InN thin film lattice dynamics revealed by grazing incidence inelastic x-ray scattering
last modified
01-06-2011 16:29
A combination of grazing incidence scattering and IXS from phonons, was used to measure the spectrum of lattice vibrations in a 6-micron-thick sample of indium nitride.
Reference
InN Thin film lattice dynamics by grazing incidence inelastic X-ray scattering,
J. Serrano, A. Bosak, M. Krisch, F. J. Manjón, A. H. Romero, N. Garro, X. Wang, A. Yoshikawa, and M. Kuball, Phys. Rev. Lett. 106, 205501 (2011).
Cardiovascular regulatory nitric oxide binding to heme proteins investigated using nuclear resonance scattering
InN thin film lattice dynamics revealed by grazing incidence inelastic x-ray scattering
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