Publications
last modified
28-04-2009 15:20
Years 2008-2009
- Coherent diffraction tomography of nanoislands from grazing-incidence small-angle x-ray scattering
O. M. Yefanov, A. V. Zozulya, I. A. Vartanyants, J. Stangl, T. H. Metzger, G. Bauer, T. Boeck and M. Schmidbauer
APPLIED PHYSICS LETTERS 94, 123104 (2009) - Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometry
Ch. Deneke, J. Schumann, R. Engelhard, J. Thomas, C. Müller, M. S. Khatri, A.Malachias, M. Weisser,T. H. Metzger and O. G. Schmidt
Nanotechnology 20 045703 (2009) - Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques
D Carbone, A Biermanns, B Ziberi, T H Metzger, U Pietsch, F Frost and O Plantevin
Chapter in the book: Self-organized Surface Nanopatterns Induced by Ion Beam Sputtering, edited by Mario Castro, Rodolfo Cuerno, Raul Gago and Luis Vazquez
Journal of Physics Condensed Matter (JPCM) accepted for publication (2009) - Planar hybrid superlattices by compression of rolled-up nanomembrane
T. Zander, Ch. Deneke and O. G. Schmidt, Ch. Mickel, A. Malachias and T. H. Metzger
APPLIED PHYSICS LETTERS 94, 053102 (2009) - Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction
T. Scheler, M. Rodrigues, T. W. Cornelius, C. Mocuta, A. Malachias, R. Magalhães-Paniago, F. Comin, J. Chevrier, and T. H. Metzger
APPLIED PHYSICS LETTERS 94, 023109 (2009) - Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays
M.-I. Richard, V. Favre-Nicolin, G. Renaud, T. U. Schülli, C. Priester, Z. Zhong and T.-H. Metzger
APPLIED PHYSICS LETTERS 94, 013112 (2009) - Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
V. Holý , K. Mundboth, C. Mokuta , T.H. Metzger , J. Stangl , G. Bauer , T. Boeck ,M. Schmidbauer
Thin Solid Films 516, 8022, (2008) - One-step synthesis of semiconductor clusters confined in Silicalite-1 using 3-Mercaptopropyl-trimethoxysilane as Co-template
K.-L. Wong, S. Mintova, T. H. Metzger
Chem. Mater. 20 (17), 5721 (2008) - Effects of stabilizing binder and dispersion media on spin-on zeolite thin films
L. Lakiss, I. Yordanov, T. Metzger, S. Mintova
Thin Solid Films 2008. - lPO4-18 Seed Layers and Films by Secondary Growt
Lubomira Tosheva, Eng-Poh Ng, Svetlana Mintova, Manfred Holzl, Till H. Metzger and Aidan M. Doyle
Chem. Mater. 20, 5721 (2008) - X-ray scattering and diffraction from ion beam induced ripples in crystalline silicon
Andreas Biermanns, Ullrich Pietsch, Jörg Grenzer, Antje Hanisch, Stefan Facsko, Geradina Carbone, and Till Hartmut Metzger
JOURNAL OF APPLIED PHYSICS 104, 044312 (2008) - Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray Microdiffraction
A. Malachias, Ch. Deneke, B. Krause, C. Mocuta, S. Kiravittaya, T. H. Metzger, and O. G. Schmidt
PHYSICAL REVIEW B 79, 035301 (2009) - Diffuse x-ray scattering from inclusions in ferromagnetic Ge1−xMnx layers
V. Holý, R. T. Lechner, S. Ahlers, L. Horák, T. H. Metzger, A. Navarro-Quezada, A.Trampert; D. Bougeard, and G. Bauer
PHYSICAL REVIEW B 78, 144401 (2008) - Imaging of nanoislands in coherent grazing-incidence small-angle x-ray scattering experiments
A. V. Zozulya, O. M. Yefanov, I. A. Vartanyants,K. Mundboth,C. Mocuta, T. H. Metzger, J. Stangl, G. Bauer, T. Boeck, and M. Schmidbauer
PHYSICAL REVIEW B 78, 121304 R (2008) - Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands
C. Mocuta,1 J. Stangl, K. Mundboth, T. H. Metzger, G. Bauer, I. A. Vartanyants, M. Schmidbauer, and T. Boeck
PHYSICAL REVIEW B 77, 245425 (2008) - Crystal truncation planes revealed by three-dimensional reconstruction of reciprocal space
I. A. Vartanyants, A. V. Zozulya, K. Mundboth, O. M. Yefanov, M.-I. Richard, E. Wintersberger, J. Stangl, A. Diaz, C. Mocuta, T. H. Metzger, G. Bauer, T. Boeck, and M. Schmidbauer
PHYSICAL REVIEW B 77, 115317 (2008) - Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography
A. Rastelli, M. Stoffel, A. Malachias, T. Merdzhanova, G. Katsaros, K. Kern, T. H. Metzger and O.G. Schmidt
Nano Lett., 8, 1404–1409 (2008) - Versatile vacuum chamber for in-situ surface x-ray scattering studies
D. Carbone, O. Plantevin, R. Gago, C. Mocuta, O.Bikondoa, L. Petit, H. Djazouli, A. Alija, and T. H. Metzger
J. Synchrotron Rad. 15, 414–419, (2008) - Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
D Carbone, A Alija,O Plantevin, R Gago, S Facsko and THMetzger
Nanotechnology 19 , 035304 (2008) - Nanostructures in the light of synchrotron radiation: Surface sensitive x-ray techniques and anomalous scattering
Till Metzger, Vincent Favre-Nicolin, Gilles Renaud, Hubert Renevier, Tobias Schülli
chapter 10 in CHARACTERISATION OF SEMICONDUCTOR HETEROSTRUCTURES AND NANOSTRUCTURES edited by Carlo Lamberti; ELSEVIER (2008) - Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction; Virginie Chamard, Julian Stangl, Stephane Labat, Bernhard Mandl, Rainer; T. Lechner and Till H. Metzger; J. Appl. Cryst. 41, 272–280 (2008).
- Standing-wave effects in grazing-incidence x-ray diffraction from polycrystalline multilayers;J. Krčmář, V. Holý, L. Horák, T. H. Metzger, and J. Sobota; J. Appl. Phys. 103, 033504 (2008)
- In-line holography and coherent diffractive imaging with x-ray waveguides; L. De Caro, C. Giannini, D. Pelliccia, C. Mocuta, T. H. Metzger, A. Guagliardi, A. Cedola, I. Burkeeva, and S. Lagomarsino; Phys. Rev. B 77, 081408 (2008)
- X-ray structural investigation of Co/Cu granular multilayers with giant magnetoresistance F. Spizzo, C. Ferrero, A. Mazuelas, F. Albertini, F. Casoli, L. Nasi, and T. H. Metzger, J. Appl. Phys. 103, 07D525 (2008)
- X-ray Structure Analysis of Free-Standing Lipid Membranes Facilitated by Micromachined Apertures; Andre Beerlink, P.-J. Wilbrandt,E. Ziegler, D. Carbone, T. H. Metzger, and Tim Salditt ; Langmuir, 24 , 4952 (2008)
- X-ray pushing of a mechanical microswing; A. Siria, M. S. Rodrigues, O. Dhez, W.Schwartz, G. Torricelli, S. LeDenmat, N. Rochat, G. Auvert, O. Bikondoa, T. H. Metzger, D. Wermeille, R. Felici, F. Comin and J. Chevrier ; arXiv:0801.2050v2 [physics.ins-det] 22 Jan (2008)
- Strain and composition of ultra small Ge quantum dots studied by x-ray scattering and in situ surface x-ray absorption spectroscopy Crystal truncation planes revealed by three-dimensional reconstruction of reciprocal space
I. A. Vartanyants, A. V. Zozulya, K. Mundboth, O. M. Yefanov, M.-I. Richard, Wintersberger, J. Stangl, A. Diaz, C. Mocuta, T. H. Metzger, G. Bauer, T. Boeck, and M. Schmidbauer
PHYSICAL REVIEW B 77,115317 (2008)
Years 1995-2007
- Design of the anomalous scattering beamline at the European Synchrotron Radiation Facility
S. Lequien, L. Goirand, F. Lesimple
Review of Scientific Instruments 66, 1725 - 5. International Conference on Synchrotron Radiation Instrumentation - New York, USA ,1994-07-18 / 22 (1995) - X-ray section topographic investigation of the growth process of SiC crystals
S. Milita R. Madar, J. Baruchel, A. Mazuelas
Materials Science Forum 264-268, 29-32 (1998) - Morphological characterization of ion-sputtered C-Ag, C/C-Ag and Ag/C films by GISAXS
D. Babonneau, A. Naudon, D. Thiaudiere, S. Lequien
J Applied Crystallography 32, 226-233 (1999) - Combined X-ray and neutron diffraction from binary liquids and amorphous semiconductors
A.C. Barnes, M.A. Hamilton, P. Buchanan, M.L. Saboungi
J Non Cryst Solids 250-252, 393-404 (1999) - A high temperature furnace for in situ and time-resolved X-ray diffraction studies
M.J. Capitan, N. Thouin, G. Rostaing
Review of Scientific Instruments 70, 2248 (1999) - X-ray diffuse scattering fro icosahedral Al-Pd-Mn quasicrystals
