News: Dynamics and extreme conditions group
Up one levelInN thin film lattice dynamics revealed by grazing incidence inelastic x-ray scattering
by Gary Admans — 01-06-2011
A combination of grazing incidence scattering and IXS from phonons, was used to measure the spectrum of lattice vibrations in a 6-micron-thick sample of indium nitride. …
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InN thin film lattice dynamics revealed by grazing incidence inelastic x-ray scattering
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