and T.  U. Schülli, J. Appl. Cryst. 47, 1882 (2014).

[3] Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy, G. A. Chahine, M. H. Zoellner, M.-I. Richard, S. Guha, C. Reich, P. Zaumseil, G. Capellini, T. Schroeder, and T. U. Schülli, Appl. Phys. Lett. 106,  071902 (2015).


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