M.J. Capitan, Y. Calvayrac, A. Quivy, J.L. Joulaud, S. Lefebvre, D. Gratias
Physical Review B 60, 6398 (1999) - Frontiers in SAXS and SANS
B. Deme, Diat O., Narayanan T., Zemb T.
Conference : Frontiers in SAXS and SANS - Grenoble, France, 1999-02-12 / 13 (1999) - Crystallization of amorphous Si0.5Ge0.5 films studied by in-situ X-ray diffraction and in-situ electron microscopy
F.T. Edelmann, T. Raz, Y. Komem, P. Zaumseil, H.J. Osten, M.J. Capitan
Philosophical Magazine A 79(11), 2617-2628 (1999) - Readout electronics for position-sensitive gas filled detectors at the European Synchrotron Radiation Facility
C. Herve, T. Le Caer
Review of Scientific Instruments 70, 226 (1999) - Lateral ordering of coherent Ge islands on Si(001) studied by triple-crystal grazing incidence diffraction
I. Kegel, T.H. Metzger, J. Peisl, P. Schittenhelm and G. Abstreiter
Appl.Phys. Lett. 74, 2978 (1999) - Elastic stress relaxation in Ga0.18In0.82As0.73P0.27 quantum wires on InP
D. Luebbert, B. Jenichen, H. T. Grahn, T. Baumbach, A. Mazuelas, T. Kojima, S. Arai
J. Phys. D.: Appl. Phys. 32(10A),A21 (1999) - Influence of the transverse and longitudinal coherence in dynamical theory of x-ray diffraction
V. Mocella, J.P. Guigay, Y. Epelboin, J. Härtwig, J.Baruchel and A. Mazuelas
J. Phys. D.: Appl. Phys. 32, A88 (1999) - Grazing incidence small angle x-ray scattering from free-standing nanostructures
M. Rauscher,R.Paniago,H. Metzger, Z. Kovats, J. Domke, J. Peisl, H.-D. Pfannes, J.Schulze and I.Eisele
J. Appl. Phys. 86, 6763 (1999) - X-ray imaging and diffraction from surface phonons on GaAs
W. Sauer, M. Streibl, T.H. Metzger, A.G.C. Haubrich, S. Manus, A. Wixforth, J. Peisl, A. Mazuelas, J. Haertwig , and J. Baruchel
Appl. Phys. Lett. 75, 1709 (1999) - Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering
J. Stangl, V. Holý, P. Mikulik, G. Bauer, I. Kegel, T.H. Metzger, O. G. Schmidt, C. Lange, K. Eberl
Appl. Phys. Lett. 74, 3785 (1999) - In-situ characterisation of strain distribution in broad area high power lasers under operation by high resolution X-ray diffraction and topography using synchrotron radiation
U. Zeimer, T. Baumbach, J. Grenzer, D. Lübbert, A. Mazuelas, U. Pietsch, G. Erbert
J. Phys. D.: Appl. Phys. 32, A123 (1999) - Diffuse X-ray Rods and Scattering from Point Defect Clusters in Ion Implanted Silicon
U. Beck, T.H. Metzger, J. Peisl and J.R.Patel
Appl.Phys. Lett. 76, 2698 (2000) - Icosahedral quasicrystals applied as a harmonic-free crystal analyser
M.J. Capitan, J. Alvarez
J Applied Crystallography 33, 888-892 (2000) - The ID01 beamline at the E.S.R.F.: The diffuse scattering technique applied to surface and interface studies
M.J. Capitan, D. Thiaudiere, L. Goirand, R. Taffut, S. Lequien
Physica B 283, 256 (2000) - Anomalous X-ray diffraction with soft X-ray synchrotron radiation
P. Carpentier, C. Berthet-Colominas, M. Capitan, M.L. Chesne, E. Fanchon, S. Lequien, H. Stuhrmann, D. Thiaudiere, J. Vicat, P. Zielinski, R. Kahn
Cellular and Molecular Biology 46, 935 (2000) - GISAXS study of Cu-Ni alloy clusters obtained by double ion implantation in silicate glasses
E. Cattaruzza, F. Dacapito, F. Gonella, A. Longo, A. Martorana, G. Mattei, C. Maurizio and D.Thiaudiere
J Applied Crystallography 33, 740-743 (2000) - Neutron and X-ray investigation of disordered quasicrystals
K. Hradil, T. Scholpp, F. Frey, T. Haibach, M.A. Estermann, M. Capitan
Materials Science and Engineering 303, 294-296 (2000) - Feasibility and review of anomalous X-ray diffraction at long wavelengths in materials research and protein crystallography
R. Kahn, P. Carpentier, C. Berthet-Colominas, M. Capitan, M.-L. Chesne, E. Fanchon and S. Lequien
J. Synchrotron Radiation 7, 131-138 (2000) - Clusters and planar defects in boron implanted silicon an x-ray diffuse scattering study
I. Kegel, M. Sztucki, T.H. Metzger, D. Luebbert, J. Arthur, and J.R. Patel
Mat. Res. Soc. Symp. 610, B5.5.1 (2000) - Nanometer-Scale Resolution of Strain and Interdiffusion in Self-Assembled InAs Quantum Dots
I. Kegel, T.H. Metzger, A. Lorke, J. Peisl, J. Stangl, G. Bauer, J. M. Garcia, P. M. Petroff
Phys.Rev. Lett. 85, 1694 (2000) - Residual strain in Ge pyramids on Si(111) investigated by x-ray crystal truncation rod scattering
Z. Kovats, M. Rauscher, H. Metzger, J. Peisl, R. Paniago, H.-D. Pfannes, J. Schulze, I. Eisele, F. Boscherini, S. Ferrer
Phys.Rev. B 62, 8223 (2000) - Carbon nanotubes synthesised in channels of AlPO4-5 single crystals: first X-ray scattering investigations
P. Launois, R. Moret, D. Le Bolloc'h, P.A. Albouy, Z.K. Tang, G. Li, J. Chen
Solid State Comms. 116, 99 (2000) - Grazing incidence small angle X-ray scattering applied to the characterization of aggregates in surface regions
A. Naudon, D. Babonneau, D. Thiaudiere, S. Lequien
Physica B 283, 69-74 (2000) - Diffuse x-ray streaks from stacking faults in Si analyzed by atomistic simulations
K. Nordlund, U. Beck, T.H. Metzger and J. Patel
Appl.Phys. Lett. 76, 846 (2000) - Grazing incidence small-angle x-ray scattering from laterally ordered pyramidal Ge islands on Si(111)
R. Paniago, T.H. Metzger, M. Rauscher, Z. Kovats, J. Peisl, J. Schulze and I.Eisele, S. Ferrer
J.Appl. Cryst. 33, 433 (2000) - Anomalous X-ray diffraction studies of hydration effects in concentrated aqueous electrolyte solutions
S. Ramos, A.C. Barnes, G.W. Neilson, M. Capitan
Chemical Physics 258, 151-161 (2000) - The hydration structure of Br- from anomalous X-ray diffraction
S. Ramos, A.C. Barnes, G.W. Neilson, D. Thiaudiere and S. Lequien
J Physics: Condens. Matter 12(8A), p203-208 (2000) - Partial pressure alarm system for the use on beam lines without any physical limitation to the storage ring vacuum system
D. Schmied, E. Burtin, I. Parat
7th European Particle Accelerator Conference EPAC 2000 - Vienna, Austria, Proceedings of EPAC 2000 pp. 2295-2297 (2000) - Structural and morphological studies of Co/SiO2 discontinuous multilayers
D. Thiaudiere, O. Proux, J.-S. Micha, C. Revenant, J.R. Regnard, S. Lequien
Physica B 283, 114-118 (2000) - Fully hydrated and highly oriented membranes: an experimental setup amenable to specular and diffuse x-ray scattering
M. Vogel, C. Muenster, W. Fenzl, D. Thiaudiere, T. Salditt
Physica B 283, 32-36 (2000) - Thermal unbinding of highly oriented phospholipid membranes
