Techniques: Electronic structure and magnetism
last modified
23-03-2011 17:32
As part of the continuous renewal of ESRF capabilities, the techniques offered shift over time. This page represents a snapshot of the technique portfolio of the Electronic Structure and Magnetism Group as of early 2011.
- X-ray absorption spectroscopy
- X-ray absorption fine structure (XAFS)
- Near-edge X-ray absorption fine structure (NEXAFS)
- Energy-dispersive X-ray absorption spectroscopy (EDXAS)
- Time-resolved XAS
- MicroXAS
- Dichroism
- X-ray linear dichroism (XLD)
- X-ray magnetic circular dichroism (XMCD)
- X-ray magnetic linear dichroism (XMLD)
- X-ray natural circular dichroism (XNCD)
- X-ray magnetochiral dichroism (XM
D)
- Non-reciprocal X-ray magnetic linear dichroism (NR-XMLD)
- X-ray detected magnetic resonance (XDMR)
- Diffraction
- X-ray Magnetic Scattering
- Resonant magnetic scattering (RXS) and SXRMS (soft X-rays)
- Non-resonant magnetic X-ray scattering (NRMXS)
- Polarisation analysis
- X-ray emission spectroscopy (XES)
- Resonant inelastic X-ray scattering (RIXS)
- Photoelectron spectroscopy (XPS)
- Spin-polarised X-ray photoelectron spectroscopy (SPXPS)
- Soft X-ray angle resolved spectroscopy (ARXPS)
- Extreme conditions
- High pressure XAS
- High pressure magnetic studies
- High magnetic fields (static and pulsed)
- High temperature (laser heating)