ID2 High Brilliance Beamline

last modified 06-05-2008 18:04

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Contact
Tel: +33(0)47688 +ext

Theyencheri NARAYANAN, Scientist in Charge	2121
Peter BOESECKE, Beamline Operation Manager	2400
Michael SZTUCKI, Scientist	2893
Control Room:	2425
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Synopsis

The beamline ID2 is primarily a combined small-angle and wide-angle scattering instrument. The high brilliance of an undulator source is exploited to probe the microstructure and non-equilibrium dynamics of soft matter and related systems from a few Angstroms to micron scale, and down to millisecond time range.

The scientific application of the ID2 beamline can be broadly divided into three domains; (1) soft condensed matter, (2) noncrystalline structural biology, and (3) interdisciplinary areas of soft matter, biology, and nanoscience. Soft matter studies most often involve probing the equilibrium and the nonequilibrium microstructure, while the structural biology work is largely centered around the structure-function relationship. In the interdisciplinary topics, the hierarchical structure of the self-assembled exotic nanostructures is elucidated.

Some of the techniques used in softmatter research can be directly applied to industrial research and development problems.

Principal Techniques

Time-resolved small- & wide- angle X-ray scattering
(combined SAXS/WAXS)

This setup uses the monochromatic, highly collimated, and intense beam in a pinhole configuration. Combined SAXS and WAXS provides a wide q-range (0.01 nm^-1 to 40 nm^-1 at 0.1 nm wavelength) with high angular resolution. Both SAXS and WAXS employs area detectors, and the SAXS detector distance can be varied from 1 m to 10 m. At 10 m the q-resolution is about 0.003 nm^-1 for a wavelength of 0.1 nm and a beamsize and detector resolution of 100 µm. The high degree of collimation of the undulator beam and widely separated optical components provide a very low background. All the measured intensities can be normalised to an absolute intensity scale.
High resolution ultra small-angle X-ray scattering
(USAXS)

This setup employs a Bonse-Hart crystal analyser configuration. It can be used complementary with the pinhole USAXS for very high angular resolution (0.001 nm^-1) and high dynamic range (> 10⁸). The standard configuration involves two triple-bounce Si-220 horizontal monochromator and analyser, and a double-bounce Si-111 crossed vertical analyser. This provides high-resolution scattering profiles without smearing effects. The detector is a high dynamic range avalanche photo diode operated in photon counting mode. Recently, the parasitic scattering background has been reduced by more than an order of magnitude by replacing monolithic channel-cut crystals by double-crystal setups of highly polished and deeply etched single crystals. This makes the Bonse-Hart instrument suitable for studying low scattering, low contrast and radiation sensitive samples.