M. Vogel, Muenster C., Fenzl W., Salditt T.
Physical Review Letters 84, 390 (2000) - High resolution X-ray and neutron diffraction of super- and disorder in decagonal Al-Co-Ni
E. Weidner, K. Hradil, F. Frey, M. De Boissieu, A. Letoublon, W. Morgenroth, H.G. Krane, M. Capitan, A.P. Tsai
Materials Science and Engineering A 294-296, 308-314 (2000) - Structure of the near-surface waveguide layers produced by diffusion of Titanium in Lithium Niobate
Y. Avrahami, E. Zolotoyabko, W. Sauer, T. H. Metzger, J. Peisl
Mat. Res. Soc. Symp. - Proceedings 590, 213 (2000) - Strain and temperature distribution in broad-area high-power laser diodes under operation determined by high resolution X-ray diffraction and topography
U. Zeimer, J. Grenzer, T. Baumbach, D. Luebbert, A. Mazuelas, and G. Erbert
Mat. Science and Enginee. B80, 87-90 (2001) - Transient ordering states in decagonal Al-Co-Ni and Al-Cu-Co-Si phases
Weidner E, Frey F, Hradil K
Phil.Mag.A 81, 2375 (2001) - Influence of the electrolyte viscosity on the structural features of porous silicon
Servidori M, Ferrero C, Lequien S, Milita S, Parisini A, Romestain R, Sama S, Setzu S, Thiaudiere D
Solid State Commun. 118, 85 (2001) - Porous silicon characterization by X-ray reflectivity: problems arising from using a vacuum environment with synchrotron beam
Sama S, Ferrero C, Lequien S, Milita S, Romestain R, Servidori M, Setzu S, Thiaudiere D
J. Phys. D:Appl. Phys. 34, 841 (2001) - An anomalous X-ray diffraction study of yttrium(III) hydration
Ramos S, Neilson GW, Barnes AC, Mazuelas A
J. Phys. Chem. B 105, 2694 (2001) - Coplanar and non-coplanar X-ray reflectivity characterization of lateral W/Si multilayer gratings
Mikulik P, Jergel M, Baumbach T, Majkova E, Pincik E, Luby S, Ortega L, Tucoulou R, Hudek P, Kostic I
J. Phys. D 34, A188 (2001) - The lifetime of defects in silicon after ion-implantation and annealing
Metzger TH., Sztucki M., Servidori M.
ESRF Highlights (2001) - Nanoscale crystal orientation in silicalite-1 films studied by grazing incidence X-ray diffraction
T. H. Metzger, S. Mintova, T. Bein
Microporous and Mesoporous Materials 43,191 (2001) - Treatment of grazing-incidence small-angle X-ray scattering data taken above the critical angle
Martorana A, Longo A, d'Acapito F, Maurizio C, Cattaruzza E, Gonella F
J. Appl. Cryst. 34, 152 (2001) - Direct observation of the coexistence of coherent and incoherent InAs self-assembled dots by X-ray scattering
Malachias A, Magalhaes-Paniago R, Neves BRA, Rodrigues WN, Moreira MVB, Pfannes HD, Kycia S, Metzger TH
Appl. Phys. Lett. 79, 4342 (2001) - The CuCl2/Al2O3 catalyst investigated in interaction with reagents
Lamberti C, Prestipino C, Capello L, Bordiga S, Zecchina A, Spoto G, Diaz Moreno S, Marsella A, Cremaschi B, Garilli M, Vidotto S, Leofanti G,
Int. J. Mol. Sci. 2, 230 (2001) - The status of gas-filled detector developments at a third generation synchrotron source (ESRF)
Kocsis M
Nucl. Instr. Meth. Phys. Res. A 471, 103 (2001) - Determination of strain fields and composition of self-organized quantum dots using X-ray diffraction
I.Kegel, T. H. Metzger, A. Lorke, J. Peisl, J. Stangl, G. Bauer,K. Nordlund, W.V. Schoenfeld and P. Petroff
Phys. Rev. B 63, 035318 (2001) - Depth-sensitive structural study of silicalite-1 films with grazing incidence X-ray diffraction
S. Mintova, T. H. Metzger, and T. Bein
accepted for publication in proceedings of the 13th int. Zeolite Conference Montpellier (2001) - Strain and Composition distribution in free-standing SiGe islands from X-ray diffraction
J. Stangl, A. Daniel, V. Holy, T. Roch, G. Bauer, I. Kegel, T. H. Metzger, T. Wiebach, O.G. Schmid, K.Eberl
Appl. Phys. Lett. 79, 10, 1474 (2001) - X-ray determination of vertical ordering of InAs quantum dots in InAs/GaAs multilayers
J. C.González, R. Magalhães-Paniago, W. N. Rodrigues, A. Malachias, M.V.B. Moreira, A.G. de Oliveira I.Mazzaro, C. Cusatis T.H. Metzger, J. Peisl
Appl. Phys. Lett. 78 (8), 1056 (2001) - Rinsing and drying studies of porous silicon by high resolution X-ray diffraction
Chamard V, Pichat C, Dolino G
Solid State Communic. 118, 135 (2001) - Evidence of pore correlation in porous silicon: An X-ray grazing-incidence study
Chamard V, Bastie P, Le Bolloch D, Dolino G, Elkaim E, Ferrero C, Lauriat JP, Rieutord F, Thiaudiere D
Phys.Rev.B 64, 245416 (2001) - GID study of Ge quantum dots: small in size and high in density
Derivaz M, Noe P, Dianoux R, Barski A, Schulli TU, Metzger TH
ESRF Highlights (2001) - Structure of metal nanowires in nanoporous alumina membranes studied by EXAFS and X-ray diffraction
Benfield RE, Grandjean D, Dore JC, Wu Z, Kroll M, Sawitowski T, Schmid G
European Phys.Jour. D 16, 399 (2001) - Structure and bonding of gold metal clusters, colloids, and nanowires studied by EXAFS, XANES, and WAXS
Benfield RE, Grandjean D, Kroll M, Pugin R, Sawitowski T, Schmid G
J.Phys.Chem.B 105, 1961(2001) - In situ real-time analysis of the formation of a quasicrystalline phase in Al-Co multilayers by solid-state reaction
Bergman C, Joulaud JL, Capitan M, Clugnet G, Gas P
J. Non-cryst. Solids 287, 193 (2001) - Diffraction on lysozome crystals
Boesecke P et al
Zeitsch. Fuer Kristall. Supplem. 18, 40 (2001) - Anomalous diffraction with soft X-ray synchrotron radiation: DANES from pentakismethylammonium undecachlorodibismuthate at the K absorption edge of chlorine
Carpentier P, Capitan M, Chesne ML, Fanchon E, Kahn R, Lequien S, Stuhrmann H, Thiaudiere D, Vicat J, Zajac W, Zielinski P,
J. Alloys Compounds 328, 64 (2001) - Structure and ordering of GaN quantum dot multiplayer
V. Chamard, T. H. Metzger, E. Bellet-Amalric, B. Daudin, C. Adelmann, H. Mariette, G. Mula
Appl. Phys. Lett. 79, (13), 1971 (2001) - Structural investigations on self-organised Si/SiGe islands by grazing incidence small angle X-ray scattering
T. Roch, V. Holy, J. Stangl, E.Hoflinger, A. Daniel, G. Bauer, I. Kegel, H. Metzger, J. Zhu, K. Brunner, G. Abstreiter
Phys. Stat. Sol. (b) 224, 241 (2001) - Composition fluctuations in the demixed supercooled liquid state of Zr41Ti14Cu12.5Ni10Be22.5: A combined ASAXS and SANS study
Hoell A, Bley F, Wiedenmann A, Simon JP, Mazuelas A, Boesecke P
Scripta Mater. 44, 2335 (2001) - Grazing incidence small-angle X-ray scattering study of self-organized SiGe wires
V. Holy, T. Roch, J. Stangl, A. Daniel, G. Bauer, T. H. Metzger, Y. H. Zhu, K. Brunner and G. Abstreiter
Phys. Rev. B 63, 205318 (2001) - X-ray studies of self-organised wires in SiGe/Si multilayers
T. Roch, V. Holy, A. Daniel, E. Hoflinger, M Meduna, THMetzger, G. Bauer, K. Brunner, G Abstreiter
J. Phys. D 34, a6 (2001) - X-ray study of surfaces and interfaces
Asadchikov VE et al
Proc. SPIE 4449, 253 (2001) - Soft X-ray diffraction up to wavelengths of 6.0 angstrom becomes feasible at ID1 of ESRF
Carpentier P, Boesecke P, Bois JM, Chesne ML, Fanchon E, Kahn R, Stuhrmann H; Vicat J
Acta Phys. Pol.A 101, 603 (2002) - Structural studies of mesoporous alumina membranes by small angle X-ray scattering
Dore JC, Benfield RE, Grandjean D, Schmid G, Kroll M, Le Bolloc'h D
Stud. Surf. Sci. Catal 144, 163 (2002) - Diffraction by domains in decagonal Al-Co-Ni quasicrystals
Frey F, Weidner E
J. Alloys & Compounds 342, 105 (2002) - Temperature dependence of the 8-angstrom superstructure in decagonal Al-Co-Ni
Frey F, Weidner E, Hradil K, de Boissieu M, Letoublon A, McIntyre G, Currat R, Tsai AP
J. Alloys & Compounds 342, 57 (2002) - Formation of icosahedral Al-Cu-Fe quasicrystal in annealed metallic multilayers
Grenet T, Giroud F, Joulaud JL, Capitan M
Phil. Mag. A 82, 2909 (2002) - The chemistry of the oxychlorination catalyst: an insitu time resolved XANES study
Lamberti C, Prestipino C, Bonino F, Capello L, Bordiga S, Spoto G, Zecchina A, Diaz Moreno S, Cremaschi B, Garilli M, Marsella A, Carmello D, Vidotto S, Leofanti G
Angew. Chem. Int. Ed. 41, 2341 (2002) - Statics and kinetics of the ordering transition in the AuAgZn2 alloy
Livet F, Bley F, Simon JP, Caudron R, Mainville J, Sutton M, Lebolloc'h D
Phys.Rev.B 66, 134108 (2002) - Alignment of Carbon nanotubes
Lucas M et al.
