Source Characteristics
last modified
15-04-2009 18:19
ID26 is an insertion device source consisting of three mechanically independent undulators (one 40-mm period and two 35-mm period).
Optics
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Element
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Description
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| HDM1 | Water-cooled 620 mm long flat mirror. Each mirror of the beamline has three different coatings (Pt, Si and Pd/Cr) for efficient harmonic rejection. | ||
| Kohzu Monochromator | Cryogenically-cooled fixed-exit double-crystal monochromator | ||
| Monochromator crystals | Flat Si[111] pair and Flat Si[311] pair | ||
| Spectral range | 2.4 - 30 keV | ||
| Intrinsic resolution (DE/E) | Si[111]: 1.4 x 10-4 Si[311]: 0.3 x 10-4 | ||
| HFM2 | 750 mm long Multi-segmented Piezoelectric Bimorph Mirror for horizontal focalization | ||
| VFM3 | 450 mm long Multi-segmented Piezoelectric Bimorph Mirror for vertical focalization | ||
| Flux at sample | > 1013 ph/sec using Si(111) monochromator. Flux factor 5 less for Si(311) | ||
Detectors
The following options are available for X-ray absorption and emission experiments. experiments:
- Photo-diodes for flux monitoring and for experiments with absorber concentrations above 1mM.
- Multi-element Germanium Detector for XAS measurements at lower concentrations.
- Avalanche Photodiode (APD).
- Bent crystal Laue Analzyers (BCLA). Please contact the beamline staff in case you are interested in using a BCLA.
- Wavelength dispersive spectrometers: An Oxford WDX spectrometer is available for energies < 4.5 keV (DE/E ~ 0.01). An emission spectrometer using one spherically bent analyzer crystal is available for energies 4.5 - 15 keV. (DE/E < 0.001)
Available Scanning Modes
- X-ray absorption spectra with discrete adjustment of undulator gap.
- X-ray absorption spectra with continuous
scanning of undulator gap to minimize radiation damage to the samples.
Further details are given in the page on Scanning Modes
Sample Environment
Low temperature measurements can be performed by means of a displex cryostat with the sample in vacuum. Temperatures down to ~10 K can be obtained using He as cryogen. A mass flow control system for gases that is controlled by the beamline computer is available. Please visit the sample environment web page for more possibilities (Sample Environment Support Service).