xop extensions

XOP Extensions

XOP extension" is a software package which is not part of the XOP standard distribution, but it can be installed optionally and run under the XOP interface.

The main XOP contains more than 20 applications that are distributed and installed with the main XOP distribution. These aplications are small in disk-space requirements and of simple use. The problem arises with other

applications that are sophisticated software packages and require larger software resources. Their inclusion in XOP is suitable because their functionality is well suited with the philosophy of XOP and in addition many of them have been designed using the concept and perhaps the libraries of XOP. However, their less-general functionality, dimension and perhaps structure make difficult the inclusion of all of them in XOP on a permanent basis. For these applications, we created the possibility to extend XOP optionally with other applications, that can be launched and used from XOP but require special installation (not distributed with XOP).

See the instructions under the different subdirectories in the "extensions" directory at the XOP ftp directory

Available extentions in XOP 2.3

• SHADOWVUI Visual User Interface for the SHADOW ray tracing package.
  

• XAID - XAFS data analysis tools (not yet available in xop 2.3 Beta)

• TOPO - Surface and profile analysis (D. Windt) (not yet available in xop 2.3 Beta)

• IMD - Multilayers (D. Windt) (not yet available in xop 2.3 Beta)

• INES - Inelastic x-ray scattering (not yet available in xop 2.3 Beta)

• NOP -Neutron OPtics (not yet available in xop 2.3 Beta)

SHADOWVUI

SHADOWVUI is a Visual User Interface for the SHADOW ray tracing package

Available for Windows and Unix platforms.

 
More information available in the SHADOWVUI page 

XAID

XAID is a package to perform XAFS data analysis

Available for Windows (download) and Unix (download) platforms.

INES

INES (INElastic Scattering) is a program for data substraction and data analysis of nuclear inelastic scattering data, by L. Pasquini and A. Barla (INES interface by V. Favre-Nicolin and M. Sanchez del Rio).

on-line manual

Available for Windows (download) and Unix (download) platforms.

NOP

NOP (Neutron OPtics Scattering) is a collection of programs for calculating characteristics of thermal neutron instrumentation (crystals, mirrors, multilayers, etc.). NOP includes IMD (D. Windt) with  optical constants for neutrons replacing the original optical constants for x-rays. NOP has been written by L. Alianelli and M. Sanchez del Rio.

Available for Windows (download) and Unix (download) platforms.

TOPO

TOPO is a program to perform analysis on profiles and surfaces written by David L. Windt. To download, install and run TOPO under XOP, please get the standard TOPO distribution from D. Windt (see http://cletus.phys.columbia.edu/~windt/idl/) or use the files availables in the XOP ftp server ( download for Unix and download for Windows ).

IMD

IMD has been written by David L. Windt. To install and run IMD under XOP, you should get the standard distribution from D. Windt (see http://cletus.phys.columbia.edu/~windt/idl/) and follow the instructions therein, or use the files availables in the XOP ftp server ( download for Unix and download for Windows ).

IMD is a point-and-click IDL application that can calculate the optical properties - reflectance, transmittance, and absorptance - of an arbitrary multilayer structure, i.e., a structure consisting of any number of layers of any thickness, and of any material. IMD includes a database of optical constants for over 150 materials, spanning the photon range from the X-ray region to the far infrared. It's also easy to use your own optical constants if necessary, or to create new X-ray optical constants for any compound, using the CXRO tabulated atomic scattering factors for 92 elements. IMD can be used for both modeling, and for parameter estimation by non-linear, least-squares curve-fitting (including confidence interval generation) to your own measured data. IMD can also compute the electromagnetic field intensity vs. depth in a multilayer structure.