AIP conf Proc 633, 579 (2002) - Grazing-incidence small-angle X-ray scattering and X-ray diffraction from magnetic clusters obtained by Co plus Ni sequential ion implantation in silica
Maurizio C, Longo A, Martorana A, Cattaruzza E, D'Acapito F, Gonella F, de Julian C, Mattei G, Mazzoldi P, Padovani S, Boesecke P
J.Appl.Cryst. 36, 732 (2002) - Magainin2 in phospholipid bilayers:peptide orientation and lipid chain ordering studied by X-ray diffraction
Muenster C, Spaar A, Bechinger B, Salditt T
Biochim.Biophys. Acta 1562, 37 (2002) - Neutron and X-ray diffr. Studies
Neilson GW, Adya AK, Ansell S
Ann.Rep on the Progress of Chem C98, 273 (2002) - Two-dimensional X-ray waveguides and point sources
Pfeiffer F, David C, Burghammer M, Riekel C, Salditt, T
Science 297, 230 (2002) - Self-assembly of alkane capped silver and silica nanoparticles
Rensmo H, Ongaro A, Ryan D, Fitzmaurice D
J.Mater.Chem 12, 2762 (2002) - In situ study of strain evolution during thin film Ti/Al(Si,Cu) reaction using synchrotron radiation
Rivero C, Bostrom O, Gergaud P, Thomas O, Boivin P, Mazuelas A
Microelectron. Eng. 64, 81 (2002) - X-ray and neutron scattering and solid state NMR investigations on precursor-derived B-C-N ceramics using isotopic substitution
Sauter D, Weinmann M, Berger F, Lamparter P, Muller K, Aldinger F
Chem.Mater. 14, 2859(2002) - X-ray study of the structure and order in lithographic Cu3Au nano-cuboids
Schulli T, Trenkler J, Monch I, Le Bolloc'h D, Dosch H
Europyhs.Lett 14, 2859 (2002) - Anomalous X-ray diffraction on InAs/GaAs quantum dot systems
Schulli TU, Sztucki M, Chamard V, Metzger TH, Schuh D
Appl.Phys.Lett 81, 448 (2002) - Anomalous X-ray diffraction on InAs/GaAs quantum dot systems
Schulli TU, Sztucki M, Chamard V, Schuh D
ESRF Highlights (2002) - Diamond nanoparticules to carbon onions transformation:xray diffraction studies
Tomita S, Burian A, Dore JC, LeBolloc'h D, Fujii M, Hayashi S
Carbon 40, 1469 (2002) - Structural relation between Si and SiC formed by carbon ion implantation
F. Eichhorn, N. Schell, A. Muecklich, H. Metzger, W. Matz, R. Koegler
J. Appl. Phys. 91, 1287, (2002) - X-ray diffraction from rectangular slits
D. Le Bolloc’h, F. Livet, F. Bley, T. Schulli, M. Veron and T. H. Metzger
J.Synchrotron Radiation 9, 258 (2002) - X-ray analysis of temperature induced defect structures in Boron implanted Silicon
M. Sztucki, T. H. Metzger, I. Kegel, A. Tilke, D. Luebbert, J. Arthur, J. Patel, J. L. Rouviere
J. Appl. Physics 92, 3694 (2002) - Anomalous X-ray diffraction on InAs/GaAs Quantum Dot systems
T. Schulli, M. Sztucki, V. Chamard, T. H. Metzger, D. Schuh
Appl. Phys. Lett. 81, 448 (2002) - Structure and Ordering of GaN quantum dot multilayers investigated by X-ray grazing incidence techniques
V. Chamard, T. H. Metzger, C. Ferrero, E. Bellet-Amalric, B. Daudin, H. Mariette, G. Mula
EMRS proceedings (2002) and Physica E-LOW Dim. Systems 13, 1115 (2002) - Application of third generation synchrotron sources to studies of non-crystalline materials: In-Se amouphous films
Burian A, Jablonska A, Burian AM, Lebolloc'h D, Metzger H, Proux O, Hazemann JL, Mosset A, Raoux D
Acta Physica Polonica A 101,701 (2002) - Squeezing X-ray Photons
T. H. Metzger
Science 297, 205 (2002) - Strain in buried self-assembled SiGe wires studied by grazing incidence X-ray diffraction.
T. Roch, V. Holy, A. Hesse, J. Stangl, T. Frommherz, G. Bauer, T. H. Metzger, S. Ferrer
Phys. Rev. B 65, 245324 (2002) - X-ray diffuse scattering study of the kinetics of stacking fault growth and annihilation in boron-implanted silicon
D. Luebbert and J. Arthur , M. Sztucki and T. H. Metzger, P. B. Griffin, J. R. Patel
Applied Physics Letters 81, 3167 (2002) - Self-organized semiconductor nanostructures: shape, strain and composition
J. Stangl, V. Holy, G. Springholz, G. Bauer, I. Kegel, T.H. Metzger
Materials Science and Engineering C 19 349–358 (2002) - Strain in buried self-assembled SiGe wires studied by grazing incidence X-ray diffraction
T. Roch, V. Holy, A. Hesse, J. Stangl, T. Frommherz, G. Bauer, T. H. Metzger, S. Ferrer
Phys. Rev. B 65, 245324 (2002) - Investigation of GaN quantum dot stacking in multilayers with X-ray grazing incidence techniques
V. Chamard, T. H. Metzger, E. Bellet-Amalric, B. Daudin, H. Mariette
Mat. Science and Engineering B93, 24 (2002) - Pure silica BETA colloidal zeolite assembled in thin films
S. Mintova, M. Reinelt, T. H. Metzger, J. Senker and T. Bein
Chem. Comm. 326, Dec. (2002) - Structure and ordering of GaN quantum dot multiplayer investigatedby X-ray grazing incidence techniques
V.Chamard, T.H.Metzger, C.Ferrero, E.Bellet-Amalric, B.Daudin, H.Mariette, G.Mula
Physica E 13, 1115 (2002) - Growth of highly strained germanium dots on Si.001. covered by a silicon nitride layer
M. Derivaz, P. Noe´ , R. Dianoux, and A. Barski, T. Schulli and T. H. Metzger
Appl. Phys. Lett. 81, 3843 (2002) - Self-organized semiconductor nanostructures: Shape, strain and composition
Stangl J.,Holy V.,Springholz G.,Bauer G.,Kegel I.,Metzger T.H.
