BM32 Beamline Description

last modified 24-09-2007 15:51

Scientific applications

Study of interfaces and surfaces at air or under ultra high vacuum

Source characteristics

Bending magnet - see  Characteristics of bending magnet source BM32 at ESRF

source size

0.4x0.3 mm2 (HxV) FWHM
vert. source divergence 0.13 mrad at 20 keV
total horiz.ang.acceptance 2.8 mrad


Optical Hutch

 From right to left (X-ray beam travel direction):                                                                                              attenuator and slits (HxV)

                                                                                                                                                     mirror 1

                                                                                                                  monochromator

                                                                                     mirror 2

       micrometric slits (pink beam mode)

Ensemblebm32

Optics (monochromatic mode)

optical elements mirror 1 double-crystal
mono.
mirror 2
distance from source 26 m 28 m 30 m
focusing type vert.collim.or foc.
Ir-coating
horiz.(sagital)foc.
Si(111)
vert. foc.
Ir-coating
working angle 0-7 mrad 0-25 deg. 0-10 mrad
beam size at sample position (1:1) : 0.5x0.3 mm2 (HxV)
spectral range 7-30 keV
energy resolution in E/E  0.5x10-4 for Si(311)
 2x10-4 for Si(111)
flux at sample  5x1011 ph s-1(10-4 rbw, 0.1 A at 20 keV)

Optics (pink beam mode)

optical elements mirror 1 mirror 2 secondary
source
two Kirkpatrick-Baez (Pt) mirrors
distance from source 26 m 30 m 35 m 60 m
Optical function vert. foc.
Ir-coating
vert. foc.
Ir-coating
20X20 µm2 vert.+horiz. foc.
working angle 3.65mrad 3.65 mrad
2.9 mrad
beam size at sample 0.5x0.7 µm2 (HxV) FWHM
pink beam spectral range 5-25 keV
estimated flux at sample

Three instruments:

SUV: Surface under high vacuum

GMT: Multipurpose goniometer

MicroDiff: Microdiffraction setup


European Synchrotron Radiation Facility