Materials Science and Engineering C 19, 349-358 (2002). - Short range order of hydrocarbon chains in fluid phospholipid bilayers studied by X- ray diffraction from highly oriented membranes
Spaar A, Salditt T
Biophys J 85, 1576 (2003) - X-ray analysis of temperature induced defect structures in boron implanted silicon
Sztucki M, Metzger TH, Kegel I, Tilke A, Rouviere JL, Lubbert D, Arthur J, Patel JR
J. Appl. Phys. 92, 3694 (2003) - Field-induced pseudocrystalline ordering in concentrated ferrofluids
Wiedenmann A, Hoell A, Kammel M, Boesecke P
Phys. Rev. E 68, 31203 (2003) - Anomalous diffraction in grazing incidence to study the strain induced GaN quantum dots stacked in an AlN multilayer
V. Chamard, T. H. Metzger,M. Sztucki, M. Tolan, E. Bellet-Amalric, B. Daudin, C. Adelmann, H. Mariette
NIMB 200, 95 (2003) - Influence of the Si spacer layers on the structures of Ge/Si quantum dot bilayers
X. Jiang, T.H. Metzger, M. Sztucki, Z. Jiang, W. Jiang, and D. Xian
NIMB 200, 40 (2003) - Size and ordering of sputtered Co nanoparticles in Co/Cu multilayers
F. Spizzo, F. Ronconi, F. Albertini, F. Casoli, L. Pareti, G. Turilli, F. Bolzoni, A. Mazuelas, C. Ferrero, G. Ghiringhelli, A. Tagliaferri and H. Metzger
NIMB 200, 142 (2003) - Grazing incidence synschrotron X-ray diffraction study of crystal orientation in microporous films
S. Mintova, T.H. Metzger, T. Bein
NIMB 200, 160 (2003) - Structural investigation of semiconductor nanostructures by X-ray techniques
J. Stangl, A. Hesse,T. Roch, V. Holy, G. Bauer, T. Schuelli, T. H. Metzger
NIMB 200, 11 (2003) - Fe-containing mesoporous films for carbon nanotubes
Petkov N, Mintova S, Karaghiosoff K, Bein T
Mater. Sci. and Eng. C 23, 145 (2003) - Anomalous X-ray diffraction studies of Sr2+ hydration in aqueous solution
Ramos S, Neilson GW, Barnes AC, Capitan MJ
J. Chem. Phys. 118, 5542 (2003) - Liquid-peptide interaction in oriented bilayers probed by interface sensistive scattering methods
Salditt T
Current Opinion in Struct. Biology 13, 467 (2003) - Thermal fluctuations and positional correlations in ordered lipid membranes
Salditt T, Vogel M, Fenzl M
Phys. Rev. Lett. 90, 178101 (2003) - Depth resolved investigations of boron implanted silicon
M.Sztucki, T.H.Metzger , S.Milita, F.Berberich, N.Schell, J.L.Rouviere , J.Patel
NIMB 200, 52 (2003) - Focusing crystal analyser for the rejection of inelastic X-ray scattering
M. A. Hamilton, T. H. Metzger, a. Mazuelas and T. Buslaps
J. Synchrotron Rad. 10, 255 (2003) - Depth Profiling of the Lateral Pore Size and Correlation Distance in Thin Porous Silicon Layers by Grazing Incidence Small Angle X-ray Scattering
C. Ferrero, M. Servidori, D. Thiaudière, S. Milita, S. Lequien, S. Sama, S. Setzu, and T. H. Metzger
J. Electrochem. Soc. 150, E366 (2003) - Crystal growth of nanosized zeolites in solutions and films: In –situ grazing incidence diffraction (GID) study using synchrotron X-ray radiation
S.Mintova, B. Jean, T.H. Metzger, T. Bein
J. Mat. Lett. 22, 751 (2003) - Synthesis of colloidal AIPO4-18 crystals and their use for supported film growth
M. Vilaseca, S. Mintova, V. Valtchec, T. H. Metzger,T. Bein
J. Mat. Chem 13 1526 (2003) - Stable Mesostructured Silicate Films Containing Nanosized Zeolite
N. Petkov, S. Mintova, B. Jean, T. H. Metzger, T. Bein
Chem. Mater. 15, 2240-2246 (2003) - Direct Determination of Strain and Composition Profiles in SiGe Islands by Anomalous X-ray Diffraction at High Momentum Transfer
T. U. Schulli, J. Stangl, Z. Zhong, R. T. Lechner, M. Sztucki, T. H. Metzger, and G. Bauer
Phys. Rev. Lett. 90, 066105-1 (2003) - Cell-wall recovery after irreversible deformation of wood
Keckes J, Burgert I, Frühmann K, Müller M, Kölln K, Hamilton M, Burghammer M, Roth SV, Tschegg SS, Fratzl P
Nature Materials 2, 811 (2003) - Thin layers of columns of an amphiphilic hexa-peri-hexabenzocoronene at silicon wafer surfaces
Kubowicz S, Pietsch U, Watson MD, Tchebotareva N, Mullen K, Thunemann AF
Langmuir 19, 5036 (2003) - Ultra small-angle X-ray scattering: conditions, limits and results in speckle experiments
Livet F, Bley F, Ehrburger-Dolle F, Geissler E, Lebolloc'h D, Schulli T
J. Appl. Cryst 36, 774 (2003) - In-situ study of stress evolution during solid state reaction of Pd with Si(001) using synchrotron radiation
Megdiche A, Gergaud P, Curtil C, Thomas O, Chenevier B, Mazuelas A
Microelectron. Eng. 70, 436 (2003) - Nanochannels in track-etched membranes
Pepy G, Balanzat E, Jean B, Kuklin A, Sertova N, Toulemonde M
J. Appl. Cryst. 36, 649 (2003) - On the driving forces for the vertical alignment in nitride quantum dot multilayers
V. Chamard, T.H. Metzger, M. Sztucki, V. Holy, M. Tolan, E.Bellet-Amalric, C. Adelmann, B. Daudin and H.Mariette
Europhys. Lett. 63, 268 (2003) - Structural study of self-assembled Co nanoparticles
Y. Chushkin, M. Ulmeanu, S. Luby, and E. Majkova, I. Kostic, P. Klang and V.Holy, Z. Bochnicek, M. Giersig and M. Hilgendorff, T. H. Metzger
J. Appl. Phys. 94, 12, (2003) - Structural Properties of LTA Films assembled from Aluminosilicate clear solutions and dense gels: a GID X-ray study
S. Mintova, V. Valtchev, N. Petkov, B. Jean, T.H. Metzger, T. Bein
Stud. Surf. Sci. Catal. 154, 717 (2004) - Pure silica BETA colloidal zeolite assembled in thin films
S. Mintova, M. Reinelt, T. H. Metzger, J. Senker and T. Bein
Chem Commun. 2003, 326–327 - Functionalized cubic mesostructured silica films
N. Petkov, S. Mintova, B. Jean, T. Metzger, T. Bein
Mater. Sci. and Eng. C 23, 827 (2003) - Crystal growth of nanosized zeolites in solutions and films: In situ grazing incidence diffraction (GID) study using synchrotron X-ray radiation
S. Mintova, B. Jean,T. H. Metzger, T. Bein
J. Mat. Sci. Lett. 22, 751 (2003) I S TRY - Synthesis of colloidal AlPO4 -18 crystals and their use for supported film growth
M. Vilaseca, S. Mintova, V. Valtchev, T. H. Metzger and T. Bein
J. Mater. Chem. 13, 1526–1528 (2003) - In situ stress determination during a solid state reaction between Pd films and a Si substrate using synchrotron rad.
Gergaud P, Megdiche M, Curtil C,Thomas O,Chenevier B, Mazuelas A
Microel. Eng 70, 463 (2003) - Thermal diffuse scattering in grazing incidence diffraction
Grigorian SA, Grenzer J, Pietsch U, Vartanyants IA
J. Phys. Cond. Matter 15, 3367 (2003) - X-ray waveguides and thin macromolecular films
T.Salditt, F.Pfeiffer, H.Perzl, A.Vix, U.Mennicke, A.Jarre, A.Mazuelas, T.H.Metzger
Physica B-Cond.Matt. 336(1-2), 181 (2003) - Stable Mesostructured Silicate Films Containing Nanosized Zeolite N. Petkov, S. Mintova, B. Jean, T. H. Metzger, and T. Bein
Chem. Mater. 15, 2240-2246 (2003) - Strain analysis of a quantum-wire system produced by cleaved edge overgrowth using grazing incidence X-ray diffraction
M. Sztucki, T. U. Schulli, T. H. Metzger, V. Chamard, R. Schuster, D. Schuh
Appl. Phys. Lett. 83, 5 (2003) - Hardening precipitation in a Mg-4Y-3RE alloy
Antion C, Donnadieu P, Perrard F, Deschamps A, Tassin C, Pisch A
Acta Materialia 51, 5335 (2003) - X-ray investigations of surface roughnesses
Asadchikov VE, Kozhevnikov IV, Krivonosov YS
Crystallogr. Rep. 48, 836 (2003) - Diffuse X-ray rods and scattering from point defect clusters in ion implanted silicon
Beck U, Metzger TH, Peisl J, Patel JR; Appl. Phys. Lett 83, 2489 (2003) - Counterion distribution in urchinlike charged copolymer micelles Monte Carlo simulation and small angle X-ray scattering
Belloni L, Delsanti M, Fontaine P, Muller F, Guenoun P, Mays JW, Boesecke P, Alba M
J. Chem. Phys 119, 7560 (2003) - Highly oriented, charged multilamellar membranes osmotically stressed by a polyelectrolyte of the same sign
Brotons G, Salditt T, Dubois M, Zemb T
Langmuir 19, 8235 (2003) - Ordering parameters of self-organized three dimensional quantum dot lattices determined from anomalous X-ray diffraction
R.T. Lechner, T. U. Schülli, V. Holy, G. Springholz, J. Stangl, A. Raab and G. Bauer, T.H. Metzger
Appl. Phys. Lett. 84, 885 (2004) - Structural properties of self-organized semiconductor nanostructures
Stangl J, Holy V, Bauer G
Rev .Mod. Phys. 76, 725 (2004) - Structural properties of self-organized semiconductor nanostructures
Stangl J, Schuelli TU, Hesse A, Holy V, Bauer G, Stoeffel M, Schmidt OG
Adv. Solid State Phys. 44, 227 (2004) - Structure of assemblies of metal nanowires in mesoporous alumina membranes studied by EXAFS, XANES, X-ray diffraction and SAXS
Benfield RE, Grandjean D, Dore JC, Esfahanian H, Wu ZH, Kroll M, Geerkens M, Schmid G
Faraday Discuss. 125, 327 (2004) - The use of synchrotron radiation techniques in the characterization of strained semiconductor heterostructures and thin films
Lamberti C
Surf.Sci. Rep. 53, 1 (2004) - Transmission electron microscopy study of the formation of FAU-type zeolite at room temperature
Valtchev VP, Bozhilov KN
J. Phys. Chem. B 108, 15587 (2004) - X-ray diffuse scattering from self-organized mesoscopic semiconductor structures
Schmidbauer M
Springer Tracts in Mod.Phys 199, (2004) - Strain distribution in nitride quantum dot multilayers
V. Chamard, T Schulli, M. Sztucki, T. H. Metzger, E. Sarigiannidou, J.-L. Rouviere, M. Tolan, C. Adelmann, B. Daudin
Physical Review B 69, 125327 (2004) - Direct determination of strain and InGaAs nano-islands using anomalous incidence X-ray diffraction
M. Sztucki, T.U. Schülli, T.H. Metzger, D. Schuh, V. Chamard
Superlattices and Microstructures 36 11, (2004) - Evolution of end-of-range defects in Si after Xe implantation grazing incidence diffuse X-ray scattering
L. Capello, T.H. Metzger
Materials Science and Engineering B 114-115, 77-81 (2004) - Im Inneren von Halbleiter-Nanostrukturen; Wie sich Interdiffusion und Gitterdehnung auf der Nanometer-Skala messen lassen
Julian Stangl, Tobias Schülli, Hartmut Metzger und Günther Bauer
Physik Journal 3 Nr. 33, (2004) - In-situ synchrotron studies of structural changes in wood during microtensile tests
Keckes J, Burgert I, Frühmann K, Müller M, Kölln K, Hamilton M, Burghammer M, Roth SV, Tschegg SS, Fratzl P
Proc. 2nd Internat. Symp. on Wood machining, p.37 (2004) - Magnetic nanoparticles through organometallic synthesis: evolution of the magnetic properties from isolated nanoparticles to organised nanostructures
Dumestre F, Martinez S, Zitoun D, Fromen MC, Casanove MJ, Lecante P, Respaud M, Serres A, Benfield RE, Amiens C, Chaudret B
Faraday Discuss. 125, 265 (2004) - Microstructure and morphology evolution in chemical solution deposited semiconductor films: 2. PbSe on As face of GaAs(111)
Shandalov M, Golan Y
Eur. Phys. J - Appl.Phys. 28, 51 (2004) - Nanostructure and field-induced arrangement of magnetosomes studied by SANSPOL
Hoell A, Wiedenmann A, Heyden U, Schueller D
Physica B 350, e309 (2004) - On the use of grazing incidence small angle X-ray scattering(GISAXS) in the morphological study of ion implanted materials
d'Acapito F, Maurizio C, Gonella F, Mondelli C, Longo A, Martorana A, Mattei G
J. Synchr. Rad. 11, 272 (2004) - Application of X-ray scattering technique to the study of supersmooth surfaces
ASADCHIKOV V.E.,KOZHEVNIKOV I.V.,KRIVONOSOV Y.S.,MERCIER R.,METZGER T.H.,MORAWE C.,ZIEGLER E.
Nuclear Instruments and Methods in Physics Research A 530, 575-595 (2004). - Silicalite-1/polymer films with low-k dielectric constants
LARLUS O.,MINTOVA S.,VALTCHEV V.,JEAN B.,METZGER T.H.,BEIN T.
Applied Surface Science 226, 155-160 (2004). - Strain determination in multilayers by complementary anomalous X-ray diffraction
SCHUELLI T.U., LECHNER R.T., STANGL J., SPRINGHOLZ G., BAUER G., SZTUCKI M., METZGER T.H.
Physical Review B 69, 195307 (2004). - AlPO4-18 synthesized from colloidal precursors and its use for the preparation of thin films
, VILASECA M.,MINTOVA S.,KARAGHIOSOFF K.,METZGER T.H.,BEIN T.
Applied Surface Science 226, 1-6 (2004). - Giant linear Fresnel Zone Plate as a hard X-ray condenser
A. Mazuelas, A. Snigirev, I. Snigireva, C. David, P. Boesecke, H. Djazouli T.H. Metzger
Proceedings of SPIE Vol. 5539, 259 (2004) - 3D hexagonal versus trigonal ordering in self-organized PbSe quantum dot superlattices
Lechner RT, Schulli TU, Holy V, Stangl J, Raab A, Springholz G, Bauer G
Physica E (2004) *** - Biomimetic membranes of lipid-peptide model systems prepared on solid support
Li CH, Constantin D, Salditt T
J.Phys.Cond.Matter. 16, S2439 (2004) - Biomolecular and amphiphilic films probed by surface sensitive X-ray and neutron scattering
Salditt T, Brotons G
Analytical and Bioanalytical Chem. 379, 960 (2004) - Conformation of peptides in lipid membrane studied by X-ray grazing incidence scattering
Spaar A, Muenster C, Salditt T
Biophys. J 87, 396 (2004) - Epitaxial MgB2 thin films on ZrB2 buffer layers: structural characterization by synchrotron radiation
Ferrando V, Tarantini C, Bellingeri E, Manfrinetti P, Pallecchi I, Marre D, Plantevin O, Putti M, Felici R, Ferdeghini C
Supercond. Sci. Technol. 17, 1434 (2004) - Thermal fluctuations and stability of solid-supported lipid membranes
Salditt T
J.Phys. Cond. Matter. 17, R287 (2005) - Upper critical fields up to 60 T in dirty magnesium diboride thin films
Ferdeghini C, Ferrando V, Tarantini C, Bellingeri E, Grasso G, Malagoli A, Marre D, Putti M, Manfrinetti P, Pogrebnyakov A, Redwing JM, Xi XX, Felici R, Haanappel E
IEEE Trans. On Appl.Superconductivity 15, 3234 (2005) - Zeolite beta films sintesized from basic and near-neural precursor sollutions and gels
Mintova S, Tosheva L, Hozl M, Metzger TH, Valtchev V, Bein T
Mat. Sci. Eng.C 25, 570 (2005) - Synchrotron X-ray studies of vitreous SiO2 over Si(001). I. Anisotropic glass contribution
M. Castro-Colin, W. Donner, S. C. Moss, Z. Islam, S. K. Sinha, R. Nemanich, H. T. Metzger, P. Bösecke, and T. Schülli
Physical Review B 71, 045310 (2005) - Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous X-ray diffraction and reciprocal space mapping
T. U. Schülli, M. Stoffel, A. Hesse, J. Stangl, R. T. Lechner, E. Wintersberger, M. Sztucki, T. H. Metzger, O. G. Schmidt, and G. Bauer
Phys. Rev. B 71, 035326 (2005) - X-ray methods for strain and composition analysis in self-organized semiconductor nanostructures
Till Hartmut Metzger, Tobias Urs Schülli and Martin Schmidbauer
C. R. Physique 6 , 47–59 (2005) - Effect of crystal morphology on the orientation of LTL-type zeolite films
O. Larlusa, L. Tosheva, M. Hölzl, S. Mintova, T. Metzger, V. P. Valtchev;
Stud. Surf. Sci. Catal. (2005) *** - Effect of in-flight annealing and deposition method on gas-sensitive SnOx films made from size-selected nanoparticles
M. K. Kennedy, F. E. Kruis, H. Fissan, H. Nienhaus, A. Lorke, T. H. Metzger
Sensors and Actuators B 108, 62 (2005) - Ordered micro/mesoporous composite prepared as thin films
Petkov N, Holzl M, Metzger TH, Mintova S, Bein T
JOURNAL OF PHYSICAL CHEMISTRY B 109, 4485-4491 (2005) - X-ray Scattering from Self-Assembled InAs Islands
A. Malachias, B. R. A. Neves, W. N. Rodrigues, M. V. B. Moreiro, S. Kyciay, T. H. Metzger, and R. Magalhaes-Paniago
Brazilian Journal of Physics 34, 571 (2005) - SARS E protein in phospholipid bilayers: an anomalous X-ray reflectivity study
Z. Khattari, G. Brotons, E. Arbely, I.T. Arkin, T.H. Metzger, T. Salditt
Physica B 357, 34–38 (2005) - Shape, strain, and ordering of lateral InAs quantum dot molecules
B. Krause and T. H. Metzger, A. Rastelli, R. Songmuang, S. Kiravittaya, and O. G. Schmidt
Phys. Rev. B 72, 085339 (2005) - Magnetic target nanoparticles for cancer therapy with neutrons and Synchrotron Radiation
Nawroth T, Boesecke P, Bravin A, Corde S, LeDuc G, Grillo I, May RP
Proc. Conf. Neutrons in Biology (2005) - Monodisperse bile-salt nanotubes in water: Kinetics of formation
Jean B, Oss-Ronen L, Terech P, Talmon Y
Adv. Mater. 17, 728 (2005) - Nondestructive identification of colloidal molecular sieves stabilized in water
Mihailova B, Mintova S, Karaghiosoff K, Metzger T, Bein T
J. Phys. Chem. B 109, 17060 (2005) - Softer and soft X-rays in macromolecular crystallography
Alexiou C, Schmid RJ, Jurgons R, Kremer M, Wanner G, Bergemann C, Huenges E, Nawroth T, Arnold W, Parak FG
J. Synchr. Rad 12, 410 (2005) - Spontaneous lateral modulation in short-period superlattices investigated by grazing- incidence X-ray diffraction
Caha O, Mikulik P, Novak J, Holy V, Moss SC, Norman A, Mascarenhas A, Reno JL, Krause B
Phys.Rev.B 72, 35313 (2005) - Strain induced changes in the magnetic phase diagram of metamagnetic heteroepitaxial Eu/Se/PbSe1-xTex multilayers
Lechner RT, Springholtz G, Schuelli TU, Stangl J, Schwartzl T, Bauer G
Phys. Rev. Lett. 94, 157201 (2005) - Solid-phase epitaxial regrowth of a shallow amorphised Si layer studied by X-ray and medium energy ion scattering
L. Capello, T.H. Metzger, M. Werner , J.A. van den Berg , M. Servidori , M. Herden, T. Feudel
Materials Science and Engineering B 124–125, 200 (2005) - X-ray study of atomic ordering in self-assembled Ge islands grown on Si(001)
A.Malachias, T. U. Schülli, G. Medeiros-Ribeiro, L. G. Cançado, M. Stoffel, O. G. Schmidt, T. H. Metzger, and R. Magalhães-Paniago
Phys. Rev. B 72, 165315 (2005) - Coherent X-ray diffraction from quantum dots
I. A. Vartanyants, I. K. Robinson, J. D. Onken, M. A. Pfeifer, G. J. Williams, F. Pfeiffer, H. Metzger, Z. Zhong, and G. Bauer
Phys. Rev. B 71, 245302 (2005) - Measurement of Si 311 defect properties using X-ray scattering
K. Nordlund, T. H. Metzger, A. Malachias, and L. Capello, P. Calvo and A. Claverie; F. Cristiano
J. Appl. Phys. 98, 073529 (2005) - Zeolite beta films synthesized from basic and near-neutral precursor solutions and gels
L. Tosheva , M. Holzl , T.H. Metzger , V. Valtchev , S. Mintova , T. Bein
Materials Science and Engineering C 25, 570 – 576 (2005) - Anomalous X-ray diffraction from self-assembled PbSe/PbEuTe quantum dots
Holy V, Schulli TU, Lechner RT, Springholz G, Bauer G
J. Alloys & Compounds 401, 1 (2005) - Coherent X-ray scattering and speckle pattern of solid-supported multilayers of surfactant bilayers
Brotons G, Constantin D, Madsen A, Salditt T,
Physica B 357, 61 (2005) - Differential anomalous X-ray scattering studies of amorphous In-Se
Jablonska A, Burian A, Metzger TH, LeBolloc'h D, Hamilton M, Raoux D
J. Alloys Compounds , 401, 41 (2005) - Grazing Incidence diffrcation strain analysis of laterally patterned Si wafers treated focused ge and Au ion beam implantation
Grenzer J, Pietsch U, Bischoff L
Phys. Stat. Sol. A 202, 1009 (2005) - High temperature investigation of Si/SiGe based cascade structures using X-ray scattering methods
Meduna M, Novak J, Falub CV, Chen G, Bauer G, Tsujino S, Gruetzmacher D, Mueller E, Campidelli Y, Kermarrec O, Bensahel D, Schell N
J.Phys.D-Appl. Phys. 38, a121 (2005) - In-situ WAXS studies of structural changes in wood foils and in individual wood cells during microtensile tests
Keckes J, Burgert I, Frühmann K, Müller M, Kölln K, Hamilton M, Burghammer M, Roth SV, Tschegg SS, Fratzl P
Fibre Diff. Rev. 13, 48 (2005) - Pseudoepitaxial transrotational structures in 14 nm-thick NiSi layers on [001] silicon
Alessandra Alberti, Corrado Bongiorno, Brunella Cafra, Giovanni Mannino, Emanuele Rimini, Till Metzger, Cristian Mocuta, Thorsten Kammler and Thomas Feudel
Acta Cryst. B 61, 486–491(2005). - Local order in Pt–47 at. % Rh measured with X-ray and neutron scattering
Ch. Steiner, B. Schönfeld, M. J. Portmann, M. Kompatscher, G. Kostorz, A. Mazuelas, T. Metzger, J. Kohlbrecher, and B. Demé
Phys. Rev. B 71, 104204 (2005) - X-ray spectroscopy and X-ray diffraction at wavelengths near the K-absorption edge of phosphorus
Biou V, Bosecke P, Bois JM, Brandolin G, Kahn R, Mas C, Nauton L, Nury H,Pebay- Peyroula E, Vicat J, Stuhrmann H
J. Synchr. Rad. 12, 402 (2005) - A microfluidic setup for studies of solid-liquid interfaces using X-ray reflectivity and fluorescence microscopy
Reich C, Hochrein MB, Krause B, Nickel B
Rev. Sci. Instrum 76, 959103 (2005) - An anomalous X-ray diffraction study of the hydration structures of Cs+ and I- in concentrated solutions
Ramos S, Neilson GW, Barnes AC, Buchanan P
J. Chem. Phys 123, 214501 (2005) - Structural changes during tensile testing of an all-cellulose composite by in-situ synchrotron X-ray diffraction
Gindl W, Martinschitz KJ, Boesecke P, Keckes J
Composite Sci. and Technol. 66, 2639 (2006) - Structure and mobility of lipid membranes on a thermoplastic substrate
Hochrein MB, Reich C, Krause B, Radler JO, Nickel B
Langmuir 22, 538 (2006) - Structure of antimicrobial peptites in oriented lipid membranes probed by X-ray scattering
Salditt T, Li C, Spaar A
Biophys. Biochim. Acta in press(2006) - Structure of two-component lipid membranes on solid support: an X-ray reflectivity study
Novakova E, Giewekemeyer K, Salditt T
Phys. Rev. E 74, 051911 (2006) - X-ray diffraction of charge density wave under large electric current
LeBolloc'h D, S.Ravy, J.Dumas, F.Picca, J.Marcus, F.Livet, N.Kirova, N.Marsy, C.Mocuta
Proc. Workshop low dim. charge density wave conductors (2006) - Temperature influence on the production of nanodot patterns by ion beam sputtering of Si(001)
R. Gago, L. Vázquez, O. Plantevin, J. A. Sánchez-García, M. Varela, M.C. Ballesteros, J. M. Albella, and T. H. Metzger
Phys. Rev. B 73, 155414 (2006) - Strain and composition of ultrasmall Ge quantum dots studied by X-ray scattering and in situ surface X-ray absorption spectroscopy
R. Dujardin, V. Poydenot, T. U. Schülli, G. Renaud, O. Ulrich, A. Barski, M. Derivaz, S. Colonna, and T. Metzger
J. Appl. Phys. 99, 063510 (2006) - Efficient High Area OFETs by Solution Based Processing of a PI- Electron Rich Donor
- P. Miskiewicz, M. Mas-Torrent, J. Jung, S. Kotarba, I. Glowacki, E. Gomar-Nadal, D. B. Amabilino, J. Veciana, B. Krause, D. Carbone, C. Rovira, and J.Ulanski
Chem. Mater. 18, 4724 (2006) - Investigation of shape, strain, and interdiffusion in InGaAs quantum rings using grazing incidence X-ray diffraction
Michael Sztucki, Till Hartmut Metzger,Virginie Chamard, Anke Hesse, and Václav Holý
J. Appl. Phys. 99, 033519 (2006) - Strain determination in MBE-grown InAs quantum wires on InP
A. Mazuelas, L. González, J. M. García, Y. González, T. Schuelli, C. Priester, and H. T. Metzger
Phys. Rev. B 73, 045312 (2006) - Structural properties of ion-implanted silicon studied by combined X-ray scattering methods
L. Capello, T.H. Metzger, V. Holý , M. Servidori , A. Malachias
J. Appl. Cryst. 39, 571–581 (2006) - Distribution of local strain and density in a nanocrystal reconstructed from coherent X-ray diffraction with a focused beam
Chamard V, M. Dolle, G. Baldinozzi, F. Livet, M. de Boissieu, F. Bley, P. Donnadieu, T.H.Metzger, C. Mocuta, F. Picca, S. Labat, O. Thomas
Phys. Rev. Lett. submitted (2006) - Effect of molecular weight on the structure and crystallinity of poly(3-hexylthiophene)
Zen A, Saphiannikova M, Neher D, Grenzer J, Grigorian S, Pietsch U, Asawapirom U, Janietz S, Scherf U, Lieberwirth I, Wegner G
Macromolecules 39, 2162 (2006) - Elasticity of fluctuating charged membranes probed by X-ray grazing incidence diffuse scattering Brotons G, Belloni L, Zemb Th, Salditt T
Europhys. Lett. 75, 992 (2006) - Hexagonally ordered ammonium lithocholate self-assembled nanotubes with highly monodisperse sections
Terech P, Jean B, Ne F
Advanced Mater. 18, 1571 (2006) - Microstructural anisotropy at the ion-induced rippled amorphous / crystalline interface of silicon
Grigorian S, Grenzer J, Datta DP, Hazra S, Chini TK, Sanyal MK, Pietsch U
Appl. Phys. Lett. 89, 231915 (2006) - SARS coronavirus E protein in phospholipid bilayers: an X-ray study
Khattari Z, Brotons G, Akkawi M, Arbely E, Arkin IT, Salditt T
Biophys. J 90, 2038 (2006) - Local structure of a rolled-up single crystal: an X-ray microbeam diffraction study of individual semiconductor nanotubes
B. Krause, C. Mocuta, and T. H. Metzger, Ch.Deneke and O. G. Schmidt
Phys. Rev. Lett. 96, 165502 (2006) - Zero-strain GaAs quantum-dot molecules as investigated by X-ray diffuse scattering
M.Hanke, M.Schmidbauer, D.Grigoriev, P.Schafer, R. Kohler, Zh.M.Wang, Yu.I.Mazur, G.J.Salamo, T.H.Metzger
Appl.Phys. Lett. 89, 053116 (2006) - Strain and composition of ultrasmall Ge quantum dots studied by X-ray scattering and in situ surface X-ray absorption spectroscopy
R. Dujardin,Poydenot, T. U. Schülli, G. Renaud, O. Ulrich, and A. Barski, M. Derivaz, S. Colonna, T. Metzger
J. Appl. Phys. 99, 063510 (2006) - Coherent X-ray Diffraction Imaging Experiment on ID01 at ESRF
A. Schropp1, I. Vartanyants, C. G. Schroer, E. Weckert, C. Mocuta, T. Metzger, O. Kurapova
Proc. 8th Int. Conf. X-ray Microscopy IPAP Conf. Series 7 pp.383-385 (2006) - Influence of pre-amorphization on the structural properties of ultra-shallow arsenic implants in silicon
L. Capello, T. H. Metzger, M. Werner, J. A. van den Berg, M. Servidori, L. Ottaviano, C. Spinella, G. Mannino, T. Feudel, M. Herden; accepted
J. Appl. Phys. 100, 103533 (2006) - A novel gas-filled detector for synchrotron radiation applications
Kocsis M, Boesecke P, Carbone D, Herve C, Becker B, Diawara Y, Durst R, Khazins D, He B, Medved S, Sedov V, Thorson T, Wachter G
Nucl. Instrum. Meth. 563, 172 (2006) - Changes in microfibril angle in cyclically deformed dry coir fibers studied by in-situ synchrotron X-ray diffraction
Martinschitz KJ, Bösecke P, Gravey C, Gindl W, Keckes J
J. Mater. Sci in press (2006) - Combined studies of gratings by X-ray reflectivity, GISAXS and AFM
Yan M., Bardeau J.F., Brotons G., Metzger H., Gibaud A.
KEK Japan (2006) - Guided self-assembly of lateral InAs/GaAs quantum-dot molecules for single molecule spectroscopy
L. Wang, A. Rastelli, S. Kiravittaya, R. Songmuang, O. G. Schmidt, B. Krause, T. H. Metzger
Nanoscale Res. Lett. 1, 74 (2006) - Temperature influence on the production of nanodot patterns by ion beam sputtering of Si(001) R. Gago, L. Vázquez, O. Plantevin, J. A. Sánchez-García, M. Varela, M. C. Ballesteros, J. M. Albella & T. H. Metzger
Phys. Rev. B 73, 155414 (2006) - Order enhancement and coarsening of self-organized silicon nanodot patterns induced by ion-beam sputterin R. Gago, L. Vázquez, O. Plantevin, T. H. Metzger, J. Muñoz-García, R. Cuerno & M. Castro Appl. Phys. Lett. 89, 233101 (2006)
- Multiple-length-scale small-angle X-ray scattering analysis on maghemite nanocomposites A. Millan, A. Urtizberea, NJD Silva, P. Boesecke, E. Natividad, F. Palacio, E. Snoeck, L. Soriano, A. Gutiérrez, C Quirós J. Appl. Cryst. 40, S696-S700 (2007).
- Defect cores investigated by X-ray scattering close to forbidden reflections in silicon M.-I. Richard, T. H. Metzger, V. Holý & K. Nordlund Phys. Rev. Lett. 99, 225504 (2007).
Shedding light on the heart of a transistor
ID01 publication in Best of Nanophysics 2010
Relating Micro-structure to Macro-properties